| 电子设备电磁辐射敏感度测试相关问题研究 |
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| 引用本文： | 潘晓东, 魏光辉, 万浩江, 等. 电子设备电磁辐射敏感度测试相关问题研究[J]. 强激光与粒子束, 2020, 32: 073002. doi: 10.11884/HPLPB202032.200088 |
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| 作者姓名： | 潘晓东 魏光辉 万浩江 卢新福 赵凯 |
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| 作者单位： | 陆军工程大学石家庄校区 电磁环境效应重点实验室，石家庄 050003 |
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| 基金项目： | 国家自然科学基金项目（61372040）；河北省自然科学基金项目（E2019506032） |
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| 摘 要： | 针对部分电子设备通过国军标所规定的电磁兼容试验考核后，在实际训练、作战使用过程中仍存在电磁不兼容等现实问题，在对现行标准中的技术要求和测试方法进行系统分析的基础上，结合研究团队近几年在电子信息装备电磁环境效应研究方面的技术积累，探讨了测试过程中未寻找受试设备敏感接收方向、带内频点电磁辐射敏感度测试缺失以及多辐射源共同作用导致受试设备敏感度阈值显著降低等几个方面对电子信息装备电磁辐射敏感度测试结果的影响，在此基础上给出了解决上述相关问题的措施和建议，探讨了强场电磁辐射效应试验技术及电子设备复杂电磁环境适应性评估技术的发展趋势。
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| 关 键 词： | 电磁辐射 敏感度 测试技术 电磁兼容 |
| 收稿时间： | 2020-04-09 |
| 修稿时间： | 2020-05-15 |
Research on several test issues of electromagnetic radiation susceptibility for electronic equipment |
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| Pan Xiaodong, Wei Guanghui, Wan Haojiang, et al. Research on several test issues of electromagnetic radiation susceptibility for electronic equipment[J]. High Power Laser and Particle Beams, 2020, 32: 073002. doi: 10.11884/HPLPB202032.200088 |
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| Authors: | Pan Xiaodong Wei Guanghui Wan Haojiang Lu Xinfu Zhao Kai |
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| Affiliation: | National Key Laboratory of Science and Technology on Electromagnetic Environment Effects, Shijiazhuang Campus, Army Engineering University, Shijiazhuang 050003, China |
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| Abstract: | According to the practical problem that some electronic equipments still exist electromagnetic incompatibility phenomenon in training and fighting stage after passing the normal electromagnetic compatibility test required by National Military Standard of China, on the basis of systematically analyzing the technical requirements and test methods in the current military standard, considering the technology accumulation of our research team on the electronic information equipment electromagnetic environment effects in recent years, the influence the several conditions on the electronic information equipment electromagnetic radiation susceptibility test results were discussed. These conditions contain not searching the sensitive receiving direction of the equipment under test(EUT), lacking of electromagnetic radiation susceptibility test in in-band frequency, multi-source radiation causing remarkable reduction of the susceptibility threshold of the EUT and so on. On the basis of the discussion, the measures and suggestions which can solve the above related problems were given. The development tendency of the high intensity electromagnetic radiation effect test technology and the complex electromagnetic environment adaptability evaluation technology for electronic equipment were discussed. |
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| Keywords: | electromagnetic radiation susceptibility test technology electromagnetic compatibility |
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