DSP与PC机串行通信的几种方法

数字信号处理器由于具有高性能和灵活可编程的优点而得到广泛的应用。在许多应用系统中，一般采用PC机作主机、DSP作从机的方式，实现DSP与PC机之间有效可靠的通讯是系统设计的重要部分。介绍了几种DSP和PC机串行通信的软硬件方案，并对各种方法的优点和缺点进行了比较。     

基于TL16C752B的DSP与PC机异步串行通信实现方法

在数字信号处理器（DSP）的实际应用中,经常要求DSP 与PC 机进行数据交换,由于DSP 大多只具有多通道缓冲串口（McBSP）,而PC 机通常使用异步串行接口,若采用通用异步收发器芯片（UART）来实现DSP 的串口通信,可以避免McBSP 复杂的软件编程模拟.本文介绍了一种UART 芯片TL16C752B,并给出一种基于该芯片实现DSP 与PC 机异步串行通信的方法,以及相关的设计框图和软件编程代码.     

基于delphi的矩阵变换器系统实验平台的设计

根据DSP的特点和其在矩阵变换器实验系统中的实际应用,给出了一种基于Delphi的矩阵变换器实验系统平台的设计方法。该方法利用Delphi编程语言进行设计,并利用串行通信控件MSCOMM来实现DSP与PC机间快速、准确、可靠的数据传输。     

基于矩阵变换器的高性能交流调速系统监控界面的设计

为了使电机驱动系统具有良好的人机信息交流功能,设计了交流调速系统的监控界面。本设计以PC机为主机、DSP为从机,在Delphi环境下采用MSComm控件实现DSP与PC机间的串行通信,然后对数据进行处理、显示与分析,最后在矩阵变换器系统实验平台上实现了上位机对异步电动机按转子磁链定向的矢量控制系统、异步电动机直接转矩控...     

基于DSP的交互式电子白板系统的研究

DSP是当今主要的用于数字信号处理的嵌入式平台,随着嵌入式应用的日益广泛和加深越来越多的工作需要DSP芯片与PC机的协同工作来满足现代多媒体技术日益发展的要求。因此本系统运用DSP信号处理系统与计算机的协同工作来实现移动通信的无线定位撞术,以此来实现交互式电子白板的设计要求。本文主要阐述利用虹外线,超声波联合定位技术搭戴DSP信号处理系统实现对笔迹进行描述的方法。     

串行通讯在基于DSP控制的变频调速中的应用

DSP由于具有高性能和灵活可编程的优点而得到广泛的应用。本文介绍了以DSPTMS320F2812为核心控制器的异步电动机变频调速的通讯及程序设计方法,同时通过数据传送程序说明如何使用VB6.0专业版作为开发工具、并利用DSP中的SCI模块来实现DSP与PC机间的数据传递。通过实验证明该通信方案简单易行、通信稳定可靠、具有一定的通用性。     

基于Lab Windows／CVI的PC与DSP的串行通信

给出了利用LabWindows／CVI虚拟仪器软件开发工具中的RS232接口库函数来在PC机与DSP数字信号处理器之间进行串行通信的具体设计方法,给出了PC机和DSP之间的硬件连接方式和基本的编程思路。     

简析DSP与PC机间的数据通信

在目前,DSP的应用日益增多,应用之时DSP会与外界一直维持通信,基于此,该文简单介绍了DS TMS320LF2407之中能够用以通信的模块-串行通用接口,即为SCI,因此给出基于SCI模块实现DSP与PC机间数据通信的一类方法。本文还主要分析了硬件连接及其软件编程。     

DSP在通用数字测试仪中的应用

本测试仪是基于DSP通用数字测试仪，采用DSP的SCI与PC机相连，通过DSP的SPI与8片GM8164串联，这样对外可提供256个双向I／O口与待测电路板连接。PC机发送测试数据给待测电路板并对返回的测试结果数据进行分析判断。来确定电路板是否有故障，从而实现测试功能。     

