| Break Cohesion of Metal Contacts due to Voltage Bias |
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| 引用本文： | 李玉现. Break Cohesion of Metal Contacts due to Voltage Bias[J]. 中国物理快报, 2006, 23(9): 2560-2562 |
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| 作者姓名： | 李玉现 |
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| 作者单位： | College of Physics, Hebei Normal University, Shijiazhuang 050016 |
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| 基金项目： | Supported by the Natural Science Foundation of Hebei Province under Grant No A2005000147, and the Natural Science Foundation of Hebei Normal University. |
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| 摘 要： |
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| 关 键 词： | 断裂粘聚力 金属接触 电压偏置 稳定性 |
| 收稿时间： | 2006-05-11 |
| 修稿时间： | 2006-05-11 |
Break Cohesion of Metal Contacts due to Voltage Bias |
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| LI Yu-Xian. Break Cohesion of Metal Contacts due to Voltage Bias[J]. Chinese Physics Letters, 2006, 23(9): 2560-2562 |
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| Authors: | LI Yu-Xian |
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| Affiliation: | College of Physics, Hebei Normal University, Shijiazhuang 050016 |
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| Abstract: | The instability of metal point contacts under voltage bias is calculated based on scattering theory. When the bias is applied, the transport channels will be closed and the chemical bonds will be broken, which modify the cohesive force of the point contact. If the cross section of the contact is narrow enough, an applied bias will break the point contact, which is in agreement with the experimental results. The effect of bias-dependent force can play an important role in the stability of a nanosize device. |
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