Electroless deposition of Sno2 and antimony doped SnO2 films

Thin polycrystalline films of SnO₂ and antimony doped SnO₂ have been prepared by simple economic electroless deposition technique. The transmittance in the visible range and the reflectance in the i.r. range for SnO₂ films are ～80% and ～70%, respectively, with resistivity ～10^?2 Ω cm. On the other hand, antimony doped SnO₂ films have transmittance in the visible range and reflectance in the i.r. range, as good as ～86% and ～83%, respectively, with resistivity as low as ～10^?3Ω cm. By vacuum annealing, the resistivity of both types of films has been brought down as low as ～10^?3 and ～10^?4 Ω cm, respectively.     

Effect of annealing on the physical properties of thermally evaporated In2S3 thin films

The structural, compositional, morphological and optical properties of In₂S₃ thin films, prepared by thermal evaporation technique and annealed in sulfur ambient at different temperatures have been investigated. The grazing incident X-ray diffraction patterns have indicated polycrystalline form and predominantly cubic structure of annealed In₂S₃ films. The scanning electron microscopy revealed textured surface with uniformly distributed grains and the grain size increased with increase of annealing temperature. The optical parameters of the films have been determined using conventional transmission and reflection spectra as well as from surface photovoltage measurements.     

Ultraviolet laser-induced voltages in LaSrAlO4 single crystal

Laser-induced ultrafast photovoltaic effect is observed in LaSrAlO4 single crystal at ambient temperature without any applied bias. An open-circuit photovoltage is obtained when the wafer is irradiated by a 248-nm-KrF laser pulse of 20 ns duration. The response time and full width at half maximum of the photovoltage pulse are 6 ns and 19 ns, respectively, indicating that LaSrAlO4 single crystal has potential application in ultraviolet detector.     

Dynamics of first- and second-order phase transitions in amorphous magnetooptic TbFeCo films

The dynamics of phase transformations in thin amorphous TbFeCo films under the action of ～ 1 ps laser pulses is investigated. The films are heated to the Curie temperature in the amorphous state (T _C1), to the crystallization temperature (T _ac), and to the Curie temperature in the crystalline phase (T _C2). The change in magnetization is detected by Faraday magnetooptic effect during and after the action of the heating pulse. A static external magnetic fieldH～1?12 kOe, whose flux lines are directed perpendicular to the plane of the film, is used in the experiments. Amorphous TbFeCo films possess a perpendicular magnetic anisotropy, which on crystallization becomes reoriented in the plane of the film. It is observed that crystallization and magnetization reorientation occur during the heating pulse (within ～ 1 ps). The spin subsystem is heated to the Curie temperature several picoseconds after the end of the laser pulse. The characteristic spin relaxation time is ～ 10 ps. A model of the dynamics of the electronic, spin, and phonon subsystems that makes it possible to explain the experimental results is proposed on the basis of the data obtained.     

Laser induced photovoltages in B-riched MgB2 thin films

Ultrafast photoelectric effects have been observed in MgB₂ thin films fabricated by chemical vapor deposition on MgO (1 1 1) substrates. The rise time and full width at half-maximum of the photoresponse pulse signals were about 2.4 and 4 ns under the irradiation of a 248 nm laser pulse of 20 ns in duration through the MgO substrate at ambient temperature without any bias. Furthermore, the signal polarity is directly bound up with the laser illumination positions, while no photovoltage was observed when the MgO (1 1 1) single crystal was irradiated. The inner origin mechanism of the present positions-dependent photovoltaic response was discussed.     

Laser-induced voltage characteristics of Bi2Sr2Co2Oy thin films on LaAlO3 substrates

We report the laser-induced voltage (LIV) effects in c-axis oriented Bi₂Sr₂Co₂O_y thin films grown on (0 0 1) LaAlO₃ substrates with the title angle α of 0°, 3°, 5° and 10° by a simple chemical solution deposition method. A large open-circuit voltage with the sensitivity of 300 mV/mJ is observed for the film on 10° tilting LaAlO₃ under a 308 nm irradiation with the pulse duration of 25 ns. When the film surface is irradiated by a 355 nm pulsed laser of 25 ps duration, a fast response with the rise time of 700 ps and the full width at half maximum of 1.5 ns is achieved. In addition, the experimental results reveal that the amplitude of the voltage signal is approximately proportional to sin 2α and the signal polarity is reversed when the film is irradiated from the substrate side rather than the film side, which suggests the LIV effects in Bi₂Sr₂Co₂O_y thin films originate from the anisotropic Seebeck coefficient of this material.     

