Effect of V doping on phase composition and electrical properties of K0.4Na0.6Nb1−xVxO3 thin films

Lead-free K_0.4Na_0.6Nb_1−xV_xO₃ thin films were prepared by chemical solution deposition method. The effects of V doping on the phase composition and electrical properties of the films were studied at room temperature. The results indicate that the films are composed of orthorhombic and tetragonal phases, and the phase composition is affected by V content. It is also found that the ferroelectric and dielectric properties are improved by V doping (2P_rmax = 35.5 μC/cm, ?_max = 1189). The enhanced electrical properties are attributed to the more T-phase content and better quality of K_0.4Na_0.6Nb_1−xV_xO₃ (x = 0.015) film.     

X-ray diffraction and dielectric studies across morphotropic phase boundary in (1 − x) [Pb(Mg0.5W0.5)O3]-xPbTiO3 ceramics

We present here the results of comprehensive X-ray diffraction and dielectric studies on several compositions of (1 − x)[Pb(Mg_0.5W_0.5)O₃]-xPbTiO₃ (PMW-xPT) solid solution across the morphotropic phase boundary. Rietveld analysis of the powder X-ray diffraction data reveals cubic (space group Fm3m) structure of PMW-xPT ceramics for the compositions with x ≤ 0.42, tetragonal (space group P4mm) structure for the compositions with x ≥ 0.72 and coexistence of the tetragonal and cubic phases for the intermediate compositions (0.46 ≤ x ≤ 0.68). Temperature dependence of the dielectric permittivity above room temperature exhibits diffuse nature of phase transitions for the compositions in the cubic and two phase region while the compositions with tetragonal structure at room temperature exhibit sharp ferroelectric to paraelectric phase transition. The PMW-xPT compositions with coexistence of tetragonal and cubic phases at room temperature exhibit two anomalies in the temperature dependence of the dielectric permittivity above room temperature. Using results of structural and dielectric studies a partial phase diagram of PMW-xPT ceramics is also presented.     

Polymorphic phase transition-induced electrical behavior of BiCoO3-modified (K0.48Na0.52)NbO3 lead-free piezoelectric ceramics

(1 − x)(K_0.48Na_0.52)NbO₃-xBiCoO₃ [KNN-xBC] lead-free piezoelectric ceramics were prepared by the conventional solid-state sintering method. The effects of the BiCoO₃ addition on the phase structure, dielectric, piezoelectric and ferroelectric properties of KNN-xBC ceramics were systematically investigated. The polymorphic phase transition (PPT) from rhombohedral to orthorhombic phase around room temperature was identified in the composition range of 0.01 ≤ x ≤ 0.02, and the improved electrical properties were induced by this PPT. The KNN-0.01BC ceramics near PPT exhibit optimum electrical properties: d₃₃ ∼ 165 pC/N, k_p ∼ 0.40, P_r ∼ 31.0 μC/cm², and E_c ∼ 12.6 kV/cm. These results indicate that the enhanced piezoelectric properties for alkali niobate can be achieved by forming the coexistence of rhombohedral and orthorhombic phases.     

Phase evolution, crystal structure and dielectric behavior of (1 − x)Nd(Zn0.5Ti0.5)O3 + xBi(Zn0.5Ti0.5)O3 compound ceramics

The phase evolution, crystal structure and dielectric properties of (1 − x)Nd(Zn_0.5Ti_0.5)O₃ + xBi(Zn_0.5Ti_0.5)O₃ compound ceramics (0 ≤ x ≤ 1.0, abbreviated as (1 − x)NZT-xBZT hereafter) were investigated. A pure perovskite phase was formed in the composition range of 0 ≤ x ≤ 0.05. The B-site Zn²⁺/Ti⁴⁺ 1:1 long range ordering (LRO) structure was detected by both XRD and Raman spectra in x ≤ 0.05 samples. However, this LRO structure became gradually degraded with an increase in x. The dielectric behaviors of the compound ceramic at various frequencies were investigated and correlated to its chemical composition and crystal structure. A gradually compensated τ_f value was obtained in (1 − x)NZT-xBZT microwave dielectrics at x = 0.03, which was mainly due to the dilution of dielectric constant in terms of Claussius-Mossotti differential equation.     

