Quantitative analysis of fretting fatigue degradation in 7075-T6 aluminum alloy

Fretting fatigue failures are commonly observed in the aviation industry. The objective of this study was to understand the fretting fatigue mechanism by characterization of fretting fatigue degradation to gain insight into the process of crack formation from pits in 7075-T6 aluminum alloy. This paper focuses on the quantitative analysis of fretting fatigue degradation in terms of pit depths and dominant crack formation. For 60 percent of the specimens, the dominant crack nucleated from a pit other than the maximum-depth pit observed on the fracture surface.     

Study on transition between fretting and reciprocating sliding wear

An experimental investigation was conducted to find the associated changes in characteristics of wear before and after the transition between fretting and reciprocating sliding wear. A set of experiments were carried out using a AISI 52100 steel ball rubbing against a plate specimen made from the same steel under dry condition. Wear coefficient, wear volume, coefficient of friction, profile of the scars and wear debris were analyzed. The results displayed that there were significant differences in wear coefficient, wear volume, profile of the wear scars and wear debris before and after the transition. Wear coefficient and wear volume at a constant sliding distance were found to be the most appropriate for identifying the transition amplitude between fretting and reciprocating sliding wear.     

Study of the tribologically transformed structure created during fretting tests

In fretting, without a lubricant, structures fail through wear involving debris. Various metallographic assessments show that this debris creation derives from a special structure, hereafter called the “tribologically transformed structure” (TTS). The latter is nucleated at the very beginning of a contact's life, and eventually masks the initial material's tribological behaviour. This TTS is very hard and brittle, and is quickly destroyed, which explains why TTS is rather difficult to observe. This study focuses on initiation mechanisms which, up to now, are still highly controversial. Large amounts of TTS are observed after fretting tests, which is the reason why they were chosen as the means of investigation. In this paper, the various possible creation mechanisms for TTS will be analysed. From this overview, two nucleation models are chosen: one is based on “mechanical alloying” considerations, and the other is linked to high-strain-recrystallisation phenomena. Transmission electron microscopy (TEM) investigations are used to check these assumptions.     

Wear behavior of Al-Mg-Cu-based composites containing SiC particles

The friction and wear behavior of Al-Mg-Cu alloys and Al-Mg-Cu-based composites containing SiC particles were investigated at room conditions at a pressure of 3.18 MPa and a sliding speed of 0.393 m/s using a pin-on-disk wear testing machine. This study is an attempt to investigate the effects of adding copper as alloying element and silicon carbide as reinforcement particles to Al-4 wt% Mg metal matrix. The wear loss of the copper containing alloys was less than that for the copper free alloys. It was observed that the volume losses in wear test of Al-Mg-Cu alloy decrease continuously up to 5%. Also it was found that the silicon carbide particles play a significant role in improving wear resistance of the Al-Mg-Cu alloying system. The formation of mechanically mixed layer (MML) due to the transfer of Fe from counterface disk to the pin was observed in both Al-Mg-Cu alloys and Al-Mg-Cu/SiC composites.     

Evaluation of fretting wear based on the frictional work and cyclic saturation concepts

It is time consuming or even impossible to simulate the whole process of fretting wear, since it always involves millions of cyclic loadings. This paper focuses on the modeling and evaluation method of fretting wear for the typical bridge type fretting test with a flat pad. The frictional work on the contact interface is chosen as the parameter to evaluate the fretting wear. To verify the fretting wear model, the predicted wear profile is compared with that obtained by the experimental results. Fretting wear always includes plastic deformations due to the edge stress singularity. The effect of cumulative plastic deformation is also taken into account in the wear model. The role of the coefficient of friction at the contact interface on the fretting wear has also been discussed.     

Third body effects on friction and wear during fretting of steel contacts

Fretting wear proceeds through particle detachment from the contacting surfaces which, while trapped in the contact zone, can affect the frictional and wear response. Ball-on-flat fretting experiments were carried out between steel specimens under gross slip regime. A transition in the coefficient of friction was linked to a critical contact pressure. The microstructure and chemical composition of the third body evolve with the applied pressure. The evolution of the friction coefficient is strongly dependent on the third body properties. The wear is controlled by the applied load and thus the real contact area within the wear track.     

