雷达视频回波信号记录与回放系统设计

介绍了一种雷达视频回波信号记录与回放系统。该系统基于FPGA和PCI总线设计。文中详细地描述了雷达数字视频信号数据帧的格式、记录与回放系统组成框图,讨论了大容量数据实时存储问题的解决方案,同时分析了视频数据记录和显示回放软件功能的设计。试验表明：该系统运行正常、稳定,满足使用要求。     

飞行参数记录系统外场综合卸载器的设计与实现

介绍了飞行参数记录系统综合卸载器的特点、硬件和软件的设计,它可实现多种型号飞参记录系统数据的卸载和快速处理。     

INDRA系统回放功能中图像与语音同步实现方法的研究

目前空管领域比较多的是自动化雷达数据记录设备和语音记录设备是两套独立的设备,进行独立的回放,如果不能同时同地回放语音和画面,则会给事故分析与管制指挥带来很大的不便,因此必须保证画面信息和语音信息严格同步,以确保回放效果的准确性和可靠性。本文对如何控制空管自动化系统与语音记录仪的同步回放进行了针对性的研究。     

某型飞参接口处理器不传输数据故障研究

某型飞机试车后,判读飞行参数采集记录系统（简称飞参）时发现飞参数据记录不完整,经试验后确认为某型飞参接口处理器故障。在使用飞参接口处理器专用测试设备检测时,故障不稳定。文章介绍了一种复现偶发故障的方法,分析了产品的工作原理,并对故障排除过程进行总结,对电子产品的修理和维护具有一定的借鉴意义。     

双余度飞行显示控制计算机的设计与实现

飞行显示控制计算机是飞行员高效、直观地获取所需信息或发送控制命令的操作平台,其任务可靠性对飞机飞行安全至关重要,一旦失效将会造成系统部分或全部功能丧失,尽管不会直接危及飞行员人机安全,但会严重影响飞行和作战任务的完成。因而本设计采用了双余度设计方法,有效提高了任务可靠性、降低了失效风险,具备一定的工程实用价值。     

基于网络架构的小型作战编组网络化训练信息管理系统设计

利用B/S模式的网络架构体系,对一种训练信息管理系统进行了设计,解决了多节点远程异地训练信息同步、共享、统筹等问题,形成了训练信息的全周期、全寿命管理,为小型作战编组网络化训练顺利开展提供了数据信息支持与保障。     

幻影2000的多功能显示系统

多功能显示系统是一种计算机控制的CRT系统.幻影2000应用多功能显示系统能达到如下目的:飞机具有较大的作战机动性;由于中央计算机向飞行员提供了飞行及驾驶信息、武器投放及瞄准信息和导弹攻击区的边界条件等信息减少了飞行员的负担,提高了完成多种任务的成功概率.并且,此种系统还具有对新任务、新武器的较大适应性和具有功能扩展能力.     

机载任务记录器中数据记录器组件的设计与实现

随着现代空战训练的转型,对机载任务记录系统所记录数据的多样性和全面性,记录数据的时间同步性和一致性有了很高的要求。为此,在新型机载任务记录仪设计研发中,采用统一的时间标准,同步记录多路任务数据,严格保证了事后评判的客观性和时间准确性。     

某飞行参数记录系统性能设计与计算分析

飞行参数记录系统是飞机重要的组成单元,为了保证某型飞行参数记录系统软硬件设计方案满足系统总体技术要求,对系统数据吞吐量、供电延迟、数据下载速率、记录容量与记录时间等重要指标进行计算分析,通过计算与分析降低了系统设计风险,保证了设计方案的正确性与可行性。     

分布式仿真记录回放系统中的数据库技术

该文介绍了建立分布式仿真记录回放系统的体系结构，数据库的总体规划和数据内容，研究分析了数据记录回放的数据库接口技术，详细论述了数据记录功能与数据回放功能的具体实现。     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Nanoimprint Lithography -A Next Generation High Volume Lithography Technique

IntroductionNanoimprint Lithography is a well-acknowl-edged low cost, high resolution, large area pattern-ing process. It includes the most promising methods,high-pressure hot embossing lithography (HEL) [2],UV-cured imprinting (UV-NIL) [3] and micro contactprinting (m-CP, MCP) [4]. Curing of the imprintedstructures is either done by subsequent UV-lightexposure in the case of UV-NIL or by cooling downbelow the glass transition temperature of the ther-moplastic material in case of HEL…     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

Influence of PVK ： NPB hole transporting layer on the characteristics of organic light-emitting devices

A doping system consisting of NPB and PVK is employed as a composite hole transporting layer （CHTL）. By adjusting the component ratio of the doping system, a series of devices with different concentration proportion of PVK ： NPB are constracted. The result shows that doping concentration of NPB enhances the competence of hole transporting ability, and modifies the recombination region of charge as well as affects the surface morphology of doped film. Optimum device with a maximum brightness of 7852 cd/m^2 and a power efficiency of 1.75 lm/W has been obtained by choosing a concentration proportion of PVK ： NPB at 1：3.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.     

Analysis of error performance on Turbo coded FDPIM

Due to variable symbol length of digital pulse interval modulation（DPIM）, it is difficult to analyze the error performances of Turbo coded DPIM. To solve this problem, a fixed-length digital pulse interval modulation（FDPIM） method is provided. The FDPIM modulation structure is introduced. The packet error rates of uncoded FDPIM are analyzed and compared with that of DPIM. Bit error rates of Turbo coded FDPIM are simulated based on three kinds of analytical models under weak turbulence channel. The results show that packet error rate of uncoded FDPIM is inferior to that of uncoded DPIM. However, FDPIM is easy to be implemented and easy to be combined, with Turbo code for soft-decision because of its fixed length. Besides, the introduction of Turbo code in this modulation can decrease the average power about 10 dBm, which means that it can improve the error performance of the system effectively.     

A method for calculating the center position of collimated light

It is a key problem to accurately calculate beam spots＇ center of measuring the warp by using a collimated laser. A new method, named double geometrical center method （DGCM）, is put forward for the first time. In this method, a plane wave perpendicularly irradiates an aperture stop, and a charge couple device （CCD） is employed to receive the diffraction-beam spots, then the geometrical centers of the fast and the second diffraction-beam spots are calculated respectively, and their mean value is regarded as the center of datum beam. In face of such adverse instances as laser intension distributing defectively, part of the image being saturated, this method can still work well. What＇s more, this method can detect whether an unacceptable error exits in the courses of image receiving, processing and calculating. The experimental results indicate the precision of this method is high.     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.