TE0导模干涉刻写周期可调亚波长光栅理论研究

通过棱镜耦合激发非对称金属包覆介质波导结构中的TE₀导波模式, 利用两束TE₀模的干涉从理论上实现了周期可调的亚波长光栅刻写. 分析了TE₀模式的色散关系, 刻写亚波长光栅的周期与激发光源、棱镜折射率、光刻胶薄膜厚度及折射率之间的关系. 用有限元方法数值模拟了金属薄膜、光刻胶薄膜和空气多层结构中TE₀导模的干涉场分布. 研究发现, 激发光源波长越短, TE₀ 模干涉刻写的亚波长光栅周期越小; 光刻胶越厚, 刻写的亚波长光栅周期越小; 高折射率光刻胶有利于更小周期亚波长光栅的刻写. 相较于表面等离子体干涉光刻, 基于TE₀ 模的干涉可在厚光刻胶条件下通过改变激发光源、棱镜折射率、光刻胶材料折射率、特别是光刻胶薄膜的厚度等多种方式实现对亚波长光栅周期的有效调控.     

对称单负介质包层平面波导的模式特征

系统研究了负μ材料(MNG)作为包层的对称三层平板波导的传输特性. 研究发现,这种波导既支持快波的传播,又支持TE₀,TE₁模式的慢波传输. 其模式特性不同于左手介质波导和传统介质波导,导模存在的模折射率范围要比它们的大. MNG波导的TE₀快波模缺失,且TE_m模(m>1)的传播常数大于TM_m模的传播常数. TE_m模具有双模特征,且与波导的结构参数密切相关,导致波导中的净能流出现负值. 关键词： 单负介质 平板波导 快波与慢波 传播常数     

基于伴随法逆向设计的硅基分模器

基于伴随优化设计算法逆向设计了一种高集成度硅基分模器。通过优化设计得到横电模TE₀和TE₁双模分模器的尺寸仅为5.5μm×4μm,其可在不改变模阶数的情况下实现模式高效分离。理论结果显示：当输入TE₀模式时,中心波长处的插入损耗和串扰分别为0.14 dB和-23.8 dB;当输入TE₁模式时,插入损耗和串扰分别为0.48 dB和-22.45 dB;工作带宽覆盖150 nm时,TE₀和TE₁模式的插入损耗分别低于0.44 dB和1.16 dB。基于全矢量三维有限时域差分法分析了±15 nm制备容差,两种模式的插入损耗低于0.79 dB,串扰低于-18.37 dB。所提出的紧凑型硅基分模器可应用于片上模分复用系统,为大容量片上光通信和光互联提供可行器件。     

对称平板漏波导中的非线性导波

本文从平面波理论出发,研究了薄膜为非线性介质的对称平板漏波导的TE_0模传输特性.计算结果表明,膜厚大于一临界值时,不存在稳定的TE_0模,膜厚小于临界值时,最多能存在两种峰值场强的TE_0模.膜厚越小,两种峰值场强相差越大.     

离子动力参数区托卡马克电阻性内扭曲模稳定性分析

利用离子动力参数区的内扭曲模色散关系分析了托卡马克等离子体电阻性内扭曲模的频率和增长率随磁剪切量s₀的变化。我们发现:存在一个临界磁剪切量s_0c,只有当s₀>s_0c时,即中心安全因子q₀小于某个临界值q_0c时,电阻性内扭曲模才能被激发。另一方面,随着磁剪切量s₀的加大,增长率增大的趋势比相应的磁流体电阻性内扭曲模快得多,因而与锯齿的快崩裂有内在的联系。所 关键词：     

基于硅基砖砌型亚波长光栅的紧凑型模式转换器

亚波长光栅可以等效为均匀介质,具备可控的双折射、色散和各向异性等优势,有利于设计高性能的光子器件.尽管目前传统的亚波长光栅结构只需要单步刻蚀,然而通常需要100 nm及以下的制造分辨率,这对当前主流的晶圆级硅光子芯片制造技术来说比较困难.亚波长光栅的各向异性可以通过引入砖砌型拓扑结构来进一步设计,从而在设计中提供额外的自由度,同时还可以降低制造分辨率需求(> 100 nm).本文提出并研究了基于硅基砖砌型亚波长光栅的紧凑型TE₀-TE₁和TE₀-TE₂模式转换器,其中砖砌型亚波长光栅的最小特征,尺寸为145nm.实现了TE₀模式到TE₁模式和TE₂模式的转换,转换区域长度分别为9.39μm和11.27μm.测试结果表明,在68 nm (1512—1580 nm,受限于激光器调谐范围和光栅耦合器)带宽内,插损和串扰分别小于2.5 dB和-10 dB.     