AMRAY-1000B扫描电镜真空系统分析及维修

本文系统地对AMRAY - 10 0 0B扫描电镜真空系统原理进行分析 ,并给出维修实例。     

Erosion Debris Particle Observations and the Micromachining Mechanism of Erosion

Erosion debris particles produced by particle impact erosion of pure Ni and a stainless steel have been examined in the scanning electron microscope for the purpose of determining whether micro-machining is an operative mechanism of erosion by alumina particles. Macroscopic machining chips generally exhibit well-defined lamellae on the side of the chip away from the tool face, and such lamellae are also observed in micromachining chips produced by abrasion or scratch testing. The aspect ratio of such chips is generally large. In the present work, the aspect ratios and shapes of erosion debris particles formed at angles of incidence below the peak erosion angle (α_c) were generally consistent with the dimensions of the impact craters formed on the eroded surface and with the hypothesis that they were formed by micromachining. However, most of the debris particles did not exhibit characteristic lamellae. This may be explained by the fact that the surface from which they are formed is very rough even on a scale similar to the size of the debris particles. This is not true in abrasion: Micromachining chips formed from such a surface would be expected to have surfaces which would obscure the existence of lamellae. However, some chips would be expected to come from the few relatively smooth areas of the surface, and these should show lamellae. Examples of such chips were, indeed, found, and micrographs of these chips are nearly indistinguishable from micrographs of micromachining chips formed by abrasion or scratch tests. It is concluded that micromachining is an operative mechanism of erosion which is of greatest importance at low angles of incidence. Debris particles formed at higher angles of incidence are generally more platelike.     

Modelling and evaluation of the fretting fatigue cracking risk in smooth spherical contacts

A numerical model for the calculation of fretting fatigue crack initiation is presented and compared with experiments. The model is focused on smooth sphere-on-plane contact in partial and gross slip conditions. It is based on Hamilton’s explicit stress equations and the multi-axial Dang Van and Findley fatigue criteria enhanced with a statistical size factor concept. Promising correlation was found between the model and the experimental results with quenched and tempered steel 34CrNiMo6. The model assumptions, limitations and general application are also discussed.     

Potential of CLSM in studying some modern and fossil palynological objects

We have tested possibilities and limitations of confocal laser scanning microscopy to study the morphology of pollen and spores and inner structure of sporoderms. As test objects, we used pollen grains of the modern angiosperm Ribes niveum (Grossulariaceae) and Datura metel (Solanaceae), fossil angiosperm pollen grains of Pseudointegricorpus clarireticulatum and Wodehouseia spinata dated to the Late Cretaceous, fossil gymnosperm pollen grains of Cycadopites‐type dated to the Middle Jurassic, and fossil megaspores Maexisporites rugulaeferus, M. grosstriletus, and Trileites sp. dated to the Early Triassic. For comparative purpose, we studied the same objects with application of conventional light, scanning electron (to entire pollen grains and spores or to semithin sections of their walls), or transmission electron microscopy. The resolution of confocal microscope is much lower than that of electron microscopes, as are its abilities to reconstruct the surface patterns and inner structure. On the other hand, it can provide information that is unreachable by other microscopical methods. Thus, the structure of endoapertures in angiosperm pollen grains can be directly observed. It is also helpful in studies of asymmetrical pollen and pollen grains bearing various appendages and having complicated exine structure, because rotation of 3‐D reconstructions allows one to examine all sides and structures of the pollen grain. The exact location of all visible and concealed structures in the sporoderm can be detected; this information helps to describe the morphology and inner structure of pollen grains and to choose necessary directions of further ultrathin sectioning for a transmission electron microscopical study. In studies of fossil pollen grains that are preserved in clumps and stuck to cuticles, confocal microscope is useful in determining the number of apertures in individual pollen grains. This can be done by means of virtual sections through 3‐D reconstructions of pollen grains. Fossil megaspores are too large and too thick‐walled objects for a confocal study; however, confocal microscope was able to reveal a degree of compression of fossil megaspores, the presence of a cavity between the outer and inner sporoderm layers, and to get some information about sporoderm inner structure.     

Effect of Deaeration and Controlled Environments on the Performance of Lubricants

The effect of oxygen in lubricants on the wear of camshaft lobes and followers was investigated under air and either argon or nitrogen environments. The motored valve train wear tester was used as a wear tester. White oil, white oil containing Zinc Dithiophosphate (ZDP), and REO 200 were used as lubricants. Hydroperoxide was used as a contaminant for the tests conducted with REO 200.