Preparation and electrical properties of Bi0.5Na0.5TiO3-BaTiO3-KNbO3 lead-free piezoelectric ceramics

Lead-free (1 − x)Bi_0.47Na_0.47Ba_0.06TiO₃-xKNbO₃ (BNBT-xKN, x = 0-0.08) ceramics were prepared by ordinary ceramic sintering technique. The piezoelectric, dielectric and ferroelectric properties of the ceramics are investigated and discussed. The results of X-ray diffraction (XRD) indicate that KNbO₃ (KN) has diffused into Bi_0.47Na_0.47Ba_0.06TiO₃ (BNBT) lattices to form a solid solution with a pure perovskite structure. Moderate additive of KN (x ≤ 0.02) in BNBT-xKN ceramics enhance their piezoelectric and ferroelectric properties. Three dielectric anomaly peaks are observed in BNBT-0.00KN, BNBT-0.01KN and BNBT-0.02KN ceramics. With the increment of KN in BNBT-xKN ceramics, the dielectric anomaly peaks shift to lower temperature. BNBT-0.01KN ceramic exhibits excellent piezoelectric properties and strong ferroelectricity: piezoelectric coefficient, d₃₃ = 195 pC/N; electromechanical coupling factor, k_t = 58.9 and k_p = 29.3%; mechanical quality factor, Q_m = 113; remnant polarization, P_r = 41.8 μC/cm²; coercive field, E_c = 19.5 kV/cm.     

Phase structure and electrical properties of (0.8 − x) BaTiO3-0.2Bi0.5Na0.5TiO3-xBaZrO3 lead-free piezoceramics

Lead-free piezoelectric ceramics (0.8 − x)BaTiO₃-0.2Bi_0.5Na_0.5TiO₃-xBaZrO₃ (BT-BNT-xBZ, 0 ≤ x ≤ 0.08) doped with 0.3 wt% Li₂CO₃ were prepared by conventional solid-state reaction method. With the Li₂CO₃ doping, all the ceramics can be well sintered at 1170-1210 °C. The phase structure, dielectric, ferroelectric and piezoelectric properties of the ceramics were investigated. Results show that a morphotropic phase boundary (MPB) between tetragonal and pseudocubic phases exists at x = 0.03-0.04. The addition of Zr can improve the piezoelectric properties of BT-BNT ceramics. Furthermore, a relaxor behavior is induced and the tetragonal-cubic phase transition shifts towards lower temperatures after the addition of Zr. The ceramics with x = 0.03 possess the optimum electrical properties: d₃₃ = 72 pC/N, k_p = 15.4%, ?_r = 661, P_r = 18.5 μC/cm², E_c = 34.1 kV/cm, T_c = 150 °C.     

Crystal structure and microwave dielectric properties of ZnTi(Nb1−xTax)2O8 ceramics

The crystal structure and microwave dielectric properties of ZnTi(Nb_1−xTa_x)₂O₈ (0 ≤ x ≤ 1) ceramics sintered at 1200 °C for 2 h were investigated. For x < 0.5, solid solution phases with the α-PbO₂ structure, typical of ZnTiNb₂O₈, were obtained, whereas for 0.5 ≤ x < 1, mixtures of two solid solutions each respectively based on the α-PbO₂ structure and a trirutile structure, were obtained. The relative amount of the trirutile-structured phases increased as the Ta content increased in a given region, and the end member ZnTiTa₂O₈ formed a single phase with the trirutile structure. The microwave dielectric properties were closely related to the crystal structures. A material with a near zero temperature coefficient of resonant frequency could be obtained for x = 0.8, and its dielectric constant and quality factor (Q × f) were 40.5 and 41,000 GHz, respectively.     

Charge compensation, electrical and dielectric behavior of lanthanum doped CaCu3Ti4O12

Mechanism of charge compensation on lanthanum, (La³⁺) substitution on Ca site in calcium copper titanate (CaCu₃Ti₄O₁₂), and its effect on resulting electrical and dielectric properties has been studied in the present investigation. For this purpose samples were prepared according to two stoichiometries viz. La_xCa_(1−3x/2)Cu₃Ti₄O₁₂ (x ≤ 0.09) and La_xCa_(1−x)Cu₃Ti₄O₁₂ (x = 0.03) by solid state ceramic route. The former represents ionic compensation while the later is in accordance with electronic compensation. Nature of charge carriers is identified by measuring Seebeck coefficient which is found to be negative in the entire range of measurement. In order to understand the mechanism of conduction, ac conductivity is measured as a function of temperature and frequency. Space charge polarization is the dominant polarization mechanism phenomenon at low frequency and high temperature while orientation polarization dominates at low temperature and high frequency. Impedance analysis confirms the formation of internal barrier layers which is responsible for high dielectric constant in these samples.     

