共查询到19条相似文献,搜索用时 62 毫秒
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厚膜片式电感器具有创新设计的多层片式结构,用厚膜多层布线技术,对片式电感采用共烧工艺,进行了性能试验,研制了磁体-导体一体化结构(类似独石结构)的片式电感样品。 相似文献
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搭建了涡旋光在多层介质膜中的传输模型,分析了涡旋光垂直入射下膜系内的温升分布。结果表明,膜系内的温升分布与涡旋光入射面密切相关。当涡旋光在初始面入射时,膜系的温升区域集中在入射中心。当涡旋光在空间中传输一定距离后再入射膜系时,膜系温升区域向入射中心的两侧发散,且最大温升大于初始面入射时的温升。当传输距离足够远时,膜系最大温升随传输距离的增加而减小。另外,在一定传输距离内,膜系最大温升随拓扑荷数的增大而增加。传输距离足够远时,最大温升随拓扑荷数的增大而减小。 相似文献
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J. Antoszewski L. Faraone I. Vurgaftman J. R. Meyer C. A. Hoffman 《Journal of Electronic Materials》2004,33(6):673-683
For modern semiconductor heterostructures containing multiple populations of distinct carrier species, conventional Hall and
resistivity data acquired at a single magnetic field provide far less information than measurements as a function of magnetic
field. However, the extraction of reliable and accurate carrier densities and mobilities from the field-dependent data can
present a number of difficult challenges, which were never fully overcome by earlier methods, such as the multicarrier fit,
the mobility-spectrum analysis of Beck and Anderson, and the hybrid mixed-conduction analysis. More recently, to overcome
the limitations of those methods, several research groups have contributed to development of the quantitative mobility-spectrum
analysis (QMSA), which is now available as a commercial product. The algorithm is analogous to a fast Fourier transform in
that it transforms from the magnetic-field (B) domain to the mobility (μ) domain. The QMSA converts the field-dependent Hall
and resistivity data into a visually meaningful transformed output, comprising the conductivity density of electrons and holes
in the mobility domain. In this article, we apply QMSA to both synthetic and real experimental data that are representative
of modern multilayer HgCdTe structures. We discuss such features as the accuracy of the extraction of individual layer conductivities
and average mobilities, reconstruction of the carrier mobility distribution within a particular layer, the resolution of two
carriers with similar mobilities, and limits of the sensitivity. 相似文献
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《Microelectronics Journal》2004,35(1):45-48
Porous silicon (PS) multilayer stacks were developed for their use as interference filters in the visible range. The optical behavior of these structures was previously simulated by the use of a computational program, from which the optical constants and thickness of the individual PS layers were determined. The possibility of using these structures as biosensors has been explored, based on the significant changes in the reflectance spectra before and after exposing the PS multilayer to proteins (antibodies). In particular, it is shown that there is a notably reduction of reflectance from PS structures when this material is exposed to polyclonal mouse antibodies. Thus, the experimental results open the possibility of developing biosensors based on the variation of the shape and/or position of the optical or photoluminescent spectrum from PS. 相似文献
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利用泰勒霍普森相关相干表面轮廓粗糙度仪(Talysurf CCI)分别对基底和采用电子束热蒸发技术沉积的15层二氧,化钛(TiO2)和二氧化硅(SiO2)为膜料的介质高反膜的膜层间的界面粗糙度进行了研究,并对不同工艺下沉积的薄膜界面粗糙度以及不同基底粗糙度上沉积的薄膜的表面粗糙度进行了比较.实验结果表明:TiO2薄膜对基底或下表面粗糙度有较好的平滑作用,随着TiO2和SiO2膜层的交替镀制,膜层间表面粗糙度呈现出低高交替的现象,随着膜层层数的增加,膜层间界面粗糙度低高变化范围减小;采用离子束辅助沉积工艺时,膜层问界面粗糙度低高变化范围较小.总散射损耗的理论计算表明:中心波长处完全非相关模型下的总散射损耗小于完全相关模型下的总散射损耗.实验结果表明:界面粗糙度的相关度约为0.4. 相似文献
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Compression of femtosecond optical pulses with dielectric multilayer interferometers 总被引:3,自引:0,他引:3
The group velocity dispersion of a multilayer thin film Gires-Tournois interferometer used for reflection of ultrashort optical pulses can be continuously tuned from positive to negative values at an extremely low loss in pulse energy. Thus, this device can be applied for compression of femtosecond pulses independent of the sign of the frequency chirp by simple angle tuning of the interferometer. This has been demonstrated with up-chirped 210 fs pulses which have been compressed to an almost transform-limited duration of 115 fs. 相似文献
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提出了一种多层介质悬置微带线天线结构,以改善天线的频扫特性.分析表明:该结构不仅可以确保天线工作在效率较高的天线模工作区,而且它的泄漏常数在相当宽的范围内随频率都能平坦地变化.对频率扫描天线能保证当波束扫描时,可以保持一个相对稳定不畸变的辐射方向图. 相似文献
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During the testing of aspherical mirrors through the null compensation method,structural parameters observe changes which affect the test results of interference pattern.Several errors are induced due to the maladjustment among compensator,interferometer and the mirror under test.It is important for optical manufacturing,testing and the actual alignment process to distinguish between the aberrations arising from both surface errors and maladjustment of the null compensation testing system.The purpose of this paper is to obtain the real aspheric surface errors during the optical polishing process.In this work,we have established an error separation model to the least square method to separate the errors caused by the maladjustment of the testing system from the test results.Finally,the analysis and simulation results show that high precision figure errors can be obtained by separating the maladjustment errors. 相似文献