直接数字式频率合成器单粒子效应实验研究 |
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引用本文: | 王园明,阮林波,罗尹虹,郭红霞,王忠明,姚志斌,张凤祁,王燕萍.直接数字式频率合成器单粒子效应实验研究[J].强激光与粒子束,2016,28(10):106005. |
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作者姓名: | 王园明 阮林波 罗尹虹 郭红霞 王忠明 姚志斌 张凤祁 王燕萍 |
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作者单位: | 1.西北核技术研究所, 西安 71 0024; |
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摘 要: | 在直接数字式频率合成器(DDS)单粒子效应失效现象的基础上,研制了具备寄存器读写、功耗电流测试和输出效应波形捕获功能的DDS辐射效应在线测试系统,开展了DDS单粒子效应实验研究。结果表明,单粒子效应会导致DDS输出波形扰动,波形功能中断,功耗电流陡然增大。分析认为:DDS内部PLL模块发生单粒子瞬态和单粒子翻转,是引发波形扰动的主要原因;内置DAC的主要功能寄存器翻转引发了输出波形功能中断;电流增大是单粒子闭锁引起的。本项研究为国产DDS器件的加固和考核提供了一定的参考。
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关 键 词: | 直接数字式频率合成器 单粒子效应 波形扰动 功能中断 |
收稿时间: | 2015-11-19 |
Experiment study of DDS for single event effect |
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Affiliation: | 1.Northwest Institute of Nuclear Technology,Xi’an 710024,China;2.State Key Laboratory of Intense Pulsed Radiation Simulation and Effect,Xi’an 710024,China |
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Abstract: | Based on the analysis of the structure and function of Direct Digital Frequency Synthesizer(DDS), an online measurement system for DDS is developed, which can test functional registers, capture output waveform and power supply current. Verification experiment has been carried out. The results show that the single event effect may cause waveform disturbances, functional interruption of the output waveform, and sudden increase of power current. We consider that the occurrences of single event transient in internal PLL of DDS and upset of functional registers are the leading causes of waveform disturbance. The DAC main function registers upset triggers the output waveform functional interruption, single event latchup causes current increase. This study provides a reference for consolidation and evaluation of domestic DDS devices. |
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