共查询到20条相似文献,搜索用时 15 毫秒
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《Microelectronics Journal》2015,46(7):581-587
Inductors are used extensively in Radio Frequency Integrated Circuits to design matching networks, load circuits of voltage controlled oscillators, filters, mixers and many other RF circuits. However, on-chip inductors are large and cannot be ported easily from one process to the next. Due to modern CMOS scaling, inductorless RF design is rapidly becoming possible. In this paper a new methodology for designing the RF frontend necessary for the DVB-SH in a 90 nm CMOS technology based on the use current conveyors (CC) is presented. The RF frontend scheme is composed of a second generation CC (CCII) LNA with asymmetric input and output, an asymmetric to differential converter, and a passive differential mixer followed by two CCII transimpedance amplifiers to obtain a high gain conversion. Measurements show a conversion gain of 20.8 dB, a 14.5 dB noise figure, an input return loss (S11) of −14.3 dB and an output compression point of −3.9 dBm. This combination draws 28.4 mW from a ±1.2 V supply. 相似文献
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A synthesis methodology for ECL circuits based on mixed voltage-current representation 总被引:1,自引:0,他引:1
Wu Xunwei 《电子科学学刊(英文版)》1999,16(4):359-366
This paper presents a synthesis methodology for ECL circuits based on a mixed voltage-current signal representation and operation defined on the voltage and current signals. The ideas presented in this paper are then demonstrated on the design of an BCL 1-bit full adder. The paper concludes by presenting an algebraic system which is suitable for current signal representation and operation on currents. 相似文献
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The reduction of test costs, especially in high safety systems, requires that the same test strategy is employed for design validation, manufacturing and maintenance tests, and concurrent error detection. This unification of off-line and on-line tests has already been attempted for digital circuits and it offers the advantage of serving to all phases of a system lifetime.Market pressure originating from the high costs of analog and mixed signal testing has resulted in renewed efforts for the test of analog parts. In this paper, off-line and on-line test techniques for fully differential analog circuits are presented within an unified approach. The high performance of these circuits makes them very popular for many applications, including high safety, low voltage and high speed systems.A test master compliant with IEEE Std. 1149.1 is described. The Analog Unified BIST (AUBIST) is exemplified for linear and non-linear switched-capacitor circuits. High fault coverage is achieved during concurrent/on-line testing. An off-line test ensures the goal of self-checking circuits and allows the diagnosis of faulty parts. The self-test of the AUBIST circuitry is also considered.This work is part of AMATIST ESPRIT-III Basic Research Project, funded by CEC under contract #8820. 相似文献
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Dana Brown John Ferrario Randy Wolf Jing Li Jayendra Bhagat Mustapha Slamani 《Journal of Electronic Testing》2007,23(1):85-94
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test
equipment (ATE) will be used. In this paper, a more universal test structure utilizing RF building blocks is proposed. A global
positioning system (GPS) device is used as an example to illustrate how to develop the RF test plan with this usage. The test
plan developed includes fast, cost-effective and dedicated circuitry.
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Jing LiEmail: |
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6 dBm at 2.2 GHz, and a gain of 18.8 dB and IIP3 of 7.3 dBm at 4.5 GHz. The whole front-end consumes 12 mA current at 1.2 V voltage supply for the LNA and 2.1 mA current at 1.8 V for the mixer, with a die area of 1.2 × 1 mm2. 相似文献
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A dual-band reconfigurable wireless receiver RF front-end is presented, which is based on the directconversion principle and consists of a low noise amplifer (LNA) and a down-converter. By utilizing a compact switchable on-chip symmetrical inductor, the RF front-end could be switched between two operation frequency bands without extra die area cost. This RF front-end has been implemented in the 180 nm CMOS process and the measured results show that the front-end could provide a gain of 25 dB and IIP3 of 6 dBm at 2.2 GHz, and a gain of 18.8 dB and IIP3 of 7.3 dBm at 4.5 GHz. The whole front-end consumes 12 mA current at 1.2 V voltage supply for the LNA and 2.1 mA current at 1.8 V for the mixer, with a die area of 1.2 × 1 mm^2. 相似文献
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The problem of parameter variability in RF and analog circuits is escalating with CMOS scaling. Consequently every RF chip produced in nano-meter CMOS technologies needs to be tested. On-chip Design for Testability (DfT) features, which are meant to reduce test time and cost also suffer from parameter variability. Therefore, RF calibration of all on-chip test structures is mandatory. In this paper, Artificial Neural Networks (ANN) are employed as a multivariate regression technique to architect a RF calibration scheme for DfT chain using DC- instead of RF (GHz) stimuli. The use of DC stimuli relaxes the package design and on-chip routing that results in test cost reduction. A DfT circuit (RF detector, Test-ADC, Test-DAC and multiplexers) designed in 65 nm CMOS is used to demonstrate the proposed calibration scheme. The simulation results show that the cumulative variation in a DfT circuit due to process and mismatch can be estimated and successfully calibrated, i.e. 25% error due to process variation in DfT circuit can be reduced to 2.5% provided the input test stimuli is large in magnitude. This reduction in error makes parametric tests feasible to classify the bad and good dies especially before expensive RF packaging. 相似文献
