SnAgCuBi无铅钎料对不同体积比SiCP/6063Al复合材料真空软钎焊接头组织和性能的影响

在不同保温时间下,分别采用 Sn-3.0Ag-0.5Cu 和 Sn-3.0Ag-0.5Cu-3.0Bi 无铅软钎料,对表面镀镍的两种不同体积分数的 SiCP/6063Al 复合材料进行真空软钎焊。通过剪切强度测试、显微组织分析、能谱分析等手段研究了钎焊接头的组织和性能。结果表明：Bi 元素的加入改善了 Sn-3.0Ag-0.5Cu 钎料的铺展润湿性,降低了熔点,提高了焊缝的抗剪强度;在270℃保温35 min 时,Sn-3.0Ag-0.5Cu-3.0Bi 钎料钎焊接头抗剪强度达到最高值38.23 MPa;钎焊过程中只是两侧镀镍层间的焊接,钎料并未透过镍层与母材发生扩散反应。     

Sn8Zn3Bi-xCu/Cu焊接接头界面反应及力学性能研究

以Sn8Zn3Bi为研究对象,采用微合金化方法研究了不同含量的Cu元素对其显微组织、钎料合金与Cu基板钎焊后的界面金属间化合物(IMC)层尺寸及焊接接头剪切强度的影响。结果表明,Sn8Zn3Bi-xCu/Cu(x=0.3,0.5,0.8,1.0,1.5)焊接界面IMC主要为层状Cu5Zn8相。随着Cu含量的增加,界面IMC层的厚度逐渐减小,接头的剪切强度逐渐提高,Sn8Zn3Bi-1.5Cu/Cu接头剪切强度较Sn8Zn3Bi/Cu显著提高。经120℃时效处理后,Sn8Zn3BixCu/Cu(x=0,0.3,0.5,0.8,1.0,1.5)焊接接头剪切强度都明显下降,接头断裂方式由韧性断裂转为局部脆性断裂,但添加了Cu元素的钎料界面IMC生长速度较Sn8Zn3Bi钎料慢,因此Cu元素的添加抑制了界面IMC层的生长。     

添加Bi和P对Sn-0.7Cu无铅钎料合金性能的影响

研究了添加Bi和P对Sn-0.7Cu无铅钎料合金熔点、显微组织、在Cu上的润湿性、导电率、硬度以及蠕变抗力等性能的影响。实验结果显示,随Bi含量增加,Sn-0.7Cu合金的熔点、导电率略有降低,润湿性、抗蠕变性能和维氏硬度均提高;此外,在添加Bi的基础上加P元素,能进一步降低Sn-0.7Cu-Bi合金的熔点,提高合金的导电率和润湿能力,但合金硬度略有下降;Sn-0.7Cu-1Bi-0.05P钎料合金的抗蠕变性优于Sn-0.7Cu-1Bi,Sn-0.7Cu-3Bi-0.05P钎料合金的抗蠕变性则劣于Sn-0.7Cu-3Bi。金相显微组织观察表明,单独加Bi能细化Sn-0.7Cu合金中的Cu6Sn5金属间化合物相;P的加入使Sn-0.7Cu-1Bi合金中的β-Sn枝晶尺寸变小,且Cu6Sn5相呈规则网络状分布于枝晶间隙;而在Sn-0.7Cu-3Bi合金中加P则粗化了Cu6Sn5相,并使IMC呈无规则分布。     

再流条件对Ni颗粒增强复合钎料组织形态的影响

主要针对不同的再流次数带来的不同热输入对Ni颗粒增强复合钎料IMC形态的影响进行了深入研究。由前一阶段研究表明，决定Ni颗粒增强复合无铅钎料组织变化的关键因素是钎料的钎焊温度与钎料熔点的温度差△T以及在熔点以上保温时间t。其本质即外界对钎料的热输入量的大小。随着热输入的增加，Ni颗粒周围的IMC以及钎料/基板界面处的IMC都相应变化发展。由于Ni颗粒的加入。基板＼钎料界面层的结构形态均与Sn-Ag共晶钎料有较大不同，Ni与cu6Sn5的相互作用起到了关键影响。界面层厚度的变化随再流次数增加呈现线性增长。     

