| 聚乙烯膜对样品残余应力测试的影响 |
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| 引用本文： | 董平,陈勇忠,柏朝茂.聚乙烯膜对样品残余应力测试的影响[J].原子能科学技术,2001,35(2):187-192. |
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| 作者姓名： | 董平 陈勇忠 柏朝茂 |
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| 作者单位： | 中国工程物理研究院，四川 绵阳 621900 |
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| 基金项目： | 中国工程物理研究院科学技术基金资助项目（990338） |
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| 摘 要： | 采用X2001应力分析仪测试了α-Fe和铍样品表面分别覆盖聚乙烯膜前后的残余应力，探讨了残余应力测试值变化的原因及其规律。样品表面覆盖聚乙烯膜后，由于校准距离D的增大，使得衍射峰向低角度方向偏移，从而引起应力实测值发生了改变。通过对应力实测值进行修正，可获得样品内的真实应力。
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| 关 键 词： | X射线应力分析 残余应力 聚乙烯膜 |
| 文章编号： | 1000-6391（2001）02-0187-06 |
| 修稿时间： | 1999年11月17 |
Residual Stress
Measurement of the Specimen With the Mylar Film by X-ray Diffraction |
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| DONG Ping,CHEN Yong zhong,BAI Chao mao.Residual Stress
Measurement of the Specimen With the Mylar Film by X-ray Diffraction[J].Atomic Energy Science and Technology,2001,35(2):187-192. |
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| Authors: | DONG Ping CHEN Yong zhong BAI Chao mao |
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| Abstract: | The residual stresses of α-Fe and beryllium specimen surface withand without the Mylar film are measured by X2001 stress analyzer. The reason and the regulation of the measured residual stress change are discussed. The results show that the increasement of the calibration distance D for the specimen surface with the Mylar film shiftes the diffraction peak to the lower angle, thus changing the measured value of residual stress. The real residual stress of specimen can be obtained by correcting the measured value of residual stress. |
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| Keywords: | X ray stress analysis residual stress Mylar film |
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