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高压互连线效应是影响集成功率器件性能的重要因素之一。首先提出一个高压互连线效应对SOI横向高压器件的漂移区电势和电场分布影响的二维解析模型,进而得到漂移区在不完全耗尽和完全耗尽情况下的器件击穿电压解析表达式,而后利用所建立的模型,研究器件结构参数对击穿特性的影响规律,定量揭示在高压互连线作用下器件击穿多生在阳极PN结的物理本质,指出通过优化场氧厚度可以弱化高压互连线对器件击穿的负面影响,并给出用于指导设计的理论公式。模型的正确性通过半导体二维器件仿真软件MEDICI进行了验证。 相似文献
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RESURF LDMOS功率器件表面场分布和击穿电压的解析模型 总被引:1,自引:0,他引:1
提出了RESURF LDMOS功率器件的表面电场分布和击穿电压的解析模型.根据二维泊松方程的求解,得到了与器件参数和偏压相关的表面电场和电势分布解析表达式.在此基础上,推出了为获得击穿电压和比导通电阻最好折中的优化条件.该解析结果与半导体器件数值分析工具MEDICI得到的数值分析结果和先前的实验数据基本一致,证明了解析模型的适用性. 相似文献
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RESURF LDMOS功率器件表面场分布和击穿电压的解析模型 总被引:6,自引:4,他引:2
提出了 RESURF L DMOS功率器件的表面电场分布和击穿电压的解析模型 .根据二维泊松方程的求解 ,得到了与器件参数和偏压相关的表面电场和电势分布解析表达式 .在此基础上 ,推出了为获得击穿电压和比导通电阻最好折中的优化条件 .该解析结果与半导体器件数值分析工具 MEDICI得到的数值分析结果和先前的实验数据基本一致 ,证明了解析模型的适用性 相似文献
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本文从表面栅静电感应晶体管(SIT)的基本物理模型出发,求出了沿沟道中心线的电势分布和沟道势垒高度的解析表达式.根据所得表达式具体计算了一个典型器件在不同栅源电压V_(GS)和漏源电压V_(DS)下的电势分布和势垒高度.其结果与1978年J.L.Morenza等人对同一器件用计算机数值分析所得的结果吻合较好. 本文给出了该种器件中势垒存在的物理模型,指出了表面栅与隐埋栅器件在势垒形成上的差别:表面栅器件中势垒的形成与源沟n~+n结有关;而隐埋栅器件势垒的形成与源沟n~+n结无关. 本文所得的解析表达式也表明,表面栅结构中势垒的出现需要沟道夹断一定的深度.这与1980年日本J.Ohmi用计算机数值分析所得结论是一致的. 本文所得的势垒高度的解析表达式可以作为进一步求解该种器件各电参数的解析表达式的基础. 相似文献
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一维PSD的光电性能解析研究 总被引:5,自引:0,他引:5
位置敏感探测器(PSD)是一种基于横向光电效应的光敏器件,本文从描述横向光电效应的Lucovsky方程出发,分析了几种不同情况下一维PSD输出信号的解析解,讨论了一维PSD的响应特性、线性条件及位置公式。 相似文献
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A MEMS piezoresistive magnetic field sensor based on a silicon bridge structure has been simulated and tested.The sensor consists of a silicon sensitivity diaphragm embedded with a piezoresistive Wheatstone bridge,and a ferromagnetic magnet adhered to the sensitivity diaphragm.When the sensor is subjected to an external magnetic field, the magnetic force bends the silicon sensitivity diaphragm,producing stress and resistors change of the Wheatstone bridge and the output voltage of the sensor.Good agreeme... 相似文献
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S. Takeuchi Y. Shimura T. Nishimura B. Vincent G. Eneman T. Clarysse J. Demeulemeester A. Vantomme J. Dekoster M. Caymax R. Loo A. Sakai O. Nakatsuka S. Zaima 《Solid-state electronics》2011,60(1):53-57
A strong piezoresistive effect of GaAs micro-structure which is based on high electron mobility transistor (HEMT) is reported in this paper. The GaAs HEMT is embedded in the root of the cantilever as the sensitive element in order to detect the deformation. The strain is simulated with the ANSYS software, and the maximum gauge factor is about 26,350, which is nearly a hundred times larger than that of piezoresistive silicon. The high gauge factor is not only due to the option of voltage bias, but also the combination of the piezoresistive and piezoelectric effect. The obtained results demonstrate that GaAs micro-structure based on HEMT can be suitable for high sensitive stress/pressure sensors. 相似文献
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This paper describes the design,simulation,processing and test result of a high sensitivity accelerometer based on the piezoresistive effect which uses an overlay bridge detection method.The structure of this accelerometer is supersymmetric "mass-beams".This accelerometer has 8 beams,where two varistors are put in the two ends.Four varistors compose a Wheatstone bridge and the output voltages of the 4 Wheatstone bridges have been superimposed as the final output voltage.The sensitivity of the accelerometer can be improved effectively by these clever methods. A simplified mathematical model has been created to analyze the mechanical properties of the sensor,then the finite element modeling and simulation have been used to verify the feasibility of the accelerometer.The results show that the sensitivity of the accelerometer is 1.1381 m V/g,which is about four times larger than that of the single bridge accelerometers and series bridge sensor.The bandwidth is 0-1000 Hz which is equal to that of the single bridge accelerometers and the series bridge sensor.The comparison reveals that the new overlay detection bridge method can improve the sensitivity of the sensor in the same bandwidth.Meanwhile,this method provides an effective method to improve the sensitivity of piezoresistive sensors. 相似文献
