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Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation |
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| Authors: | R COQ GERMANICUS D MERCIER F AGREBI M FÈBVRE D MARIOLLE Ph DESCAMPS Ph LECLÈRE |
| Affiliation: | 1. Normandie Univ, UNICAEN, ENSICAEN, IUT, CNRS, CRISMAT, Caen, 14000 France;2. CRM Group, Liège, Belgium;3. Bruker, Nano Surfaces, Palaiseau, France;4. CEA, LETI, UNIV, Grenoble Alpes, Grenoble, France;5. UNIROUEN, ESIGELEC, IRSEEM, Normandie UNIV, Rouen, France;6. CIRMAP, Service de Chimie des Matériaux Nouveaux, Université de Mons (UMONS), Mons, Belgium |
| Abstract: | |
| Keywords: | Atomic Force Microscopy (AFM) hardness nanoindentation peak force quantitative nanomechanical mapping (PF-QNM) silica beads Young's modulus |
