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Boom Box爆炸机IC32失效原因探析
引用本文:李群河,朱永刚,卢世杰.Boom Box爆炸机IC32失效原因探析[J].物探装备,2012,22(1):50-52.
作者姓名:李群河  朱永刚  卢世杰
作者单位:华北石油局地球物理勘探公司,河南新乡,453700
摘    要:Boom Box爆炸机IC32的失效率明显高于其它器件。本文从IC32在印刷电路板的位置特征着手,对IC32的失效模式、失效机理、爆炸工的操作程序等多个方面进行了分析,找出了其失效的根本原因,并提出了纠正措施,以防止失效的再发生。

关 键 词:Boom  Box爆炸机  失效率  IC32

Troubleshooting for IC32 failure of Boom Box Blaster
Li Qunhe,Zhu Yonggang and Lu Shijie.Troubleshooting for IC32 failure of Boom Box Blaster[J].Equipment for Geophysical Prospecting,2012,22(1):50-52.
Authors:Li Qunhe  Zhu Yonggang and Lu Shijie
Affiliation:Li Qunhe,Zhu Yonggang and Lu Shijie
Abstract:IC32 failure rate was significantly higher than other parts in Boom Box Blaster.After analysis from the location characteristics of IC32 in the printed circuit board,the failure modes,failure mechanisms,the operation procedure and such other aspects,this paper found out the root cause of IC32 failure and proposed effective measures to prevent.
Keywords:Boom Box Blaster  failure rate  IC32
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