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用于测量折射率的光纤迈克尔逊干涉型传感器
引用本文:郑晨,冯文林,何思杰,李邦兴. 用于测量折射率的光纤迈克尔逊干涉型传感器[J]. 红外与激光工程, 2022, 51(5): 20210327-1-20210327-5. DOI: 10.3788/IRLA20210327
作者姓名:郑晨  冯文林  何思杰  李邦兴
作者单位:1.重庆理工大学 理学院,重庆 400054
基金项目:国家自然科学基金(51574054);重庆市教委重大科技项目(KJZD-M20191102);重庆市创新领军人才项目(CSTCCXLJRC201905);重庆市教委科学技术研究项目(KJQN201801133)
摘    要:提出了一种基于单模光纤-四芯光纤-薄芯光纤(SMF-FCF-TCF)迈克尔逊干涉结构的折射率传感器。采用直接熔接的方式将各光纤进行熔接,由于各光纤之间纤芯的直径不匹配,因此在光纤的熔接处会发生光的激发和耦合。薄芯光纤端面涂覆有一层银面反射膜并用紫外固化胶进行保护来增强光在端面的反射率。四芯光纤作为传感结构中的耦合器,激发了更多的光进入薄芯光纤的包层中,提升了传感器的灵敏度。对传感器的折射率和温度传感特性分别进行了实验探究,实验结果表明,在折射率1.3333~1.3794范围内的灵敏度为137.317 nm/RIU,线性度为0.999,并且温度对传感器的影响较小。该传感结构熔接方式简单,在折射率测量领域具有一定的应用前景。

关 键 词:光纤传感   迈克尔逊干涉仪   四芯光纤   薄芯光纤   折射率传感器
收稿时间:2021-12-20

Optical fiber Michelson interference sensor for measuring refractive index
Affiliation:1.College of Science, Chongqing University of Technology, Chongqing 400054, China2.Chongqing Key Laboratory of Green Energy Materials Technology and Systems, Chongqing 400054, China
Abstract:A refractive index sensor based on single-mode fiber (SMF) four-core fiber (FCF) and thin-core fiber (TCF) is proposed, forming a SMF-FCF-TCF Michelson interference structure. The optical fibers are spliced by direct splicing. Because of the mismatch of the diameter of the optical fibers’ cores, light excitation and coupling will be induced at the splicing part. The end face of the TCF is coated with a layer of silver film and protected with ultraviolet curing glue to enhance the reflectivity of the light at the end face. The four-core fiber is used as a coupler in the sensing structure, which excites more light into the cladding of the TCF, improving the sensitivity of the sensor. The refractive index and temperature sensing characteristics of the sensor were investigated experimentally. The experimental results show that the sensitivity in the refractive index range of 1.3333 to 1.3794 is 137.317 nm/RIU, the linearity is 0.999, and the temperature has little effect on the sensor. The sensing structure has a simple welding method and has certain application prospects in the field of refractive index measurement.
Keywords:
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