圆波导TE01模激励器设计及实验研究

对比分析了几种可输出圆波导TE₀₁模激励器的仿真设计结果。结果表明,利用行波功分结构实现矩形波导TE₁₀模到4路矩形波导TE₁₀模的等幅同相功分,进而合成转换成圆波导TE₀₁模的转换过程,可在较宽的频带范围内,实现圆波导TE₀₁模的高效激励。以中心频率9.40 GHz仿真设计的圆波导TE₀₁模激励器,在中心频率上的传输效率超过99.9%;在9.08~9.61 GHz的频率范围内,传输效率大于99%。实验测量结果表明,所加工激励器在较宽的频带范围内,传输损耗优于-0.2 dB,与仿真结果的差异主要来自于波导壁面的欧姆损耗和波同转换结构;器件工作频带内平坦特性良好,有利于开展测量工作。     

三信道石墨烯电光调制和模分复用集成器件

提出了一种三信道石墨烯电光调制和模分复用集成器件,该器件由单层石墨烯覆盖的一维光子晶体纳米梁腔电光调制模块和纳米线波导模分复用模块组成。利用三维时域有限差分法进行仿真分析,结果表明,该器件可以同时实现TE₀模、TE₁模和TE₂模的调制和模分复用功能。当波长为1 570 nm时,消光比大于28.3 dB,插入损耗小于0.21 dB,信道串扰小于-28.6 dB,调制器的3 dB带宽达到100 GHz,器件尺寸约为100μm×13μm。该集成器件性能优良,在大容量光通信系统中具有重要的应用价值。     

电子温度各向异性对螺旋波等离子体中电磁模式的传播及功率沉积特性的影响

采用考虑粒子温度各向异性热等离子体介电张量模型,借助磁化、均匀密度分布等离子体中电磁波的一般色散关系,在低磁场、低气压螺旋波等离子体典型参量条件下,理论分析了电子温度各向异性对电磁模式传播特性和角向对称模功率沉积的影响.研究结果表明:对于给定的纵向静磁场B₀(或波频率ω),存在一个临界波频率ω_cr(或纵向静磁场B_0,cr),当ω>ω_cr(或B₀0,cr)时,电子回旋谐波遭受的阻尼开始显著增大;相比粒子温度各向同性情形,粒子温度各向异性彻底改变了波的传播特性,即相位常数和衰减常数均出现峰值现象;在考虑电子有限拉莫尔半径效应和电子温度各向异性情形下,Trivelpiece-Gould (TG)波碰撞阻尼在整个电磁波功率沉积中占据主导地位,电子纵向温度T_e,//存在某一临界值,在此临界值处TG波功率沉积出现峰值P_abs,TG,且随着T_e,⊥/T_e,//的减小,...     

X波段过模弯曲圆波导TM01-HE11模式变换器研究

在波束波导和反射面天线的馈源应用中, 为了产生低副瓣且方向图等化的高斯波束, 需要将高功率微波转换为准高斯模HE₁₁模辐射. 本文利用弯曲圆波导可同时从TM₀₁模产生TE₁₁模和TM₁₁模的原理, 提出了采用双弯曲过模圆波导结构直接将TM₀₁转换为HE₁₁的模式变换器, 避免了常规微波领域中首先将TM₀₁转换为TE₁₁再用波纹式或半径渐变式TE₁₁-HE₁₁转换器转换为准高斯波束功率容量不足或尺寸过长的不足. 基于模式耦合理论和Taguchi优化算法对模式变换器的弯曲半径、相移直端长度及引入位置进行了优化, 使输出的TE₁₁和TM₁₁成一定比率, 以组成HE₁₁模式, 并对设计的模式变换器进行了全电磁波仿真分析, 结果表明输出波束的标量高斯含量在9.05–9.8 GHz范围内均高于99%, 理论功率容量可达4.5 GW. 关键词： 高功率微波 模式耦合理论 Taguchi优化算法 模式变换器     