Transverse laser induced thermoelectric voltage effect in tilted La0.5Sr0.5CoO3 thin films

The transverse laser induced thermoelectric voltage effect has been investigated in tilted La_0.5Sr_0.5CoO₃ thin films grown on vicinal cut LaAlO₃ (1 0 0) substrates when films are irradiated by pulse laser at room temperature. The detected voltage signals are demonstrated to originate from the transverse Seebeck effect as the linear dependence of voltage on tilted angle in the range of small tilted angle. The Seebeck coefficient anisotropy ΔS of 0.03 μV/K at room temperature is calculated and its distorted cubic structure is thought to be responsible for this. Films grown on a series of substrates with different tilted angles show the optimum angle of 19.8° for the maximum voltage. Film thickness dependence of voltage has also been studied.     

Properties of In2S3 thin films deposited onto ITO/glass substrates by chemical bath deposition

In₂S₃ films have been chemically deposited on ITO coated glass substrates by chemical bath deposition, using different deposition times and precursor concentrations. The bilayers are intended for photovoltaic applications. Different characterization methods have been employed: optical properties of the films were investigated from transmittance measurements, structural properties by XRD and micro-Raman, and surface morphology by SEM microscopy analysis. Also, the direct and indirect band-gaps and the surface gap states were studied with surface photovoltage spectroscopy (SPS). We proposed that electronic properties of the In₂S₃ samples are controlled by two features: shallow tail states and a broad band centred at 1.5 eV approximately. Their relation with the structure is discussed, suggesting that their origin is related to defects created on the S sub-lattice, and then both defects are intrinsic to the material.     

La0.88 Te0.12 MnO3/Si异质结的整流和光伏特性研究

采用脉冲激光沉积法制备了La_0.88Te_0.12MnO₃(LTMO)/Si异质结,该异质结具有光生伏特效应和良好的整流特性.光生电压在394 μs的时间内很快增加到最大值然后逐渐减小.在T=80 K时,光生电压的最大值大约是13.7 mV.随着温度的升高,热涨落致使光生电压最大值总体呈现减小趋势,而且是非线性减小,这主要是由LTMO层发生金属绝缘体转变而导致的LTMO层能带结构的变化引起的. 关键词： 异质结 光生伏特效应 电子掺杂     

La2/3Ca1/3MnO3薄膜的光致电阻率变化特性

射频磁控溅射法制备了La_2/3Ca_1/3MnO₃纳米薄膜(LCMO).该薄膜发生FM-PM相变的转变点温度为T_c≈308K（近似为电阻峰值温度T_p）；在不同温度下的光电导性质实验表明所制备的LCMO薄膜在连续激光作用时低温段（Tc）表现为光致电阻率增大效应，即ΔR/R＞0，并在R-T曲线拐点附近取得极大值，（ΔR/R）_max=43.5%；当T>T关键词： 钙钛矿薄膜 光响应 电子自旋 小极化子     

Nanosecond and femtosecond ablation of La0.6Ca0.4CoO3: a comparison between plume dynamics and composition of the films

Thin films of La_0.6Ca_0.4CoO₃ were grown by pulsed laser ablation with nanosecond and femtosecond pulses. The films deposited with femtosecond pulses (248 nm, 500 fs pulse duration) exhibit a higher surface roughness and deficiency in the cobalt content compared to the films deposited with nanosecond pulses (248 nm, 20 ns pulse duration). The origin of these pronounced differences between the films grown by ns and fs ablation has been studied in detail by time-resolved optical emission spectroscopy and imaging. The plumes generated by nanosecond and femtosecond ablation were analyzed in vacuum and in a background pressure of 60 Pa of oxygen. The ns-induced plume in vacuum exhibits a spherical shape, while for femtosecond ablation the plume is more elongated along the expansion direction, but with similar velocities for ns and fs laser ablation. In the case of ablation in the background gas similar velocities of the plume species are observed for fs and ns laser ablation. The different film compositions are therefore not related to different kinetic energies and different distributions of various species in the plasma plume which has been identified as the origin of the deficiency of species for other materials.     