SnAgCu-xBi/Cu焊点界面反应及微观组织演化

本工作在Sn-3.0Ag-0.5Cu焊料中添加不同含量的Bi(0.1%,0.5%,1.0%(质量分数)),以此来研究Bi含量对Sn-3.0Ag-0.5Cu/Cu焊点的界面反应及金属间化合物微观组织演化的影响。结果发现:回流反应之后,焊点界面形成扇贝状的Cu_6Sn_5,对焊点进行时效处理后发现,在Cu_6Sn_5层与Cu基板之间又出现了一层Cu_3Sn,并且Cu_6Sn_5层的上表面及焊料中出现了颗粒状的Ag_3Sn,Ag_3Sn颗粒的数量随着时效时间的延长而增多;5d的时效处理之后,在Cu基板的上表面和Cu_3Sn层中发现了柯肯达尔孔洞,同时在大多数焊点界面的Cu_6Sn_5层的上表面和Cu_6Sn_5层中出现了裂纹,推测裂纹是由于热膨胀系数差导致的残余应力而形成的。时效过程中,焊点界面金属间化合物(IMC)层的厚度不断增加,并且IMC的平均厚度与时效时间的平方根呈线性关系。对比未添加Bi元素的Sn-3.0Ag-0.5Cu/Cu焊点发现,添加微量的Bi元素对IMC层生长有抑制作用,当Bi含量为1.0%时,抑制作用最为明显,而Bi含量为0.5%时,抑制作用最弱。Cu_6Sn_5晶粒的平均直径随着时效时间的延长而增加,且Cu_6Sn_5晶粒的平均直径与时效时间的立方根呈线性关系。     

纳米结构强化的新型Sn-Ag基无铅复合钎料

通过外加法向Sn-3.5Ag钎料中加入质量分数为1%,2%和3%的纳米级多面齐聚倍半硅氧烷(polyhedral oligomeric silsesquioxanes,POSS)颗粒制备无铅复合钎料.系统研究POSS颗粒的显微组织,钎料的熔化特性、润湿性能和力学性能.结果表明:POSS颗粒的加入并没有改变Sn-Ag基复合钎料熔化温度.复合钎料的铺展面积均有所增加,润湿角有所下降,表现了良好的润湿性.POSS颗粒的加入显著提高钎料钎焊接头的剪切强度.     

Sn-9Zn-xAg钎料在Cu基材上润湿性能及界面组织的研究

研究了添加合金元素Ag对Sn-9Zn无铅钎料显微组织、在铜基上的润湿性能及对钎料/铜界面组织的影响.研究结果表明:当Ag的含量(质量分数,下同)在0.1%～0.3%时,钎料中针状富Zn相逐渐减少,当Ag的含量在0.5%～1%时,钎料中出现Ag-Zn化合物相;当Ag的含量为0.3%时,钎料具有最好的润湿性能,当Ag的含量为0.5%～1%时,钎料的润湿性能下降;Sn-9Zn/Cu的界面处形成平坦的Cu5Zn8化合物层,当Ag含量为0.3%时,在Cu5Zn8化合物层上出现节结状的AgZn3化合物相,随着Ag含量的提高,这种节结状的AgZn3化合物相逐渐聚集长大成扇贝状的化合物层.     

合金元素对Cu/Sn-/Cu回流焊焊点界面微观结构及剪切性能的影响

选用Sn64Bi35Ag1、Sn64.7Bi35Ag0.3和Sn99Ag0.3Cu0.7三种不同的钎料进行回流焊焊接试验,研究高Bi元素、低Ag元素钎料及低Ag钎料对Sn基钎料焊点微观组织及剪切性能的影响.结果表明:各焊点界面处均生成了 一层扇贝状的Cu6Sn5金属间化合物,在含Bi元素的钎料焊点中,Bi元素在焊点界面及内部聚集,导致界面处金属间化合物层的厚度增加,大量富Bi相呈脆性,降低钎料中的Ag含量对焊点中Bi元素的富集现象有减弱作用.Sn99Ag0.3Cu0.7钎料焊点界面处的金属间化合物层厚度最小,且焊点内部形成了细小的Ag3Sn相颗粒,共晶组织呈均匀分布,使得焊点剪切性能最优,其剪切强度达20.4 MPa.     