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A monolithic capacitive pressure sensor with pulse-period output 总被引:1,自引:0,他引:1
《Electron Devices, IEEE Transactions on》1980,27(5):927-930
A new microminiature monolithic capacitive pressure transducer (CPT I) is 20 times more sensitive than piezoresistive strain-gauge pressure transducers, requires one percent of the power, and can be batch fabricated through current integrated circuit technology. A second device (CPT II) incorporates bipolar signal-processing electronics on the same silicon chip to produce a low-duty-cycle pulse-mode output with period related to pressure. This output format helps to re-solve the problem of shunting between leads, which is one of the principal causes of long-term drift in piezoresistive transducers designed for implantable medical applications. Because this device uses capacitance change as a transductional mechanism rather than piezo-resistivity, it is not susceptible to drift caused by temperature variations in the piezoresistive coefficient. Optimization for totally implantable biomedical applications places special emphasis on small size, high sensitivity, improved long-term baseline stability, and greatly reduced power consumption. These properties are also important for a wide range of pressure-sensing applications-from automotive to general industrial use. 相似文献
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《Power Electronics, IEEE Transactions on》2008,23(4):1679-1691
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《Industrial Electronics, IEEE Transactions on》2009,56(7):2513-2521
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Okojie R.S. Ned A.A. Kurtz A.D. Carr W.N. 《Electron Devices, IEEE Transactions on》1998,45(4):785-790
Highly doped (~2×1019 cm-3) n- and p-type 6H-SiC strain sensing mesa resistors configured in Wheatstone bridge integrated beam transducers were investigated to characterize the piezoresistive and electrical properties. Longitudinal and transverse gauge factors, temperature dependence of resistance, gauge factor (GF), and bridge output voltage were evaluated. For the n-type net doping level of 2×1019 cm-3 the bridge gauge factor was found to be 15 at room temperature and 8 at 250°C. For this doping level, a TCR of -0.24%/°C and -0.74%/°C at 100°C was obtained for the n- and p-type, respectively. At 250°C, the TCR was -0.14%/°C and -0.34%/°C, respectively. In both types, for the given doping level, impurity scattering is implied to be the dominant scattering mechanism. The results from this investigation further strengthen the viability of 6H-SiC as a piezoresistive pressure sensor for high-temperature applications 相似文献
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Xiong Jijun Wang Jian Zhang Wendong Xue Chenyang Zhang Binzhen Hu Jie 《Microelectronics Journal》2008,39(5):771-776
The current–voltage characteristics of GaAs/InxGa1−xAs/AlAs resonant tunneling diodes (RTDs) are a function of stress, and the current–voltage changes of RTDs with stress are attributed to the piezoresistive effect in RTDs. In order to study the piezoresistive effect in RTDs for application in micromachined mechanical sensors, the beam-mass structure based on RTDs is designed, fabricated and tested by the Wheatstone bridge test circuit. The test results show that the piezoresistive sensitivity of RTDs can be adjusted through the bias voltage, and the maximal piezoresistive sensitivity of RTDs with bias voltage at 0.618 V is 7.61×10−11 Pa−1, which is two orders higher than the minimal piezoresistive sensitivity (2.03×10−13 Pa−1) of RTDs with bias voltage at 0.656 V, and is also higher than the piezoresistive sensitivity of silicon material (5.52×10−11 Pa−1). 相似文献