基于阈值光电子-光离子符合技术的分子离子光谱和解离动力学研究

对电子和离子同时采用速度聚焦电场收集的阈值光电子-光离子符合成像谱仪能够有效提高电子的收集效率和能量分辨率.利用该符合成像谱仪,开展了Xe/Ar/Ne 惰性混合气体及NO 分子的阈值光电子谱、阈值光电子-光离子符合质谱和质量选择的符合光谱等实验研究,精确测量了NO 分子的电离势,并且获得了NO⁺离子振动态分辨的X¹Σ⁺,c³Π和B^{1相似文献}   

Auger photoelectron coincidence spectroscopy

Auger photoelectron coincidence spectroscopy (APECS) is a technique that provides us with unique information and a chance to gain insight into the significance of processes in the Auger spectra of atoms in solids. Hence it is a great aid in our understanding of the Auger process in atoms where electron correlations are strong. Despite the first demonstration of the technique more than 20 years ago, there are still very few working experiments. The reasons why, and the ways forward are discussed.     

Development of a miniature double-pass cylindrical mirror electron energy analyzer (DPCMA), and its application to Auger photoelectron coincidence spectroscopy (APECS)

We have developed a miniature double-pass cylindrical mirror electron energy analyzer (DPCMA) with an outer diameter of 26 mm. The DPCMA consists of a shield for the electric field, inner and outer cylinders, two pinholes with a diameter of 2.0 mm, and an electron multiplier. By assembling the DPCMA in a coaxially symmetric mirror electron energy analyzer (ASMA) coaxially and confocally we developed an analyzer for Auger photoelectron coincidence spectroscopy (APECS). The performance was estimated by measuring the Si-LVV-Auger Si-1s-photoelectron coincidence spectra of clean Si(1 1 1). The electron-energy resolution of the DPCMA was estimated to be E/ΔE = 20. This value is better than that of the miniature single-pass CMA (E/ΔE = 12) that was used in the previous APECS analyzer.     

X射线光电子能谱

X射线光电子能谱（X-ray photoelectron spectroscopy，XPS）技术也被称作用于化学分析的电子能谱（electron spectroscopy for chemical analysis，ESCA）．XPS属表面分析法，它可以给出固体样品表面所含的元素种类、化学组成以及有关的电子结构重要信息，在各种固体材料的基础研究和实际应用中起着重要的作用．文章简要介绍了XPS仪器的工作原理和分析方法，并给出了XPS在科学研究工作中的应用实例．     

Ultrafast dynamics of o-fluorophenol studied with femtosecond time-resolved photoelectron and photoion spectroscopy

The ultrafast dynamics of o-fluorophenol via the excited states has been studied by femtosecond time-resolved photoelectron imaging. The photoion and photoelectron spectra taken with a time delay between 267 nm pump laser and 800 nm probe laser provide a longer-lived S1 electronic state of about ns timescale. In comparison,the spectra obtained by exciting the S2 state with femtosecond laser pulses at 400 nm and ionizing with pulses at 800 nm suggest that the S2 state has an ultrashort lifetime about 102 fs and reflects the internal conversion dynamics of the S2 state to the S1 state.     

X射线光电子能谱

X射线光电子能谱（X-ray photoelectron spectroscopy, XPS）技术也被称作用于化学分析的电子能谱（electron spectroscopy for chemical analysis,ESCA）.XPS属表面分析法,它可以给出固体样品表面所含的元素种类、化学组成以及有关的电子结构重要信息,在各种固体材料的基础研究和实际应用中起着重要的作用.文章简要介绍了XPS仪器的工作原理和分析方法,并给出了XPS在科学研究工作中的应用实例.     

Development of laser photoelectron spectroscopy based on resonantly enhanced multiphoton ionization

