共查询到20条相似文献,搜索用时 234 毫秒
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由于电火花加工过程的复杂性,单纯通过电火花加工实验方法研究各种放电参数及非电参数对工件表面粗糙度Ra的影响不但耗费大量时间,而且实验成本较高,为此基于支持向量机提出了一种适用于电火花加工表面粗糙度预测的模型。利用遗传算法对该模型中的各参数进行优化,预测不同电火花加工参数组合下的表面粗糙度;以电火花加工8418模具钢为例,将预测值与实验值进行对比,并且通过实验验证了电火花加工8418钢表面粗糙度预测模型参数的准确性;最后进行了误差分析,模型的最大误差值为2.27%。 相似文献
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汽轮机叶片材料1Cr13钢线切割表面粗糙度正交试验研究 总被引:1,自引:0,他引:1
通过电火花线切割加工1Cr13钢正交试验,分析了各电参数对加工表面粗糙度的影响,并且对数据进行了方差和显著性分析,得到了一组最优的粗糙度电参数组合。 相似文献
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电火花机械复合磨削加工聚晶金刚石刀具 总被引:2,自引:0,他引:2
本文对聚晶金刚石刀具的电火花机械复合磨削的过程及特点进行了论述,并通过分析和实验,指出非电参数和电参数对刃磨速度和刃磨质量的影响。 相似文献
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Cr过渡层沉积粘附型CVD金刚石膜的机理研究 总被引:3,自引:1,他引:3
研究了电沉积层作为过渡层沉积CVD金刚石膜的工艺,在硬质合金的Cr电沉积层上用热丝法沉积出CVD金刚石膜。利用SEM分析了电沉积层的形貌,利用EPMA分析了H等离子处理后电沉积层的断面,利用SEM和Raman分析了金刚石膜的表面形貌、成分,利用XRD分析了过渡层和CVD金刚石膜的结合面.利用压痕法研究了金刚石薄膜与基体的结合力。结果表明,H等离子处理使得硬质合全与Cr镀层成为冶金结合,提高了电沉积层的结合强度;在Cr过渡层与金刚石膜之间形成的Cr3C2和Cr7C3等碳化物有利于金刚石的成核和膜基结合强度的提高。 相似文献
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Thin diamond films grown by chemical vapor deposition (CVD) process on Si substrates under similar deposition conditions in the microwave-excited (MW) and direct current (DC) plasma discharges were taken for comparative examination. Raman spectra, photoluminescence (PL) spectroscopy, and color cathodoluminescence scanning electron microscopy (CCL-SEM) have been used for characterization of the structure and composition features of poly-crystalline diamond films. No essential difference in Raman spectra for the CVD diamond films was detected. A significant difference was revealed in the PL spectra and in CCL-SEM images. 相似文献
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FABRICATION OF DIAMOND TUBES IN BIAS-ENHANCED HOT-FILAMENT CHEMICAL VAPOR DEPOSITION SYSTEM 总被引:1,自引:1,他引:0
CHEN Ming MA Yuping XIANG Daohui SUN Fanghong School of Mechanical Engineering Shanghai Jiaotong University Shanghai China 《机械工程学报(英文版)》2007,20(4):24-26
Deposition of diamond thin films on tungsten wire substrate with the gas mixture of ace- tone and hydrogen by using bias-enhanced hot filament chemical vapor deposition(CVD)with the tantalum wires being optimized arranged is investigated.The self-supported diamond tubes are ob- tained by etching away the tungsten substrates.The quality of the diamond film before and after the removal of substrates is observed by scanning electron microscope(SEM)and Raman spectrum.The results show that the cylindrical diamond tubes with good quality and uniform thickness are obtained on tungsten wires by using bias enhanced hot filament CVD.The compressive stress in diamond film formed during the deposition is released after the substrate etches away by mixture of H_2O_2 and NH_4 OH.There is no residual stress in diamond tube after substrate removal. 相似文献
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Yoshiyuki Unoa Akira Okada Yasuhiro Okamoto Kazuo Yamazaki Subhash H. Risbud Yoshiaki Yamada 《Precision Engineering》1999,23(2):126
This article deals with high efficiency and high accuracy fine boring in a monocrystalline silicon ingot by electrical discharge machining (EDM). In manufacturing process of integrated circuits, a plasma-etching process is used for removing oxidation films. This process has recently been examined for use of monocrystalline silicon as the electrode to minimize the contamination. However, it is difficult to machine silicon accurately by the conventional diamond drilling method, because the material removal is due to brittle fracture. The machining force in the EDM process is very small compared with that in conventional machining, therefore, the possibility of high efficiency and high accuracy boring holes in silicon ingot by EDM is experimentally investigated. The removal rate of monocrystalline silicon by EDM is much higher than that of steel, while the electrode wear is extremely small. The improvement method leads to a better hole without chipping at the exit of hole or sticking of the insulator on the wall of hole. Furthermore, it is proved that even a high aspect ratio of about 200 boring is possible. 相似文献
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