A nonlinear dynamic effect of formation of photo-induced periodic structures in waveguiding As<Subscript>2</Subscript>S<Subscript>3</Subscript>-Ag thin films

A nonlinear effect of spatiotemporal transformations of a focused linearly polarized Gaussian beam of a He-Ne laser obliquely incident (S and P polarizations) upon an As₂S₃-Ag film containing a small amount of chlorine and deposited onto a glass substrate is found and interpreted. The effect consists in the appearance, in the process of exposure, of beams diffracted and anisotropically scattered by periodic structures arising due to excitation of the waveguide TE₀ and TM₀ modes in the film. The diffraction measurements of the effective refractive indices for the TE₀ and TM₀ modes make it possible to calculate the refractive index and the thickness of the film from dispersion equations. Along with slow evolution of the diffraction and scattering patterns, we have found a persistent optical turbulence in the fringes of scattering from the structures related to excitation of the TE₀ modes. It is suggested that the turbulence is an indication of existence of reversible processes in the mechanism of photosensitivity.     

Guided modes in slab waveguides with a left handed material cover or substrate

We study guided modes propagating along a dielectric slab waveguide with a left handed material (LHM) cover or substrate. The dispersion relation is derived by using normalized waveguide parameters. An analytical method is then proposed to calculate the universal dispersion curves. Different from a slab waveguide with a LHM core, we find that guidance properties are strongly dependent on dielectric permittivity ε and magnetic permeability μ of the substrate and cover layers. For oscillating guided modes, fundamental zero order mode is not always absence, sometimes it exists in a restricted range of normalized propagation constant. First order mode behaves as other higher order modes and exists up to infinite high frequency. Higher order modes have no double degeneracy in the case of LHM cover layer. For surface guided modes, the existence and the type of the mode solutions with respect to different parameters are classified systematically and discussed in detail. Unlike a slab waveguide with a LHM core where the dispersion curve of TE₁ surface mode continues with that of oscillating TE₁ mode, the dispersion curve of TE₁ surface mode continues with that of oscillating TE₀ mode. It seems that the two different kinds of modes compensate each other to form one whole mode. Both TE and TM guided modes are discussed.     

Photoinduced transformations in a thin-film waveguide AgCl-Ag composition under a green (532 nm) laser beam

A linearly polarized (E ₀) laser beam (λ = 532 nm) causes photoinduced transformations in an AgCl-Ag composition consisting of a thin waveguide AgCl film on glass covered by a layer of Ag nanoparticles. Before the illumination the sample exhibits an absorption band due to localized plasmons in nanoparticles. The illumination excites plasmons and leads to scattering of waveguide TE₀ modes. The interference of modes with the incident light beam leads to the development of a periodic structure, the lines of which are formed by Ag particles and directed along E ₀. The measured structure period coincides with the result of calculation based on solving the dispersion equation for the TE₀-mode. Measurement of absorption in the E ‖ E ₀ polarization reveals dichroism and a spectral hole (at λ ≈ nm). It is shown that the structures formed remain on the substrate after removing AgCl in a fixing agent. The dichroism value and dispersion change after fixing. The character of dichroism prior to fixing is recovered after depositing an AgCl layer (with the parameters retained) on the fixed film.     

A partially reflecting metal cladding: its effect on the modes of dielectric optical waveguides

If the metal cladding of a dielectric optical waveguide is sufficiently thin to be only partially reflecting, then the waveguide modes differ from those of the conventional metal-clad waveguide. The TE modes are little affected by a variation in the metal thickness but the TM modes change considerably due to a coupling between the waveguide modes and the surface plasma waves supported by both the metal: dielectric interfaces and the metal film. It is the refractive index of the dielectric cladding which is remote from the guiding core that determines whether the lowest order TM mode is the TM₀ or TM₁ mode. This dielectric cladding also strongly influences the attenuation of the TM modes and, if the guide supports a TM₀ mode, then the attenuation of the TM modes far from cut-off are an order of magnitude higher than that of the corresponding modes when the guide cannot support a TM₀ mode. If the guide can support a TM₀ mode then its dimensions can be chosen such that it will support the TE_N and TM_N modes with equal phase velocities. A lossless approximation is used to develop an expression which will specify the required guide dimensions directly and parametric plots of these dimensions are discussed.     