The results showed that the wear of camshaft lobes and cam followers decreased after deaeration. The tests conducted under argon showed a further decrease in wear. The specimens tested with white oil and white oil with ZDP were analyzed by Scanning Electron Microscopy (SEM) and X-ray Photoelectron Spectroscopy (XPS). The operation of abrasive wear and oxidational wear was observed. A decrease in the hydroperoxide number under argon atmospheres was observed.     

Progression of fretting fatigue damage in Ti–6Al–4V

An investigation was conducted to explore the nature of fretting fatigue damage in the stages prior to crack formation. In the unique experimental apparatus employed in this study, where total slip never occurs, several locations on each test specimen exist where cracks can develop due to local contact conditions. Under the test conditions used, not all of the sites had cracks upon test completion. This study evaluated the condition of non-cracked sites on several fretted specimens in an effort to identify differences between these and sites where small cracks were observed.A single test condition of 620 MPa average applied static clamping stress and 250 MPa applied axial fatigue stress for R=0.5 was selected, which corresponds to a fretting fatigue life of 10⁷ cycles based on prior work. For specimens tested to 10⁶ cycles, or 10% of life, several destructive and non-destructive characterization methods were chosen: scanning electron microscopy (SEM), residual stress measurement and transmission electron microscopy (TEM). Each site at which crack nucleation could be expected was inspected in the SEM and was then characterized using surface X-ray diffraction to quantify the residual stresses field near that location. Then TEM foils were cut from one area on a specimen with tiny cracks and dislocation densities were observed. A novel technique was used which permitted TEM samples to be obtained from regions in close proximity on the original specimen.Comparisons were made between as-received (AR) and stress-relief annealed (SRA) specimens, on which the stress-relief was applied prior to fretting fatigue testing. SEM inspection was useful for qualitative analysis of wear debris and identification of cracks as small as 20 μm, but was unable to provide quantitative data on the level of fretting fatigue damage beyond crack size. Although differences were noted in the residual stresses for the SRA versus the AR specimens, no residual stress peaks were noted in the edge of contact regions where cracks would eventually develop. TEM observations in the vicinity of the crack nucleation region showed that the dislocation structure decayed rapidly into the specimen thickness. The cause of the dislocations was attributed to plastic deformation caused by the clamping stresses.     

仪器分析在甲壳素与壳聚糖及其衍生物中的应用

综述红外光谱、紫外光谱、核磁共振、质谱、扫描电镜、X射线衍射在甲壳素与壳聚糖及其衍生物的官能团、结构、形貌等研究中的应用,并对仪器分析在甲壳素与壳聚糖及其衍生物中的应用和发展前景进行展望。     

A novel PRC signal drift reduction method for new developed SEM-based nanoindentation/nanoscratch instrument integrated with AFM

In-situ SEM nanoindentation and nanoscratch testing methods are commonly used for mechanical characterization and investigation of the deformation and failure mechanisms of coating materials with micro-to nano-scale thicknesses. However, existing SEM-based integrated nanoindentation and nanoscratch instruments have two main limitations. First, the measured mechanical properties of the coating materials at micro-to nano-scale thicknesses are highly sensitive to surface roughness. Second, the existing SEM-based instruments lack the capability to acquire the morphology of residual imprints in real-time after nanoindentation and nanoscratching. In this study, a novel SEM-based integrated nanoindentation, nanoscratch, and atomic force microscopy (AFM) instrument, namely, NMT-AFM was proposed, developed and fabricated. The self-sensing piezoresistive cantilever (PRC) was selected as the AFM force sensor owing to its miniaturization ability. However, the resistance of the PRC sensor fluctuated because of the electron irradiation from SEM, resulting in the continuous drift of the PRC signal during SEM imaging. To overcome this limitation, a mechanism of PRC signal drift inside SEM was analyzed for the first time, and a PRC signal drift reduction method was proposed based on the mechanism analysis. The experimental results indicated that the PRC signal drift was reduced to 2 nm in 2 min by applied external voltage value U_A of 30 V to modified PRC, which proved the proposed mechanism of PRC signal drift during SEM imaging. Finally, the X–Y fine nanopositioner angle calibration test using AFM calibration chip VGRP-UM and the nanoindentation/nanoscratch characterizations of the TiAlSiN coating material were conducted.     

