一种基于CCD的物位测量方法

提出了一种基于CCD（Charge Coupled Device电荷耦荷器件）的物位测量方法。讨论了其测量原理，指出了常用的CCD物位测量模型的不足，并给出了改进模型及其标定方法，从而降低了对安装条件的要求，提高了测量精度。对实际使用中的两个重要问题：抗干扰问题及时实时性问题，也提出了解决方案。最后给出了应用实例及实测数据。结果表明，本文提出的CCD物位测量方法能满足一般物位测量的要求，并可应用于较复杂的测量条件下。

A CCD-based Method of Level Measuerment

In this paper,a new approach for level measurement based on CCD(Charge Coupled Device) is presented. The principle of CCD based method of level measurement is discussed,and the deficiencies of general measurement models are pointed out. Then an improved measurement model and its calibration method are established,which can decrease the limiting of fixing of CCD system and increase the precision of measurement. In view of two significant problems in applications about this method:anti jamming and real time,some solving techniques are described. In addition,an example and its measurement data are given out. The results show that the CCD based method of level measurement can be used not only in generic situations, but also in complicated situations such as high temperature,high pressure,causticity,the object to be measured is transparent colloid and their combination etc.