This review article is mainly concerned with laser photoelectron spectroscopy based on REMPI (resonantly enhanced multiphoton ionization), consisting of two parts. One is associated with the measurement of photoelectron kinetic-energy distribution and the other is associated with the measurement of zero-kinetic-energy (ZEKE) photoelectrons in very high resolution. These two techniques are complementary to each other. During the last three decades, the author and co-workers have carried out photoelectron spectroscopic studies of molecules in the gas phase, using the HeI 584 Å resonance line and a nanosecond tunable UV–visible laser. In this article, firstly the author’s background in the field of molecular photoelectron spectroscopy is described briefly, by mentioning three topics of HeI photoelectron spectroscopy. Secondly, the principle and characteristics of laser photoelectron kinetic-energy spectroscopy and its application to several typical topics, namely, one-photon forbidden states (O₂), autoionization from a super-excited state (NO), and small van der Waals molecules (NO–Ar and the NO₂ dimer), and some others. Thirdly, the principle and characteristics of ZEKE photoelectron spectroscopy are described, together with its application to the following several topics: (1) rotational spectra of NO⁺, (2) vibrational coupling of (naphthalene)⁺, (3) large-amplitude torsional motion of (tolane)⁺, (4) rotational isomers of (cis and trans n-propylbenzene)⁺ and structural isomers of (2-hydroxypyridine)⁺, (5) proton tunneling of (tropolone)⁺ and (9-hydroxyphenalenone)⁺, (6) intramolecular vibrational redistribution of trans stilbene, and (7) cation van der Waals molecules of aniline–Ar_n (n=1,2) and azulene–Ar. All the results mentioned as examples are those obtained in the author’s laboratory.     

Classical ultraviolet photoelectron spectroscopy of polymers

Although X-ray photoelectron spectroscopy of polymers was well established by Clark and coworkers in the 1970s, ultraviolet photoelectron spectroscopy of polymer films, was developed later. Previous to the 1970s, the first attempts to use ultraviolet light on polymer films took the form of appearance potential (valence band edge) measurements. Only some years later could the full valence band region of thin polymer films, including insulating polymers, semiconducting polymers and electrically conducting polymers. The development of what might be termed “classical ultraviolet photoelectron spectroscopy” of polymer films may be loosely based upon a variety of issues, including adapting thin polymer film technology to ultra high vacuum studies, the widespread use of helium resonance lamps for studies of solid surfaces, the combined advent of practical and sufficient theoretical–computational methods. The advent of, and the use of, easily available synchrotron radiation for multi-photon spectroscopies, nominally in the area of the near UV, is not included in the term “classical”. At the same time, electrically conducting polymers were discovered, leading to applications of the corresponding semiconducting polymers, which added technologically driven emphasis to this development of ultraviolet photoelectron spectroscopy for polymer materials. This paper traces a limited number of highlights in the evolution of ultraviolet photoelectron spectroscopy of polymers, from the 1970s through to 2008. Also, since this issue is dedicated to Prof. Kazuhiko Seki, who has been a friend and competitor for over two decades, the author relies on some of Prof. Seki's earlier research, unpublished, on who-did-what-first. Prof. Seki's own contributions to the field, however, are discussed in other articles in this issue.     

X-ray photoelectron spectroscopy studies on core-shell structured nanocomposites

Core-shell nanostructures were grown in silica-based glasses. Copper-copper oxide and iron-iron oxide structures had diameters in the range 3-6 nm, with shell thicknesses ∼1-2 nm. Silver-lithium niobate core-shell nanostructures had diameters in the range 4.2-46 nm and thicknesses varying from 2.2 to 22 nm. X-ray photoelectron spectroscopy studies were carried out on all these specimens. The analyses of these results show the presence of Cu⁺/Cu²⁺, Fe²⁺/Fe³⁺ and Nb⁴⁺/Nb⁵⁺ valence states in the above three systems. Electrical resistivity data were fitted satisfactorily to the small polaron hopping model in the case of copper and iron-containing specimens. The presence of ions in the lithium niobate shell provides direct evidence of the formation of localized states between which variable range hopping conduction can be effected.     

Many-body effect in the coincidence L3 and M3 photoelectron spectroscopy spectra of Cu metal

