单边合格品链长中位数控制图设计

doi:10.12005/orms.2019.0060

运筹与管理 ›› 2019, Vol. 28 ›› Issue (3): 87-94.DOI: 10.12005/orms.2019.0060

单边合格品链长中位数控制图设计

胡雪龙¹, 周晓剑¹, 黄卫东¹, 吴姝²

1.南京邮电大学管理学院,江苏南京 210023;
2.武汉理工大学物流工程学院,湖北武汉 430063

收稿日期:2017-06-12 出版日期:2019-03-25
通讯作者: 吴姝(1986-),女,湖北武汉人,讲师,博士,主要研究方向:质量管理、统计过程控制。
作者简介:胡雪龙(1988-),男,江苏宿迁人,讲师,博士,研究方向:统计过程控制;周晓剑(1979-),男,江西吉安人,副教授,硕士生导师,博士,主要研究方向:智能质量控制;黄卫东(1968-),男,江苏连云港人,教授,博士,主要研究方向:网络舆情管理
基金资助:
教育部人文社会科学研究青年基金资助项目(17YJC630043);江苏省自然科学基金资助项目(BK20170894);南京邮电大学人文社科基金资助项目(NYY217007,NY218041);国家自然科学基金资助项目(71802110,71872088,11701437,71671093);江苏省社科基金资助项目(17GLB016)

Design of a Sided-sensitive Conforming Run Length Median Chart

HU Xue-long¹, ZHOU Xiao-jian¹, HUANG Wei-dong¹, WU Shu²

1.School of Management, Nanjing University of Posts and Telecommunications, Nanjing 210023, China;
2.School of Logistics Engineering, Wuhan University of Technology, Wuhan 430063, China

Received:2017-06-12 Online:2019-03-25

摘要/Abstract

摘要： 针对过程数据存在异常值的问题,为了监控过程均值的偏移,采用中位数统计量(X)代替传统均值(X)统计量,提出了一种单边合格品链长X(Sided Sensitive Conforming Run Length X, SCRL & X)控制图。采用马尔科夫链方法研究了SCRL & X控制图的性能,首先推导出其一步状态转移矩阵,进一步根据马尔科夫链的性质得到其平均链长(Average Run Length, ARL)。为了获得控制图的最优设计参数和性能指标值,保证其处于过程受控状态下的性能,并使其处于过程失控状态下的平均链长最小。研究结果表明,提出的SCRL & X控制图的统计性能优于传统的双边合格品链长X(Conforming Run Length, CRL & X)控制图,尤其针对过程均值产生较小偏移的情形,其优势较为明显。

关键词: X控制图, 单边合格品链长X控制图, 平均链长

Abstract: Considering the outliers in the process samples, the median(X)is used instead of the mean(X)and a side-sensitive conforming run length X(SCRL & X)chart is proposed to monitor the process mean. A Markov chain method is used to study the properties of the chart. The transition probability matrix of SCRL & X chart is first derived and the corresponding average run length(ARL)is obtained according to the properties of the Markov chain method. In order to obtain the optimal parameters and properties of the SCRL & X chart, the out-of-control ARL is minimized under the constraint of the in-control ARL. The simulation results showed that the SCRL & X chart performs better than the conforming run length(CRL)X chart, especially for smaller mean shifts.

Key words: X chart, sided sensitive conforming run length Xchart, average run length

中图分类号:

TB114.2

引用本文

胡雪龙, 周晓剑, 黄卫东, 吴姝. 单边合格品链长中位数控制图设计[J]. 运筹与管理, 2019, 28(3): 87-94.

HU Xue-long, ZHOU Xiao-jian, HUANG Wei-dong, WU Shu. Design of a Sided-sensitive Conforming Run Length Median Chart[J]. Operations Research and Management Science, 2019, 28(3): 87-94.

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Design of a Sided-sensitive Conforming Run Length Median Chart

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[1]	薛丽. 具有可变样本容量的非正态EWMA控制图[J]. 运筹与管理, 2016, 25(6): 224-229.
[2]	薛丽. 可变抽样区间几何EWMA控制图的经济设计[J]. 运筹与管理, 2013, 22(4): 126-132.