首页 | 官方网站   微博 | 高级检索  
     

基于相移和颜色分光的电子散斑干涉瞬态三维变形测量方法
引用本文:孙流星,于瀛洁.基于相移和颜色分光的电子散斑干涉瞬态三维变形测量方法[J].光学仪器,2016,38(1):20-26.
作者姓名:孙流星  于瀛洁
作者单位:1. 上海大学精密机械工程系,上海200072;上海仪电物理光学仪器有限公司,上海201199;2. 上海大学精密机械工程系,上海,200072
摘    要:提出了一种基于相移和颜色分光的电子散斑干涉(ESPI)瞬态三维变形测量方法,该方法包括一个彩色CCD和红绿蓝三种不同波长的激光器,可同时采集来自三路的散斑干涉图像。物体面内水平方向、竖直方向以及离面方向的散斑干涉图像信息通过颜色分光实现分离,并利用相移算法对散斑干涉条纹图进行分析处理,分别解调出水平、竖直及离面方向的变形场相位,实现三维变形场的测量。模拟及实验分析表明,此方法能同时实现物体面内水平方向、竖直方向以及离面方向的变形测量,可用于物体表面的三维瞬态变形测量,也可单独完成面内或离面的二维变形测量。

关 键 词:电子散斑干涉  颜色分光  相移算法  三维变形测量
收稿时间:2015/5/11 0:00:00

Transient 3D deformation measurement method by color splitting based on phase shift and ESPI
SUN Liuxing and YU Yingjie.Transient 3D deformation measurement method by color splitting based on phase shift and ESPI[J].Optical Instruments,2016,38(1):20-26.
Authors:SUN Liuxing and YU Yingjie
Affiliation:Department of Precision Mechanical Engineering, Shanghai University, Shanghai 200072, China;Shanghai INESA Physico-Optical Instrument.Co., Ltd., Shanghai 201199, China and Department of Precision Mechanical Engineering, Shanghai University, Shanghai 200072, China
Abstract:A transient method of three-dimensional deformation measurement by color splitting based on phase shift and electronic speckle pattern interferometry(ESPI) is presented. The method takes red, green and blue wavelength lasers as the light sources. A color CCD is used to capture the speckle interference images from three paths. The color light is used to achieve the separation of the speckle interference image information from the in-plane vertical direction, in-plane horizontal direction and out-of-plane direction of the object. The phase shifting algorithm is applied to process the speckle interference fringe pattern to demodulate the deformation phase field in all directions separately and to obtain three-dimensional deformation field. Computer simulation and experimental results are presented that the system can achieve the deformation measurements of an object's vertical, horizontal and out-of-plane directions simultaneously, so that it is applied to measure transient three-dimensional deformation of the object's surface and to realize independent measurements of the in-plane and out-of-plane two-dimensional deformations.
Keywords:electronic speckle pattern interferometry(ESPI)  color splitting  phase shifting algorithm  three-dimensional deformation measurement
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《光学仪器》浏览原始摘要信息
点击此处可从《光学仪器》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号