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利用线阵CCD对物体尺寸测量的研究
引用本文:倪小芳,吴平辉.利用线阵CCD对物体尺寸测量的研究[J].光学仪器,2011,33(6):11-13.
作者姓名:倪小芳  吴平辉
作者单位:湖州师范学院理学院,浙江湖州,313000
摘    要:介绍了一种对物体尺寸精密测量的方法.该方法采用线阵CCD作为光电传感器件,通过对CCD输出信号进行二值化处理并从计算机获得数字式信号,从而实现对物体尺寸的精确检测.测量结果表明:与其他传统的检测方法相比,该方法具有测量精度高、速度快,操作简单,检测过程中运行稳定等优点,在工业生产的尺寸测量中有实用价值.

关 键 词:线阵CCD  尺寸测量  二值化

Study on target dimension measurement using linear CCD
NI Xiaofang and WU Pinghui.Study on target dimension measurement using linear CCD[J].Optical Instruments,2011,33(6):11-13.
Authors:NI Xiaofang and WU Pinghui
Affiliation:(School of Physics,Huzhou Teachers College,Huzhou 313000,China)
Abstract:A method of the target dimension measurement exactly is introduced.Using a linear CCD as photoelectric sensor,CCD output signal through binarized processing from computer, the device can achieve measurement of dimension precisely.The experimental results show that,compared with other methods,the method presented here has such advantages as high precision,high speed,simple and reliable operation.It may be applied to dimension measurement in industrial production.
Keywords:linear CCD  dimension measurement  binarization
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