The coincidence L₃ and M₃ photoelectron spectroscopy (PES) main lines of Cu metal are calculated by a many-body theory. There is no peak-energy shift between the singles PES main line and the coincidence one. The asymmetric narrowing of the coincidence PES main line on the low kinetic energy (KE) side is very small. This is in accord with recent experimental findings. In Cu metal, the shakeup satellite intensity is small and the main-line satellite separation energy is much larger than the core–hole lifetime width. The interference via the final-state interaction is negligible. In the PES main line, the imaginary part of the self-energy by shakeup excitations, which is very small compared to the core–hole lifetime width, decreases very slowly in linear with photoelectron KE. The branching ratio of Auger decay of a single hole state then increases very slowly in linear with photoelectron KE so that the deviation of the coincidence PES main line from the singles one is very small. The 939 eV structure seen only in the coincidence L₃ PES spectrum of Cu metal is attributed to the enhancement of the inelastic peak of a smaller energy loss due to electrons of a smaller average emission depth measured in coincidence with the elastic Auger peak. The structure will not be enhanced in the singles PES spectrum. The background subtraction in the coincidence spectrum cannot be the same as that in the singles one. Such consideration is necessary before we can conclude about the asymmetric narrowing on the low KE side. A unique capability of APECS by which one can determine the photoelectron KE dependent part of the imaginary part of the self-energy is pointed out.     

Standards for x-ray photoelectron spectroscopy of boron compounds

A set of standard compounds for x-ray photoelectron spectroscopy (XPS): KBH₄, NaBPh₄, and KBF₄ has been identified. Literature data on XPS for salts of the anions , , and , the donor-acceptor complexes LBF₃, and also their related compounds was analyzed with a view toward the validity of the data. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 75, No. 6, pp. 886–895, November–December, 2008.     

Many-body effect in Auger-photoelectron coincidence spectroscopy spectra

When the shakeup/down excitations are not negligible in the core-level electron ionization, the photoelectron spectral peak measured in coincidence with a selected singles (noncoincidence) Auger-electron spectral peak does not necessarily coincide with the singles one. We discuss how the interference between the core-hole decay of a fully relaxed core-hole state and that of an incompletely relaxed one via the interaction between the final states created by the respective core-hole decays, affects the kinetic energy shift and asymmetrical lineshape change of the coincidence photoelectron spectrum compared to the singles one. When the final-state interaction is considerable, the interference reduces much the energy shift and the asymmetrical lineshape change. By the Auger-photoelectron coincidence spectroscopy (APECS) we can study the interference effect which does not manifest in the singles photoelectron spectrum. We discuss also the interference effect when the core-hole decay rates of both the fully relaxed core-hole state and the incompletely relaxed one depend critically on the changes in both the Auger-electron kinetic energy and the final-state potential. The effect is fairly independent of the changes.     

Pitfalls in measuring work function using photoelectron spectroscopy

Accurate measurement of work function is essential in many areas of research and development. Despite the importance of photoelectron spectroscopy as a technique for measuring work function, there has been relatively little discussion in the literature of how to conduct accurate measurements. We review the basic technique of measuring work function using ultraviolet photoelectron spectroscopy and discuss several common sources of error related to the experimental setup. In particular, the sample-detector geometry is found to be a key experimental parameter; accurate results are only obtained when the sample is perpendicular to the electron detector. In addition, we demonstrate that photoelectron work function values correspond to the minimum work function “patch” on a non-uniform surface, in contrast to the average work function measured by other techniques, such as the Kelvin probe method.     

Near surface composition of some alloys by X-ray photoelectron spectroscopy

Chemical compositions of the alloys of CuNi (Cu_0.10Ni_0.90, Cu_0.30Ni_0.70, Cu_0.70Ni_0.30) and BiSb (Bi_0.80Sb_0.20, Bi_0.64Sb_0.34, Bi_0.55Sb_0.45) are determined by X-ray photoelectron spectroscopy. The stoichiometries are determined and are compared with the bulk compositions. Possible sources of systematic errors contributing to the results are discussed. Errors arising out of preferential etching in these alloys have been investigated. It has been inferred from such studies that the preferential etching does not enrich the surface composition with a particular component for the two systems reported here. Quantitative results of CuNi system indicate that the surface regions of the Cu_0.70Ni_0.30 alloy is Cu-rich, although no such evidence is observed in case of BiSb system.     

The Ag M5N45N45 Auger photoelectron coincidence spectra of disordered Ag0.5Pd0.5 alloy

An effect of disorder broadening (DB) on the Ag M₅N₄₅N₄₅ Auger spectra in the random substituted Ag_0.5Pd_0.5 has been investigated by Auger photoelectron coincidence spectroscopy (APECS). Data were collected for the Ag M₅N₄₅N₄₅ Auger line coincident with the Ag 3d_5/2 photoelectron line (and its higher and lower binding energy sides). It is shown that the broadening of the Ag M₅N₄₅N₄₅ line is directly associated with the presence of disorder broadening of the Ag 3d_5/2 photoelectron line. The APECS experiment is used to demonstrate the broadening in a novel way.     

