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The 36th annual IEEE International Test Conference convened from 8 to 10 November 2005 in Austin, Texas. The location was a significant move for ITC: It was the first time the conference had met west of the Mississippi, as ITC's general chair Rob Aitken pointed out during his introduction at the plenary session. The conference theme, "Test: Survival of the Fittest," called to mind the test industry's rapidly evolving and increasingly competitive nature, especially of recent years. 相似文献
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《Computer》1980,13(1):101-103
This conference reflects the internationality of the effort to arrive at a genuine engineering discipline of programming–an effort which began at another conference 11 years ago. 相似文献
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