Application of a simplified method to evaluate the inelastic state due to fretting fatigue

The simulation of fretting fatigue with the classical incremental method results in the lengthy and repeated calculations. This paper presents a simplified analysis method for the modeling of the mechanical behavior of inelastic state due to fretting fatigue. This approach has been proposed by Zarka et al. in order to predict the nature of the limit state of structures and the structural behavior under cyclic loading. It decreases significantly the computational complexity and duration of the calculations in comparison to classical incremental formulations.This approach is applied to the problem of dry contact between cylider pads agians flat specimen. The calculations results are in good agreement with the experimental observations.     

What atomic resolution annular dark field imaging can tell us about gold nanoparticles on (1 1 0)

Annular dark field scanning transmission electron microscopy imaging was recently applied to a catalyst consisting of gold nanoparticles on TiO₂ (1 1 0), showing directly that the gold atoms in small nanoparticles preferentially attach to specific sites on the TiO₂ (1 1 0) surface. Here, through simulation, a parameter exploration of the imaging conditions which maximise the visibility of such nanoparticles is presented. Aberration correction, finite source size and profile imaging are all considered while trying to extracting the maximum amount of information from a given sample. Comment is made on the role of the thermal vibration of the atoms in the nanoparticle, the magnitude of which is generally not known a priori but which affects the visibility of the nanoparticles in this imaging mode.     

SEM electron channelling patterns as a technique for the characterization of ion-implantation damage

Electron channelling patterns (ECPs) formed in back-scattered images in the scanning electron microscope (SEM) have been used occasionally to confirm surface amorphization during ion implantation. In order to place such observations on a more quantitative basis, the study reported here has explored the variation of ECP appearance with both specimen damage levels (and thus subsurface structures) and SEM accelerating voltage (i.e. sampled depth). Polished and annealed (0001) single crystal sapphire discs were implanted to various damage levels up to both subsurface and full surface amorphization. Damage levels were measured independently by Rutherford back-scattering (RBS). Selected-area ECPs were obtained in a Jeol-840 electron microscope operating over the range 5–40 kV in 5-kV steps. Progressive ECP degradation—in terms of high-order line disappearance—was observed with increasing dose, culminating in total pattern loss when full surface amorphization occurred. However, ECP information could still be obtained from the damaged near-surface material even when a subsurface amorphous layer was present, thus demonstrating the shallow retrieval depth of information from the ECP technique. Indeed, because the spatial distribution of damage from ion implantation is both calculable and measurable, these experiments have also allowed us, for the first time, to explore and demonstrate the shallow sample depths from which the majority of ECP contrast originates (< 150 nm in sapphire at an accelerating voltage of 35 kV), even when the beam penetration is considerable by comparison (～ 5 μm). Furthermore, the way in which this sampled depth varies with SEM accelerating voltage is both demonstrated and shown to be a powerful diagnostic technique for studying the distribution of near-surface structural damage.     

Investigations of field-evaporated end forms in voltage- and laser-pulsed atom probe tomography

Atom Probe Tomography (APT) consists of analyzing a needle-shaped specimen on an atom-by-atom basis. In recent years, instruments have become commercially available, enabling the sequential analysis of the same specimen in both laser- and voltage-pulsed modes. In this contribution, a comparison of field evaporated end-forms as a function of the voltage and laser power is presented for silicon. Electron microscopy is utilized for visual inspection of the final tip end-forms. The field of evaporation for silicon is calculated based on these radius measurements for voltage and laser pulsing. Electron microscopy and analysis of the atom probe data show that the specimen end-forms for both pulsing modes can be different. We have observed two effects on the shape of a field-ion emitter when irradiated by a focused laser beam. One is a change in the 3-dimensional topology of the emitter due to different crystallographic orientations. Secondly, exposure to focused laser beam from one side may lead to a non-hemispherical tip shape especially when reasonably high laser energy is utilized. For comparison purposes to the laser mode, the voltage pulse evaporated tip end form is also analyzed for different specimen temperatures. Consequently, evaporation fields are calculated for different temperatures and laser conditions for silicon.