沉积态铀薄膜表面氧化的X射线光电子能谱

含铀(U)薄膜在激光惯性约束聚变的实验研究中有重要的用途.研究其在不同气氛下的氧化性能可以为微靶制备、储存及物理实验提供关键的实验数据.通过超高真空磁控溅射技术制备了纯U薄膜及金-铀(Au-U)复合平面膜,将其在大气、高纯氩(Ar)气及超高真空度环境中暴露一段时间后,利用X射线光电子能谱仪结合Ar~+束深度剖析技术考察U层中氧(O)元素分布及价态,分析氧化产物及机理.结果显示,初始状态的U薄膜中未检测到O的存在.Au-U复合薄膜中的微观缺陷减弱了Au防护层的屏蔽效果,使其在3周左右时间内严重氧化,产物为U表面致密的氧化膜及缺陷周围的点状腐蚀物,主要成分均为二氧化铀(UO_2).在高纯Ar气中纯U薄膜仅暴露6 h后表面即被严重氧化,生成厚度不均匀的UO_2.在超高真空度环境下保存12 h后,纯U薄膜表面也发生明显氧化,生成厚度不足1 nm的UO_2.Ar~+束对铀氧化物的刻蚀会因择优溅射效应而使UO_2被还原成非化学计量的UO_(2-x),但这种效应受O含量的影响.     

Spin-resolved photoelectron spectroscopy of rare-earth overlayers on rare-earth and d-metal substrates

Spin- and angle-resolved photoelectron spectroscopy was applied for studies of electronic and magnetic structures of Eu/Gd and Ce/Fe. Ferromagnetic coupling of 4f moments of Eu and Gd was found in the 1 ML Eu/Gd(0 0 0 1) system with high net Eu magnetization at low temperatures reflected by a spin polarization of 15% of the Eu 4f state. In case of the 1 ML Ce/Fe(1 1 0) system the antiparallel orientation of the Ce 4f spins with respect to the magnetization direction of the Fe substrate was observed. Very different shapes of the spin-up and spin-down Ce 4f spectral weights can be explained within periodic Anderson model by spin-dependent hybridization between Ce localized 4f and itinerant valence band states.     

双原子填充式skutterudite化合物的结构及X射线光电子能谱分析

用高温熔融、淬火、扩散退火结合放电等离子烧结(SPS)法合成了Ca和Ce复合填充的单相Ca_mCe_nFe_xCo_4-xSb₁₂(m=0.17—0.27，n=0.05—0.25，x=1.5)化合物，并结合Rietveld结构解析以及X射线光电子能谱(XPS)分析研究了两种原子复合填充skutterudite化合物的结构与填充状态.Rietveld结构解析表明，Ca_mCe_nFe_1.5Co_2.5Sb₁₂化合物具有skutterudite结构，Ca和Ce原子填充到了Sb的二十面体空洞中，填充原子热振动参数B_Ca/Ce远大于框架原子的热振动参数B_Fe/Co和B_Sb.XPS元素窄区谱分析结果表明，Sb原子在结构中有五种化学状态，每种化学状态的相对含量主要由总填充分数决定，填充原子Ca在Sb的二十面体空洞出现概率有三种可能，但在中心位置出现的概率最大. 关键词： skutterudite化合物 双原子复合填充 结构 X射线光电子能谱分析     

Sb掺杂SrTio3透明导电薄膜的光电子能谱研究

用X射线光电子能谱和同步辐射光电子能谱研究了Sb掺杂的钙钛矿型氧化物SrTi1-xSbxO3(x=0.05,0.10,0.15,0.20)薄膜的电子结构.薄膜由紫外脉冲激光淀积在SrTiO3(001)单晶衬底上.该薄膜系列在可见光波段透明,透过率均超过90%.其导电性与掺杂浓度有关,当Sb掺杂浓度x=0.05时,薄膜显示金属型导电性.X射线光电子能谱和同步辐射光电子能谱研究结果表明,Sb掺杂在母化合物SrTiO3的禁带内引入了浅杂质能级和深杂质能级.浅杂质能级上的退局域化电子离化到导带中会产生一定的传导电 关键词： 光电子能谱 光学透过率 脉冲激光沉积薄膜