Improving the piezoelectric thermal stability by tailoring phase transition behavior in the new (1 − x)[0.65PbMg1/3Nb2/3O3-0.35PbTiO3]-xBiZn1/2Ti1/2O3 perovskite solid solutions

The phase transition behavior and its effect on thermal stability of the piezoelectric properties of the (1 − x)[0.65PbMg_1/3Nb_2/3O₃-0.35PbTiO₃]-xBiZn_1/2Ti_1/2O₃ ceramics with 0 ≤ x ≤ 0.06 were investigated. The phase transition from the monoclinic to tetragonal phase was determined by the dielectric constant and elastic constant measurements. The temperature independent piezoelectric response with −d₃₁ = 188 pC/N was obtained from 175 to 337 K for the composition with x = 0.02. The enhanced thermal stability of piezoelectric response was achieved by shifting the monoclinic-tetragonal phase transition to the lower temperature.     

Effect of lanthanum doping on linear and nonlinear-optical properties of Bi3TiNbO9 thin films

Lanthanum doped Bi₃TiNbO₉ thin films (LBTN-x, La³⁺ contents x = 5%, 15%, 25% and 35 mol.%) with layered perovskite structure were fabricated on fused silica by pulsed laser deposition method. Their linear and nonlinear optical properties were studied by transmittance measurement and Z-Scan method. All films exhibit good transmittance (>55%) in visible region. For lanthanum doping content are x = 5%, 15% and 25 mol.%, the nonlinear absorption coefficient of LBTN-x thin films increases with the La³⁺ content, then it drops down at x = 35 mol.% when the content of La³⁺ in (Bi₂O₂)²⁺ layers is high enough to aggravate the orthorhombic distortion of the octahedra. We found that, 25 mol.% is the optimal La³⁺ content for LBTN-x thin films to have the largest nonlinear absorption coefficient making the LBTN-x film a promising candidate for absorbing-type optical device applications.     

Effect of Ag-doping on crystal structure and high temperature thermoelectric properties of c-axis oriented Ca3Co4O9 thin films by pulsed laser deposition

Ag-doped Ca₃Co₄O₉ thin films with nominal composition of Ca_3−xAg_xCo₄O₉ (x = 0∼0.4) have been prepared on sapphire (0 0 0 1) substrates by pulsed laser deposition (PLD). Structural characterizations and surface chemical states analysis have shown that Ag substitution for Ca in the thin films can be achieved with doping amount of x ≤ 0.15; while x > 0.15, excessive Ag was found as isolated and metallic species, resulting in composite structure. Based on the perfect c-axis orientation of the thin films, Ag-doping has been found to facilitate a remarkable decrease in the in-plane electrical resistivity. However, if doped beyond the substitution limit, excessive Ag was observed to severely reduce the Seebeck coefficient. Through carrier concentration adjustment by Ag-substitution, power factor of the Ag-Ca₃Co₄O₉ thin films could reach 0.73 mW m⁻¹ K⁻² at around 700 K, which was about 16% higher than that of the pure Ca₃Co₄O₉ thin film.     

Piezoelectric and dielectric properties of Dy2O3-doped (Bi0.5Na0.5)0.94Ba0.06TiO3 lead-free ceramics

(Bi_0.5Na_0.5)_0.94Ba_0.06TiO₃ + x wt% Dy₂O₃ with x = 0-0.3 ceramics were synthesized by conventional solid-state processes. The effects of Dy₂O₃ on the microstructure, the piezoelectric and dielectric properties were investigated. X-ray diffraction pattern confirmed that the coexistence of tetragonal and rhombohedral phases in the (Bi_0.5Na_0.5)_0.94Ba_0.06TiO₃ composition was not changed by adding 0.05-0.3 wt% Dy₂O₃. SEM images indicate that all the ceramics have pore-free microstructures with high density, and that doping of Dy₂O₃ inhibits the grain growth of the ceramics. The addition of Dy₂O₃ shows the double effects on decreasing the piezoelectric and dielectric properties for 0 < x < 0.15 when Dy³⁺ ions substitute B-site Ti⁴⁺ ions, and increasing the properties for 0.15 < x < 0.3 when Dy³⁺ ions enters into A-site of the perovskite structure. The optimum electric properties of piezoelectric constant d₃₃ = 170 pC/N and the dielectric constant ?_r = 1900 (at a frequency of 1 kHz) are obtained at x = 0.3.     