纳米结构强化无铅焊点的力学性能

新型的无铅钎料不仅要具备含铅钎料的工艺性能,更重要的是要有更高的力学性能,特别是焊接接头的抗蠕变能力。将纳米级多面齐聚倍半硅氧烷(Polyhedral oligomeric silsesquioxanes,POSS)颗粒作为增强相添加到基体钎料中,能够有效地改善Sn-3. 5Ag基复合钎料的性能。研究了不同种类POSS增强颗粒对Sn-3. 5Ag钎料显微组织和力学性能的影响,确定出POSS增强颗粒复合钎料的最佳配比,并对最佳配比复合钎料在不同温度不同载荷条件下的蠕变寿命进行了研究。结果表明：POSS颗粒质量分数小于2%时,可以抑制基板界面处初晶金属间化合物的生长;复合钎料的抗剪切强度明显提高;低温时,最大蠕变寿命明显改善。     

等温时效对新型Sn-Ag基复合钎料显微组织和力学性能的影响

研究了等温时效对Sn-3.5Ag共晶钎料及其复合钎料的力学性能和显微组织变化的影响。为了弥补传统复合钎料制备和服役中强化颗粒容易粗化的问题, 制备了不同种类最佳配比的具有纳米结构的有机无机笼型硅氧烷齐聚物(POSS)颗粒增强的Sn-Ag基复合钎料。对钎焊接头在不同温度（125、150、175℃）下进行时效,通过SEM和EDAX分析了钎料与基板间金属间化合物层(IMC)的生长情况。结果表明, 经过不同温度时效,复合钎料钎焊接头界面处金属间化合物的生长速率比Sn3.5Ag共晶钎料慢, 复合钎料的IMC生长的激活能分别为80、97和77kJ/mol,均高于Sn3.5Ag共晶钎料。经过150℃时效1000h后,复合钎料钎焊接头的剪切强度分别下降了22%、13%和18%,下降幅度相当或明显小于Sn-3.5Ag钎料钎焊接头。      

Effect of Bi content on spalling behavior of Sn–Bi–Zn–Ag/Cu interface

The effect of the Bi content on the formation of intermetallic compounds (IMCs) layers between the Sn-xBi-0.9Zn-0.3Ag lead-free solder (with x = 1, 2, 3 and 4, in weight percent, hereafter) and Cu substrate was investigated. The structure of the IMC layer in the soldered interface varies apparently with increasing the Bi content. When the Bi content is 1 wt%, the interface soldered is consisted of CuZn and Cu₆Sn₅ IMC layers, which are separated by an intermediate solder layer. As the Bi content increases, the spalling phenomenon tends to disappear. Moreover, the layer between the Sn-2Bi-0.9Zn-0.3Ag solder and Cu substrate is thicker than others. The evolution of the soldered interfacial structure could be attributed to the existence of Bi.     

Effect of Y<Subscript>2</Subscript>O<Subscript>3</Subscript> particles on microstructure formation and shear properties of Sn-58Bi solder

In the present study, varying weight percentages of Y₂O₃ particles (3–5 μm) from 0 to 3% were incorporated into eutectic Sn-Bi solder matrix to form composite solders. It is found that the reinforcement particles were well dispersed in the solder matrix. They depressed the growth of intermetallic compound (IMC) layers and reduced the size of IMC grains. Since the Y₂O₃ particles serve as additional nucleation sites for the formation of primary Bi-rich phase, the size of both Bi-rich phase and the IMCs were decreased gradually with the Y₂O₃ content increasing. Shear tests were also conducted on as—soldered joints. The growth of solid-state intermetallic compounds layer was examined by thermal aging of the solder/Cu couple for a temperature range from 60 to 120°C and time periods from 50 to 500 h. Compared with Sn-58Bi solder, finer eutectic microstructures were obtained with Y₂O₃ addition after long time aging. The apparent activation energies calculated for the growth of the intermetallic compound layers were 72 ± 5 kJ/mol of Sn-58Bi, 74 ± 4 kJ/mol of Sn-58Bi-0.5wt%Y₂O₃, 81 ± 5 kJ/mol of Sn-58Bi-1wt% Y₂O₃ and 81 ± 7 kJ/mol of Sn-58Bi-3wt.% Y₂O₃, respectively.     

