共查询到16条相似文献,搜索用时 343 毫秒
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用气相法生长出了毫米尺寸的具有规则晶面和金属光泽的高质量的纯C60单晶.X射线衍射分析表明,C60单晶在室温下具有面心立方(fcc)结构,晶格常数为α=1.4199(4)nm。用扫描电子显微镜和光学显微镜观察了C60单晶的形貌,除观察到fcc结构的晶体所特有的{111}和{200}两种稳定晶面以及非常容易形成的孪晶之外,还发现了在{111}面上的树枝状、垄状和生长丘以及在{200}面上的树枝状、游泳池状和生长丘的生长缺陷。对C60
关键词: 相似文献
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在C60单晶超高真空解理面上制备C60的Rb填隙化合物薄膜.用同步辐射光电子能谱研究了相衍变过程.观察到对应于固溶相、Rb1C60和Rb3C60的电子态密度分布.当数纳米厚Rb3C60薄膜在C60单晶(111)解理面形成后,室温条件下进一步沉积Rb至样品表面不产生fcc到bct或bcc结构相变.C60
关键词:
4C60和Rb5C60吸附相')" href="#">金属性Rb4C60和Rb5C60吸附相
60单晶')" href="#">C60单晶
相衍变
同步辐射光电子能谱 相似文献
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采用嵌入原子势和分子动力学方法,模拟了单晶铁在一维应变条件下由体心立方(bcc)转变为六角密排(hcp)结构的微观过程. 当应变加载至相变临界值时,hcp相开始均匀形核并沿{011}晶面长大为薄片状体系.弹性常数C31和C32在相变前被逐渐硬化,C33则在相变前出现软化行为;当体系完全相变后,上述各弹性常数显示开始随体积压缩而迅速硬化,温度效应对晶格具有软化作用,可削弱C33的硬化和软化过程;样品在压缩过程可出现孪晶结构,孪晶结构使晶格发生剪切变形.混合相中,hcp相势能比bcc相高,最大剪应力方向与bcc相反向;系统的偏应力与hcp相质量分数近似呈线性关系.
关键词:
结构转变
分子动力学
一维应变 相似文献
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采用描述原子间相互作用的Lennard-Jones势来描述C60分子间的相互作用,考虑了每个C60分子的一定位置取向,并采用最速下降法计算了IH,fcc,hcp,DH及SC五种典型结构满壳层(C60)N团簇(N<2000)的能量.结果显示:当尺寸较小(N<20)时,IH结构最稳定;当尺寸处于中等(50<N<300)时,HCP结构最稳定;当尺寸较大(300<N
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60团簇')" href="#">C60团簇
取向
最速下降法
结构演化 相似文献
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《Surface science》1996,367(3):L79-L84
Scanning tunneling microscopy has been used to study C60 overlayers on TiO2(100)-(1 × 3). Initial adsorption preferentially occurs on O vacancies (Ti3+), evidencing a site-specific interaction dominated by substrate-adsorbate charge transfer. At saturation coverage the molecules are incommensurate with Ti3+ sites along [001], suggesting a delicate balance between intermolecular and substrate interactions. The unit cell of the C60 overlayer is 13.8Å× 10.0 ± 0.5Å, consistent with the first layer of fcc C60(110); molecules also adopt sites in the troughs of the (1 × 3) structure to form the second layer. 相似文献
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Y. Ma Y. Xia M. Zhao R. Wang Y. Mu 《Applied Physics A: Materials Science & Processing》2001,73(3):365-369
Molecular-dynamics simulations (MDSs) and ab initiocalculations are used to investigate the adsorption behavior of C60 molecules on a clean dimer-reconstructed (100)(2×1) diamond surface. C60 molecules have some probability to be adsorbed on the diamond surface at low incident energy (6∼45 eV). Electron-density
contours show strong chemical interaction between C60 molecules and the substrate surface. The adsorption property depends strongly on the incident energy and the impacting point.
An incident energy of 18 eV may be an appropriate energy to grow a sub-monolayer or monolayer C60 film on a clean C(100)(2×1) surface at room temperature.
Received: 5 July 2000 / Accepted: 17 October 2000 / Published online: 28 February 2001 相似文献
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The characteristics of interaction between C60 molecules and Si(1 1 1)-7×7, Ag/Si(1 1 1)-√3×√3 R30° and layered material MoS2 surfaces have been investigated using electron-energy-loss spectroscopy (EELS). The EEL spectrum of C60/Si(1 1 1)-7×7 shows a new peak at loss energy of 2.7 eV. This indicates the existence of charge transfer from the substrate to C60 molecules. The EEL spectrum of a C60 monolayer film grown on a cleaved surface of MoS2 is almost the same as that of bulk C60. The EEL spectrum of a C60 monolayer film on an Ag/Si(1 1 1) surface is quite different from that on a clean Si(1 1 1)-7×7 surface, although the films on those substrates have the same epitaxial arrangement. Furthermore, intensities of energy-loss peaks of C60/Ag/Si(1 1 1) are slightly smaller than those of C60/MoS2 in spite of having the same loss-energy. This suggests that the interaction between C60 molecules and the Ag/Si(1 1 1) surface is stronger than that between C60 molecules and the MoS2 surface. 相似文献
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《Surface science》1996,366(2):L715-L718
Theoretical simulation of STM image of C60 molecules on Si(100)-(2 × 1) surface was performed by the DV-Xα-LCAO method. The results excellently reproduced the internal stripe pattern of the STM image of C60 observed by experiment. We confirm that it is the interaction between C60 and the Si substrate which causes this internal structure. 相似文献
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M C Valsakumar N Subramanian M Yousuf P Ch Sahu Y Hariharan A Bharathi V Sankara Sastry J Janaki G V N Rao T S Radhakrishnan C S Sundar 《Pramana》1993,40(2):L137-L144
Detailed analysis of the room temperature X-ray powder diffraction data of pure solid C70 is reported. C70 prepared by slow evaporation from toluene solution adopts an hcp structure (space groupP63/mmc) witha=10·53(1) A andc=17·24(1) A. C70 sublimed on to Si wafer adopts an fcc structure witha=14·89(1) A. The occurrence of both the hcp and fcc phases is rationalized in terms of cohesive energy calculations. Theoretical
calculations of the diffraction pattern for the hcp structure, taking into account (a) orientational disorder amongst the
molecules (b) presence of stacking faults and (c) a fraction of the sample to be amorphous/microcrystalline is seen to provide
very good agreement with the experimental diffraction pattern. 相似文献