Effects of Mn substitution on ferro- and piezoelectric properties of Bi0.86Sm0.14FeO3 thin films

The Bi_0.86Sm_0.14FeO₃ (BSFO) and Bi_0.86Sm_0.14Fe_1 − xMn_xO₃ (BSFMO) (x = 0.01, 0.03, 0.05) thin films were deposited on indium tin oxide/glass substrates via a metal organic deposition method. 1 at.% Mn doping leads to an evident reduction of the leakage current in BSFO film. More importantly, the Bi_0.86Sm_0.14Fe_0.99Mn_0.01O₃ film exhibits the lowest coercive field (E_c = 272 kV/cm), the largest remanent polarization (P_r = 53.6 μc/cm²) and the remanent out-of-plane piezoelectric coefficient (d₃₃ = 146 pm/V). However, further increase of Mn doping content results in the deterioration of the charge retaining capability and the piezoelectric properties of the films. The negative influence of high Mn doping contents was discussed based on the structure change and the contribution of irreversible movement of non-180° domain walls in the aged films.     

Rhombohedral-monoclinic phase transition related to grain orientation in Zr-rich Pb(ZrxTi1−x)O3 thin films

Pb(Zr_xTi_1−x)O₃ thin films with mixed orientations of (1 1 1) and (1 0 0) were prepared on Pt/Ti/SiO₂/Si substrate by sol-gel technique. The compositions of PZT thin films are chosen as x = 0.55 and x = 0.58. Both of the compositions are in the rhombohedral phase region of the Pb(Zr_xTi_1−x)O₃ phase diagram, but the former is near the monoclinic phase existence region, and the latter is far from the monoclinic phase existence region. Rhombohedral-monoclinic phase transitions are reported in both of the thin films. The results show that the phase transition is related to the grain orientation. Phase transitions in the films are clearly identified: rhombohedral phase transforms to M_B phase in (1 1 1)-oriented grains, and rhombohedral phase transforms to M_A phase in (1 0 0)-oriented grains. The remnant polarization is determined by the content of (1 1 1)-oriented grains. It is shown that the remnant polarization is greater in the film with higher content of (1 1 1)-oriented grains.     

Structural, electrical and mechanical properties of magnetron sputtered NiTi/PZT/TiOx thin film heterostructures

Shape memory alloy (NiTi) thin films coupled to ferroelectric lead zirconate titanate (PZT) produce an intelligent material capable of performing both sensing and actuating functions. In the present study, we report on the in-situ growth of NiTi/PZT/TiO_x heterostructure on Pt/Ti/SiO₂/Si substrates using magnetron sputtering technique. Deposition processing, microstructure, surface morphology, electrical properties and mechanical properties of these heterostructures were systematically investigated. The top NiTi films exhibit austenitic B2 structure with preferred (110) orientation. The varying thickness of NiTi films had a significant influence on properties of NiTi/PZT/TiO_x heterostructure. The bottom TiO_x layer was observed to favor the growth of perovskite PZT films with (100) orientation. Nanoindentation tests of these heterostructures were performed at room temperature. The mechanical hardness of the top NiTi layer of lower thickness was found to be highly influenced by underneath PZT layer. The heterostructure exhibited an interesting martensite to austenite phase transformation and polarization-electric field hysteresis behavior with remanent polarization (P_r) and the coercive field (E_r) of 17.1 μC/cm² and 69.6 kV/cm, respectively. These heterostructures having a layer of SMA material coupled to a ferroelectric material with underneath TiO_x layer are of immense technological importance for MEMS devices.     