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This paper presents a novel technique for measuring the electrical characteristics of analogue circuits, based on measuring the temperature at the silicon surface close to the circuit under test. As a detailed example, the paper analyses how the gain of an amplifier can be observed through temperature measurements. Experimental results validate the feasibility of the technique. Simulated results show how this technique can be used to measure the bandwidth and central frequency of a 2.4 GHz low noise amplifier (LNA) designed in a 0.35 μm standard CMOS technology. 相似文献
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Fayrouz Haddad Wenceslas Rahajandraibe Lakhdar Zaïd Oussama Frioui 《International Journal of Electronics》2013,100(3):319-331
The performance of signal-processing algorithms implemented in hardware depends on the efficiency of datapath, memory speed and address computation. Pattern of data access in signal-processing applications is complex and it is desirable to execute the innermost loop of a kernel in a single-clock cycle. This necessitates the generation of typically three addresses per clock: two addresses for data sample/coefficient and one for the storage of processed data. Most of the Reconfigurable Processors, designed for multimedia, focus on mapping the multimedia applications written in a high-level language directly on to the reconfigurable fabric, implying the use of same datapath resources for kernel processing and address generation. This results in inconsistent and non-optimal use of finite datapath resources. Presence of a set of dedicated, efficient Address Generator Units (AGUs) helps in better utilisation of the datapath elements by using them only for kernel operations; and will certainly enhance the performance. This article focuses on the design and application-specific integrated circuit implementation of address generators for complex addressing modes required by multimedia signal-processing kernels. A novel algorithm and hardware for AGU is developed for accessing data and coefficients in a bit-reversed order for fast Fourier transform kernel spanning over log?2 N stages, AGUs for zig-zag-ordered data access for entropy coding after Discrete Cosine Transform (DCT), convolution kernels with stored/streaming data, accessing data for motion estimation using the block-matching technique and other conventional addressing modes. When mapped to hardware, they scale linearly in gate complexity with increase in the size. 相似文献
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In this paper we have investigated a unified and simultaneous fault detection method for mixed-signal integrated circuits. The method is based on the analysis of the power-supply current through the circuit under test. The analysis has been done paying attention to the dynamic behaviour of the power-supply current, in order to avoid measurement problems related to the large amount of quiescent current drop across many analog blocks.The analysis of the dynamic power-supply current entails certain problems related to the complexity of the measurement process, especially those due to the high speed of the current transients. These problems have been addressed by considering a design for test procedure based on the use of built-in dynamic current sensors.The goal of the design for test methodology proposed is to represent the Iddt through the mixed-signal IC under test by a digital signature. The paper presents some advantages of this approach such as a good tolerance to cross-talk noise and the need for only a conventional digital tester on the complete mixed-signal IC for fault detection. The analysis is illustrated with some test results. 相似文献
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An effective logic built-in self-test scheme aiming at reducing the area overhead of IC testing and improving the fault average is proposed, which combines strategies of linear feedback shift register (LFSR)-reseeding with test vectors applied by circuit-under-test itself (TVAC). LFSR-reseeding technology is first applied to decrease the size of test set and the number of interior feedback wires, while TVAC technology is applied to decrease the number of stored seeds. An efficient LFSR-reseeding algorithm and a modified quick judgment method for path search are proposed. Experimental results for ISCAS 85 benchmarks demonstrate that the proposed method reduces the number of interior feedback wires more than 50% on average and can achieve full fault coverage with much less groups as well as area overhead compared with previous TVACs. 相似文献
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A 2.4 GHz,direct-conversion RF transmitter front-end with an up converter and PA driver is fabricated in a 0.13μm CMOS process for the reliable transmission of 54 Mb/s OFDM signals.The front-end output power is -3 dBm while the corresponding EVM is -27 dB which is necessary for the 802.1 1g standard of EVM at-25 dB. With the adopted gain control strategy the output power changes from -14.3 to -3.7 dBm with every step 0.8 dB (20%) which covers the gain variation due to working temperature and process.A power detector indicates the output power and delivers a voltage to the baseband to control the output power. 相似文献
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A wideband large dynamic range and high linearity U-band RF front-end for mobile DTV is introduced,and includes a noise-cancelling low-noise amplifier(LNA),an RF programmable gain amplifier(RFPGA) and a current communicating passive mixer.The noise/distortion cancelling structure and RC post-distortion compensation are employed to improve the linearity of the LNA.An RFPGA with five stages provides large dynamic range and fine gain resolution.A simple resistor voltage network in the passive mixer decreases the gate bias voltage of the mixing transistor,and optimum linearity and symmetrical mixing is obtained at the same time.The RF front-end is implemented in a 0.25 μm CMOS process.Tests show that it achieves an ⅡP3(third-order intercept point) of –17 dBm,a conversion gain of 39 dB,and a noise figure of 5.8 dB.The RFPGA achieves a dynamic range of –36.2 to 23.5 dB with a resolution of 0.32 dB. 相似文献
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