| 处理器电路的隔离测试方法研究 |
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| 引用本文： | 路锋,冯辅周,闫存金. 处理器电路的隔离测试方法研究[J]. 计算机工程与应用, 2011, 47(32): 78-81. DOI: 10.3778/j.issn.1002-8331.2011.32.024 |
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| 作者姓名： | 路锋 冯辅周 闫存金 |
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| 作者单位： | 1.装甲兵工程学院 机械工程系，北京 1000722.装甲兵工程学院 装甲兵装备技术研究所，北京 100072 |
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| 摘 要： | 含处理器（CPU）电路的测试和故障诊断一直是测试领域的一个难点。在研究过程中，提出并设计了一种电气隔离测试方法。该方法通过对CPU电路基本属性分析，采用对CPU复位脚进行操作使其一直处于某种特定状态，并设计一套外围电路对其进行数据收发，从而实现将CPU从电路中“隔离”出来进行测试。实验结果表明，该方法具有其独特的优势。
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| 关 键 词： | 自动测试 故障诊断 隔离测试 复杂电路 |
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Research on processor circuit testing method of isolation |
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| LU Feng,FENG Fuzhou,YAN Cunjin. Research on processor circuit testing method of isolation[J]. Computer Engineering and Applications, 2011, 47(32): 78-81. DOI: 10.3778/j.issn.1002-8331.2011.32.024 |
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| Authors: | LU Feng FENG Fuzhou YAN Cunjin |
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| Affiliation: | 1.Department of Mechanical Engineering，Academy of Armored Force Engineering，Beijing 100072，China2.Armored Force Equipment Technology Institute，Academy of Armored Force Engineering，Beijing 100072，China |
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| Abstract: | Processor circuit testing and malfunction diagnosis is one of the difficulties in the field of automatic test and malfunction diagnosis.In the study,it proposes and designs a method of isolating test.In this method,it analyzes the basic circuit properties of the processor and uses the reset pin of the CPU to operate the CPU in a particular state,and then designs its peripheral circuit to transceiver data,makes the CPU isolation out of the circuit for testing.This method has its unique advantages. |
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| Keywords: | automatic test malfunction diagnosis isolation test complex circuit
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