Manganite heterojunction photodetectors for femtosecond pulse laser measurements

We report a sensitive photodetector, based on a manganite junction La_2/3Ca_1/3MnO₃/Si, for femtosecond (fs) pulse laser energy per pulse and average power measurements. The La_2/3Ca_1/3MnO₃/Si photodetector exhibits D^? (normalized detectivity) greater than 5.229×10⁹ cm Hz^1/2 W^?1. The open-circuit photovoltage and short-circuit photocurrent responsivities reach ～268 V/mJ and ～275 A/mJ for single pulse irradiation, respectively, and the open-circuit photovoltage responsivity reaches ～1.7 V/W for average power illumination. The experimental results make the manganite junction a promising fs laser measurement detector and reference standard for calibrating fs lasers.     

Reversal transient laser-induced voltages in La2/3Ca1/3MnO3 films

This paper reports that the transient laser-induced voltages have been observed in La2/3Ca1/3MnO3 thin films on MgO （001） in the absence of an applied current. A peak voltage of - 0.15 V was detected in response to 0.015J pulse of 308 nm laser. It is demonstrated that the signal polarity is reversed when the films are irradiated through the substrate rather than at the air/film interface. Off-diagonal thermoelectricity may support the inversion of the signal when the irradiation direction is reversed.     

Influence of preparation techniques on the structure of amorphous metallic alloy (Mo0.6Ru0.4)82B18

We report X-ray diffraction studies and density measurements on liquid quenched foils and sputter deposited films of the amorphous metallic alloy, (Mo_0.6Ru_0.4)₈₂B₁₈. The crystallization temperature (T_x) for both the films and the foils is ～800 ± 10°C. The density of the as-sputtered films is ～4% less than that of the foils. The annealing of these films at $\text{～}\text{T}{}_{\mathrm{x}}\text{2}$ increases the density to within ～1.7% of the value for the foils. The X-ray diffractionpatterns for both the foils and films are similar and show the amorphous nature of the samples. The reduced radial distribution functions suggest that as-sputtered films have noticably larger second and third nearest neighbor distances, probably due to excess residual stresses and voids in them.     

X-ray spectroscopic diagnostics of ultrashort laser-cluster interaction at the stage of the nonadiabatic scattering of clusters

X-ray spectroscopic diagnostics of laser-cluster interaction at the stage of nonadiabatic scattering of clusters and formation of a spatially uniform plasma channel has been performed. The experimental investigations have been carried out on a Ti:Sa laser setup with a pulse duration of about 65 fs and an energy up to 600 mJ. It has been shown that, within 10 ps from the beginning of a laser femtosecond pulse, the laser-cluster interaction forms a uniform plasma channel with a length of 0.4 to 1 mm with the parameters N _e ～ 10¹⁹?10²⁰ cm^?3 and T _e ～ 100 eV.     

Investigation of the nonlinear absorption and optical limiting properties of two [Q]2[Cu(C3S5)2] compounds

The nonlinear absorption properties of two organometallic compounds, [(C₂H₅)₄N]₂[Cu(C₃S₅)₂] (DCu1) and [(C₄H₉)₄N]₂[Cu(C₃S₅)₂] (DCu2), have been investigated using an open-aperture Z-scan technique at 1064 nm with 40 ps pulse width and at 1053 nm with 18 ns pulse width. The reverse saturable absorption (RSA) which was observed in both samples with nanosecond pulse excitation was much larger than that observed with picosecond pulse excitation. The nonlinear absorption properties were analyzed theoretically by a five-level model. Optical limiting based on RSA was performed and limiting thresholds were evaluated for both samples under three conditions. DCu1 exhibited the better limiting characteristics because of its stronger RSA response.     