Nonpolarizing and tunable perpendicular dual-grating guided-mode resonance filter

A perpendicular dual-grating (PDG) guided-mode resonance filter was constructed by placing two identical waveguide gratings close to and their grooves perpendicular to each other. Multilayer waveguide theory was used to estimate the resonant wavelength for the TE and TM polarization incidences, and the rigorous coupled wave analysis (RCWA) was used to investigate the resonant wavelength, the lineshape and linewidth of the resonant peaks for arbitrary polarization incidences. The filter presents identical spectral characteristics for normally incident wave with arbitrary polarization. The separation of the resonant reflection peaks corresponding to the TE₀ and TM₀ split modes were realized by properly selecting the geometrical and material parameters of the grating layers and the waveguide layers. Measurement of the nano air gap between 0 and 0.4 p by determining one of the two resonant reflection peaks of the TE₀/TM₀ split modes was achieved without being interfered by the TM₀/TE₀ split modes.     

Theory for the first-order spin-wave instability threshold in ferromagnetic insulating thin films

A theory for the first-order Suhl and the parallel pumping instability in thin films is presented. Significant differences for the critical microwave field and wave vector to former calculations occur, which discuss the problem in terms of bulk spin-waves neglecting boundary conditions. A coupling matrixC _kk′ is introduced, which describes the couplings between the modes and the driving microwave field. For bulk standing spin-wavesC _kk′ is always diagonal. For the true discrete standing modes of a thin filmC _kk′ changes only in case of 1. Suhl instability and if the wavevector has a non vanishing component perpendicular to the film plane. Here the diagonal bulk couplings have to be replaced in part by off diagonal terms, describing couplings between modes, which perpendicular wave vector componentk _⊥ differs byπ/d (d=film thickness). The decisive quantity, which decides if the finite thickness of the film is of importance or if the film can be treated as a bulk system, is the frequency difference δω _k of the coupled modes. For δω _k much smaller than the spin-wave damping η _k the bulk approximation is correct. For \(\delta \omega _k > > \eta _k \) two experimental situations for 1. Suhl instability are discussed: For a perpendicular to the film plane magnetized film the critical microwave field is by π/2 bigger than in the bulk case. In an in-plane magnetized film the critical spin-waves propagate always in the film plane, as only hereC _kk′ remains identical to the bulk case.     

Influence of two-dimensional bragg diffraction on the competition of the waveguide TE<Subscript>0</Subscript> and TM<Subscript>0</Subscript> modes during formation of spontaneous gratings in AgCl-Ag thin films

An intricate space-time instability of patterns of small-angle scattering and diffraction of a laser beam on the structures appearing in AgCl-Ag films under exposure to the same beam is investigated. The instability is related to the formation of spontaneous gratings in the film resulting from the interference of the incident beam with the waveguide modes scattered in the film. The existence of a two-dimensional Bragg diffraction on the TE₀ and TM₀ modes with subsequent formation of secondary spontaneous gratings is revealed and is theoretically substantiated. It is established that the difference in the indicatrices of the radiation scattered into the TE₀ and TM₀ modes for the s-and p-polarizations manifests itself in different kinds of diffraction and small-angle scattering patterns at the output of illuminated samples.     

Millimeter-wave mode conversions at dielectric waveguide steps

The conversion of guided modes (TE₀ and TE₁) at a rectangular step on a dielectric slab waveguide is investigated with mm microwaves. The power of the modes is measured from their interference patterns in the evanescent field outside the waveguide slab. The relative power of two modes changes periodically when the length of the step is varied. In the experiments a change of up to three orders of magnitude was measured. The step is considered as a sequence of three waveguide sections of different thickness. At the discontinuities the modal fields are assumed to illuminate the next section. The calculation based on this model agrees with the experimental results.