Electromigration effect on Sn-58 % Bi solder joints with various substrate metallizations under current stress

The electromigration behavior of low-melting temperature Sn-58Bi (in wt%) solder joints was investigated with a high current density between 3 and 4.5 × 10³ A/cm² between 80 and 110 °C. In order to analyze the impact of various substrate metallizations on the electromigration performance of the Sn-58Bi joint, we used representative substrate metallizations including electroless nickel immersion gold (ENIG), electroless nickel electroless palladium immersion gold (ENEPIG), and organic solderability preservatives (OSP). As the applied current density increased, the time to failure (TTF) for electromigration decreased regardless of the temperature or substrate metallizations. In addition, the TTF slightly decreased with increasing temperature. The substrate metallization significantly affected the TTF for the electromigration behavior of the Sn-58Bi solder joints. The substrate metallizations for electromigration performance of the Sn-58Bi solder are ranked in the following order: OSP-Cu, ENEPIG, and ENIG. Due to the polarity effect, current stressing enhanced the fast growth of intermetallic compounds (IMCs) at the anode interface. Cracks occurred at the Ni₃Sn₄ + Ni₃P IMC/Cu interfaces on the cathode sides in the Sn-58Bi/ENIG joint and the Sn-58Bi/ENEPIG joint; this was caused by the complete consumption of the Ni(P) layer. Alternatively, failure occurred via deformation of the bulk solder in the Sn-58Bi/OSP-Cu joint. The experimental results confirmed that the electromigration reliability of the Sn-58Bi/OSP-Cu joint was superior to those of the Sn-58Bi/ENIG or Sn-58Bi/ENEPIG joints.     

Effect of strain rate on interfacial fracture behaviors of Sn-58Bi/Cu solder joints

The interfacial reactions and mechanical properties of Sn-58Bi/Cu solder joints reflowed at different temperatures ranging from 180 to 220 °C for constant time of 10 min were investigated with various strain rates. Only a continuous Cu₆Sn₅ intermetallic compound (IMC) layer was formed at the interface between the Sn-58Bi solder and the Cu substrate during reflow. The equivalent thickness of the Cu₆Sn₅ layer increased with increasing reflow temperature, and the relationship between Cu₆Sn₅ layer equivalent thickness (X) and reflow temperature (T) is obtained by using method of linear regression and presented as $ X = 0.01 \times T + 0.187 $ . For the tensile property, the tensile strength of solder joint gradually decreased as the reflow temperature it increased, whereas it increased with increasing strain rate. Moreover, the fracture behavior of Sn-58Bi/Cu solder joint indicated the ductile fracture with low strain rate (5 × 10^?4 and 1 × 10^?3 s^?1), while toward brittle fracture with high strain rate (2 × 10^?3 and 1 × 10^?2 s^?1). The strain rate sensitivities of the solder joints fractured with various modes were also investigated, and it is found that the tensile strength of the solder is more sensitive to the strain rate than that of the IMC layer.     

纳米Ag颗粒/In-3Ag复合焊料的微观组织演变

通过外向法制备纳米Ag颗粒/In-3Ag复合焊料, 研究在多次回流过程中, 添加不同含量的纳米Ag颗粒对In-3Ag焊料焊点基体组织和界面IMC层(intermetallic compound)的影响规律, 采用SEM、HRTEM、能量色散仪(EDS)和电子探针(EPMA)分别对焊点基体及IMC层的微观结构及成分进行观察和分析。研究结果表明: 纳米Ag颗粒能诱发晶粒成核, 多次回流后, 复合焊料基体中颗粒状二次相AgIn₂没有明显长大现象; 通过塞积扩散通道和表面吸附效应, 纳米Ag颗粒能显著抑制焊料界面IMC层在多次回流过程的生长; 纳米Ag颗粒的合适添加量为0.5%(质量分数,下同), 当添加1%时, 颗粒团聚, 导致界面处出现球形AgIn₂, 降低焊料的力学性能。     

