| 用面阵CCD测量不规则平面物体的面积 |
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| 引用本文： | 张全法,韩要轩,杨海彬,何金田.用面阵CCD测量不规则平面物体的面积[J].仪表技术与传感器,2000(2):36-39. |
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| 作者姓名： | 张全法 韩要轩 杨海彬 何金田 |
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| 作者单位： | 郑州大学物理工程学院,郑州市,450052 |
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| 摘 要： | 文中介绍了利用面阵CCD测量不规则平面物体面积的原理和方法。对影响测量精度的各种因素进行了分析，比较了利用面阵CCD进行测量和利用线阵CCD进行测量的不同。通过实际测量，证明本方法具有测量速度快，测量精度高，适应性强等特点，具有广泛的应用前景。
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| 关 键 词： | 面积测量 面阵CCD 阈值 不规则平面物体 |
| 修稿时间： | 1999-06-14 |
Area Meaurement of Irreglar Plane Object Using Area Array CCD |
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| Zhang Quanfa,Han Yaoxuan,Yang Haibin,He Jintian.Area Meaurement of Irreglar Plane Object Using Area Array CCD[J].Instrument Technique and Sensor,2000(2):36-39. |
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| Authors: | Zhang Quanfa Han Yaoxuan Yang Haibin He Jintian |
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| Affiliation: | Zhang Quanfa
,Hah Yaoxuan
,Yang Haibin
,He Jintian
(School of Physical Engineering, Zhengzhou University, Zhengzhou 450052) |
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| Abstract: | A simple method for area measurement of irregular plane object using area array CCD was presented. The factors affecting on the accuracy were analyzed, and the difference between using areaarray CCD and linear CCD was discussed. By experiment, it was proved that using this method, the measurement could be done quickly and accurately. With high adaptablility it might find applications in a wide domain. |
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| Keywords: | Area Measurment Area Array CCD Threshold Gray Histogram |
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