TMS320C5402与PC机异步通信的设计与实现

为实现“基于FPGA／DSP的数字芯片测试仪”与PC机之间的通信,本文采用DSP芯片TMS320C5402与PC机之间进行串行通信,介绍了TMS320C5402McBSP（多通道缓冲串口）的特点及MAX3111的一些特点,并给出了通信方案的具体设计思想及相应的硬件配置和软件设计。经测试表明,此方案完全可行,能实现DSP与PC机之间的异步通信,传输准确性高。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Curved crystal spectrometer for the measurement of X-ray lines from laser-produced plasmas

In order to diagnose the laser-produced plasmas, a focusing curved crystal spectrometer has been developed for measuring the X-ray lines radiated from a laser-produced plasmas. The design is based on the fact that the ray emitted from a source located at one focus of an ellipse will converge on the other focus by the reflection of the elliptical surface. The focal length and the eccentricity of the ellipse are 1350 mm and 0.9586, respectively. The spectrometer can be used to measure the X- ray lines in the wavelength range of 0.2-0.37 nm, and a LiF crystal （200） （2d = 0.4027 nm） is used as dispersive element covering Bragg angle from 30° to 67.5°. The spectrometer was tested on Shengnang- Ⅱ which can deliver laser energy of 60-80 J/pulse and the laser wavelength is 0.35 μm. Photographs of spectra including the 1 s2p ^1P1-1s^2 ^1S0 resonance line（w）, the 1s2p ^3P2-1s^2 1S0 magnetic quadrupole line（x）, the 1s2p ^3P1-1 s^2 ^1S0 intercombination lines（y）, the 1 s2p ^3S~1-1 s^2 ^1S0 forbidden line（z） in helium-like Ti Ⅹ Ⅺ and the 1 s2s2p ^2P3/2-1 s622s ^2S1/2 line（q） in lithium-like Ti Ⅹ Ⅹhave been recorded with a X-ray CCD camera. The experimental result shows that the wavelength resolution（λ/△ 2） is above 1000 and the elliptical crystal spectrometer is suitable for X-ray spectroscopy.     

Preparation and Characterization of TaN ALD Precursors

High purity organic-tantalum precursors for thin film ALD TaN were synthesized and characterized.Vapor pressure and thermal stability of these precursors were studied.From the vapor pressure analysis,it was found that TBTEMT has a higher vapor pressure than any other published liquid TaN precursor,including TBTDET,TAITMATA,and IPTDET.Thermal stability of the alkyl groups on the precursors was investigated using a 1H NMR technique.The results indicated that the tertbutylimino group is the most stable group on TBTDET and TBTEMT as compared to the dialkylamido groups.Thermal stability of TaN precursors decreased in the following order:TBTDET ＞ PDMAT ＞ TBTEMT.In conclusion,precursor vapor pressure and thermal stability were tuned by making slight variations in the ligand sphere around the metal center.     

Electronic Structure of Semiconductor Nanocrystals

This paper reviews our recent development of the use of the large-scale pseudopotential method to calculate the electronic structure of semiconductor nanocrystals, such as quantum dots and wires, which often contain tens of thousands of atoms. The calculated size-dependent exciton energies and absorption spectra of quantum dots and wires are in good agreement with experiments. We show that the electronic structure of a nanocrystal can be tuned not only by its size,but also by its shape. Finally,we show that defect properties in quantum dots can be significantly different from those in bulk semiconductors.     

A rigorous proof of MIMO channel capacity’s increase with antenna number

It is well known that adding more antennas at the transmitter or at the receiver may offer larger channel capacity in the multiple-input multiple-output（MIMO） communication systems. In this letter, a simple proof is presented for the fact that the channel capacity increases with an increase in the number of receiving antennas. The proof is based on the famous capacity formula of Foschini and Gans with matrix theory.