Sn3.0Ag0.5Cu3.0Bi钎料对化学镀镍SiCp/6063Al复合材料真空钎焊接头组织和性能的影响

采用Sn3.0Ag0.5Cu3.0Bi软钎料对镀镍后的两种不同体积比SiC_p/6063Al复合材料进行真空钎焊。通过SEM、剪切试验等方法分析了化学镀镍后SiC_p/6063Al复合材料真空钎焊接头的显微组织以及保温时间对接头性能的影响。结果表明:两种不同体积比SiC_p/6063Al复合材料真空钎焊后的焊缝组织致密,钎料对镀镍复合材料的润湿性良好;在270℃、保温35min的钎焊工艺下,钎焊接头的剪切强度最大值为38.3 MPa;钎料中的Sn、Cu元素能够与复合材料表面的Ni层发生化学反应,实现钎料与母材的冶金结合;镀镍后SiC_p/6063Al复合材料真空钎焊接头断裂形式为韧性断裂为主的混合断裂,断裂主要发生在钎料内部,部分发生在镀镍层与钎料的结合处。     

Effects of tin particles addition on structural and mechanical properties of eutectic Sn–58Bi solder joint

Due to the inherent environmental and health toxicities associated with lead, the use of environmental friendly lead-free solder materials has become an unavoidable trend in the electronic packaging industry. Sn-58Bi alloy is gaining attention for its good material properties such as low melting point, reliability and high tensile strength. The presence of the bismuth-rich phase increases the brittleness of Sn-58Bi alloy. The purpose of this study is to suppress the brittleness of Sn-58Bi alloy by the addition of different wt% (0, 10, 20, 30) of Sn powder. The powder metallurgy method was used to prepare the samples. Scanning electron microscopy and energy-dispersive X-ray analysis were done to study the structural properties and a tensile test was done by a universal tensile machine to study the mechanical properties. The results reveal that the Sn particles partially dissolved in the Sn-58Bi solder matrix. The dissolution of Sn particles significantly improved the mechanical strength by 30%, suppressed the brittleness and improved the strain value by 1.3 times.

     

Effect of thermal ageing on (Sn-Ag, Sn-Ag- Zn)/PtAg, Cu/Al2O3 solder joints

As-fabricated solders of eutectic Sn-Ag and ternary Sn-3.5 wt% Ag-1 wt% Zn alloys are coupled with metallized substrates including PtAg/Al2O3 and Cu/Al2O3 to simulate the solder joint in microelectronics. The growth mechanism of intermetallics and the mechanical properties of solder joints after thermal ageing (150 °C and 200 °C) are evaluated. In this study, a 1206 passive device/solder/metallization/Al2O3 surface mount technology (SMT) assembly is employed, and a Cu stud is attached on the ceramic substrate assembly to evaluate mechanical properties and the fracture morphology by the pull-off test. In addition, microstructure evolution of the interfacial morphology, elemental and phase distribution are probed with the aid of scanning electron microscopy (SEM), electron probe micro-analysis (EPMA) and X-ray diffraction (XRD) techniques. There are two intermetallics (Cu3Sn and Cu6Sn5) formed at the eutectic Sn-Ag solder/Cu metallized layer interface, while only Cu6Sn5 is observed in the Sn-3.5 Ag-1Zn/Cu system. However, in the PtAg metallized substrate, only Ag3Sn is present, regardless of which solders are employed. Cu6Sn5 and Ag3Sn in the Sn-3.5 Ag-1Zn system contain 2–5 at% Zn due to the higher solubility of Zn in both Cu and Ag. The adhesion strength decreases as the time increases for all solder joint systems in the thermal ageing test. The solder joint with eutectic Sn-Ag alloy exhibits higher fracture load than that with Sn-3.5 Ag-1Zn alloy. From the fracture surface analysis, as the ageing time increases, the fracture takes place from the solderconductor interface toward the inside of the IMC (intermetallic compound). © 1998 Kluwer Academic Publishers     

Sb,Bi 元素对 Sn-22 Sb 高温钎料合金组织的影响

目的研究Sb和Bi元素对Sn-22Sb钎料显微组织的影响。方法制备了(Sn-22Sb)-xBi和Sn-xSb钎料合金,并分别采用差热分析和X射线衍射仪,分析了材料的熔化特征和物相。结果结果表明:Sn-22Sb钎料合金主要由灰色的β-Sn和白色块状的Sb2Sn3构成;少量的Bi使得Sn-22Sb钎料合金中Sb2Sn3金属间化合物逐渐细化和均匀化,数量却急剧增加;大量添加Sb后,使得Sn-22Sb钎料合金几乎全部变为粗大的块状β-SnSb组织,钎料合金的开始熔化温度有所提高。结论通过添加其他合金元素,降低Sn-50Sb钎料液相线温度,使其有望应用于二次回流焊。