Characterization of sol-gel synthesised lead-free (1 − x)Na0.5Bi0.5TiO3-xBaTiO3-based ceramics

The crystal structure, microstructure, dielectric and ferroelectric properties of (1 − x)Na_0.5Bi_0.5TiO₃-xBaTiO₃ ceramics with x = 0, 0.03, 0.05, 0.07 and 0.1 are investigated. A structural variation according to the system composition was investigated by X-ray diffraction (XRD) analyses. The results revealed that the synthesis temperature for pure perovskite phase powder prepared by the present sol-gel process is much lower (800 °C), and a rhombohedral-tetragonal morphotropic phase boundary (MPB) is found for x = 0.07 composition which showing the highest remanent polarization value and the smallest coercive field. The optimum dielectric and piezoelectric properties were found with the 0.93Na_0.5Bi_0.5TiO₃-0.07BaTiO₃ composition. The piezoelectric constant d₃₃ is 120 pC/N and good polarization behaviour was observed with remanent polarization (P_r) of 12.18 pC/cm², coercive field (E_c) of 2.11 kV/mm, and enhanced dielectric properties ?_r > 1500 at room temperature. The 0.93Na_0.5Bi_0.5TiO₃-0.07BaTiO₃-based ceramic is a promising lead-free piezoelectric candidate for applications in different devices.     

Electronic structure and optical property of As2(Te1−xSx)3 and As2(Te1−xSex)3 crystals

Single crystals of S- and Se-incorporated As₂Te₃ have been grown by vertical Bridgman method. The electronic structure and optical property of As₂(Te_1−xS_x)₃ [ATS] and As₂(Te_1−xSe_x)₃ [ATSe] series compounds have been characterized experimentally by thermoreflectance (TR) measurements in a wide energy range of 0.7-6 eV. X-ray diffraction measurements showed that the diffraction peaks of sulfur- and selenium-incorporated As₂(Te_1−xS_x)₃ 0 ≤ x ≤ 0.3 and As₂(Te_1−xSe_x)₃ 0 ≤ x ≤ 0.6 crystals shift to higher diffraction angles with the increase of the sulfur or selenium incorporations. The analysis of X-ray measurement revealed similar crystalline phase for the As₂Te₃ and those of the S- or Se-incorporated As₂Te₃. The experimental TR spectra of As₂(Te_1−xS_x)₃ (0 ≤ x ≤ 1) and As₂(Te_1−xSe_x)₃ (0 ≤ x ≤ 1) exhibit a lot of derivative-like spectral features in the vicinity of band edge as well as in the higher-lying bands. Transition energies and broadening parameters of the TR features at 40 and 300 K were analyzed. Compositional dependences of band gap and interband transition energies of the ATS and ATSe series were evaluated. The origins for the interband transitions in the ATS and ATSe are assigned. Based on the experimental analyses, the electronic structure of the diarsenic trichalcogenides, As₂(Te_1−xSe_x)₃ and As₂(Te_1−xS_x)₃, is hence being realized.     

Structure, dielectric and electric properties of (Ba0.68−xSr0.308Bi0.006Na0.006Mgx)(Ti0.99Sn0.01)O3 ceramics

(Ba_0.68−xSr_0.308Bi_0.006Na_0.006Mg_x)(Ti_0.99Sn_0.01)O₃ ceramics were synthesized by solid-state reaction process. The samples (X ≤ 0.010) are a mixture of cubic (major) and rhombohedral (minor) phases. The rhombohedral phase causes a large dielectric loss in low temperature regions and plays an important role in diffuse phase transition of ceramics. While X > 0.010, the rhombohedral phase decreases and gradually disappears. The dielectric loss of ceramics in the low temperature regions decreases, and the samples change from the diffuse phase transition to the phase transition of second order, and then to of first order. In the temperature range of 270-370 °C, intrinsic conduction dominates conductivity of ceramics.     

Relationships between Zr substitution for Ti and microwave dielectric properties in Mg(ZrxTi1−x)O3 ceramics

The influence of Zr substitution for Ti on the microwave dielectric properties and microstructures of the Mg(Zr_xTi_1−x)O₃(MZ_xT) (0.01 ≤ x ≤ 0.3) ceramics was investigated. The quality factors of Mg(Zr_xTi_1−x)O₃ ceramics with x = 0.01-0.05 were improved because the solid solution of a small amount of Zr⁴⁺ substitution in the B-site could increase density and grain size. An excess of Zr⁴⁺ resulted in the formation of a great deal of secondary phase that declined the microwave dielectric properties of MZ_xT ceramics. The temperature coefficient of resonant frequency (τ_f) of Mg(Zr_xTi_1−x)O₃ ceramics slightly increased with increasing Zr content, and the variation in τ_f was attributed to the formation of secondary phases.