Ag/Bi4Ti3O12栅n沟道铁电场效应晶体管制备及存储特性

在溶胶-凝胶工艺获得高质量Bi₄Ti₃O₁₂薄膜的基础上 ，制备了Ag/Bi₄Ti₃O₁₂栅n沟道铁电场效应晶体管. 研 究了Si基Bi₄Ti₃O₁₂薄膜的生长特性及其对铁电薄膜/ 硅的界面状态和铁电场效应晶体管存储特性的影响. 研究表明，在合理的工艺条件下可以获 得具有较高c-轴择优取向的纯钙钛矿相Si基Bi₄Ti₃O₁₂ 铁电薄膜并有利于改善Bi₄Ti₃O₁₂/Si之间的界面特性; 顺时针回滞的C-V特性曲线和C-T曲线表明Ag/Bi₄Ti₃O_{12栅n沟道铁电场效应晶体管具有极化存储效应和一定的极化电荷保持能力; 器件的转移(I< sub>sd}-V_G)特性曲线显示Ag/Bi₄Ti₃O_{12栅n沟道铁电场效应晶体管具有明显的栅极化调制效应. 关键词： 铁电场效应晶体管 4}Ti₃O₁₂')" href="#">Bi₄Ti₃O₁₂ 存储 特性 溶胶-凝胶工艺     

Diode-pumped doubly Q-switched mode-locked YVO4/Nd:YVO4 laser with AO and GaAs saturable absorber

By using both acousto-optic (AO) modulator and GaAs saturable absorber, a diode-pumped doubly Q-switched and mode-locked (QML) YVO₄/Nd:YVO₄ laser is presented. The average output power and the pulse width of the Q-switched envelope have been measured. The Q-switch pulse energy of the doubly QML laser are higher than that only with GaAs. The stability of the QML laser with the dual-loss-modulation is significantly improved if compared to that only with GaAs.The experimental results show that the doubly QML YVO₄/Nd:YVO₄ laser has nearly 80% modulation depth and deeper than that of the singly passively QML pulse. The doubly Q-switched mode-locked pulse inside the Q-switched envelope has a repetition rate of 111 MHz and its pulse width is estimated to be about 700 ps. By using a hyperbolic secant square function and considering the Gaussian distribution of the intracavity photon density, the coupled equations for diode-pumped dual-loss-modulated QML laser is given and the numerical solutions of the equations are in good agreement with the experimental results.     

多晶Si0.9654Mn0.0346:B薄膜的磁性研究

利用磁控溅射和快速热处理的方法制备了Mn,B共掺的多晶硅薄膜(Si_0.9654Mn_0.0346:B).磁性和结构研究发现薄膜有两个铁磁相.低温铁磁相来源于杂相Mn₄Si₇,高温铁磁相(居里温度T_C～250K)是由Mn原子掺杂进入Si晶格导致.晶化后的薄膜利用射频等离子体增强化学气相沉积系统(PECVD)进行短暂(4min)的氢化处理后发现,薄膜的微结构没有发生变化而饱和磁化强度却随着 关键词： 磁性半导体 硅 氢化     

中频磁脉冲处理Fe52Co34Hf7B6Cu1非晶合金的正电子湮没研究

对熔体急冷法制备的非晶合金 Fe₅₂Co₃₄Hf₇B₆Cu₁ 进行了不同频率的中频磁脉冲处理, 用透射电子显微镜、穆斯堡尔谱、正电子湮没寿命谱等方法研究了处 理前后试样的微观结构及结构缺陷变化. 结果表明,经中频磁脉冲处理后,样品发生了部分纳米晶化, 晶化量随磁脉冲频率增加而增加, 当磁脉冲频率为2000 Hz时, 晶化量达33.1%; 在淬态非晶样品中, 正电子在类单空位中的湮没寿命τ₁为150.5 ps, 强度 I₁为77.7%, 在微孔洞中的湮没寿命τ₂为349.7 ps,强度I₂为22.3%; 随磁脉冲频率的增加, τ₁, τ₂值呈现减小的变化趋势, 与淬态非晶相比, I₁有所增加, I₂下降, τ₁, τ₂的平均值τ大幅降低.