| 精密测头技术的演变与发展趋势 |
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| 引用本文： | 石照耀,韦志会.精密测头技术的演变与发展趋势[J].工具技术,2007,41(2):3-8. |
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| 作者姓名： | 石照耀 韦志会 |
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| 作者单位： | 北京工业大学,100022,北京市 |
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| 摘 要： | 本文从历史发展角度考察了精密测头技术的发展,分析了触发式测头、扫描式测头和非接触式光学测头的特点和应用范围,给出了最新测头案例,并对市场上存在的几种测头进行了性能比较,最后论述了精密测头技术的发展趋势。高精度、高效率、高集成化、多功能、数字化以及发展非接触测头是今后精密测头的发展方向。
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| 关 键 词： | 测头 精密测量 精密量仪 三坐标测量机 |
| 修稿时间： | 2006-10 |
Evolution and Some Trends in Precision Probe Technology |
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| Shi Zhaoyao,Wei Zhihui.Evolution and Some Trends in Precision Probe Technology[J].Tool Engineering(The Magazine for Cutting & Measuring Engineering),2007,41(2):3-8. |
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| Authors: | Shi Zhaoyao Wei Zhihui |
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| Affiliation: | Shi Zhaoyao Wei Zhihui |
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| Abstract: | This paper presents the development of precision probe technology in the past and analyzes the characteristic and application range of touch-trigger, scanning and non-contact optical probes. After introducing some new probe styles, the performance of three kinds of probes existing in market are compared and the development of precision probe technology is discussed. High precision, high efficiency, high integration, multi-function, digitalization and developing non-contact probe are development trends of precision probe. |
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| Keywords: | Probe Precision measurement Precision measurement immanent CMM |
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