| 锥束微焦点CT系统对比度灵敏度测量研究 |
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| 引用本文： | 付国涛,曹大泉,赵维,唐晓,孙翠丽,魏存峰,王燕芳,阙介民,舒航,马创新,魏龙,郁忠强.锥束微焦点CT系统对比度灵敏度测量研究[J].原子能科学技术,2012,46(10):1270-1273. |
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| 作者姓名： | 付国涛 曹大泉 赵维 唐晓 孙翠丽 魏存峰 王燕芳 阙介民 舒航 马创新 魏龙 郁忠强 |
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| 作者单位： | 1.中国科学院 核分析技术重点实验室，北京100049；2.中国科学院高能物理研究所，北京100049；3.中国科学院 研究生院，北京100049 |
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| 基金项目： | 高分辨率板状构件三维显微层析成像关键技术研究项目资助(1110905063);工业CT图像硬化伪影校正方法项目资助(H95463P0U2);高分辨板状物件CL成像设备研制项目资助(Y0292700S7) |
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| 摘 要： | 对比度灵敏度是描述计算机断层成像（CT）系统分辨图像细节特征能力的参数，其主要受图像统计噪声水平的影响。本文介绍了CT对比度灵敏度的测量方法，并用直径50 mm的均匀有机玻璃圆柱作样品测量225 kV-3D-ICT系统的对比度灵敏度，在X光机电压为160 kV的条件下，得出在0.3 mm×0.3 mm×0.3 mm范围内的对比度灵敏度约为1%。并讨论了系统的稳定性、硬化校正和重建滤波参数对测量结果的影响。
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| 关 键 词： | 锥束微焦点CT 对比度灵敏度 硬化校正 |
Measurement of Contrast Sensitivity of Micro-CT System |
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| FU Guo-tao,CAO Da-quan,ZHAO Wei,TANG Xiao,SUN Cui-li,WEI Cun-feng,WANG Yan-fang,QUE Jie-min,SHU Hang,MA Chuang-xin,WEI Long,YU Zhong-qiang.Measurement of Contrast Sensitivity of Micro-CT System[J].Atomic Energy Science and Technology,2012,46(10):1270-1273. |
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| Authors: | FU Guo-tao CAO Da-quan ZHAO Wei TANG Xiao SUN Cui-li WEI Cun-feng WANG Yan-fang QUE Jie-min SHU Hang MA Chuang-xin WEI Long YU Zhong-qiang |
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| Affiliation: | 1.Key Laboratory of Nuclear Analytical Techniques, Chinese Academy of Sciences, Beijing 100049, China;2.Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China;3.Graduate University of Chinese Academy of Sciences, Beijing 100049, China |
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| Abstract: | Contrast sensitivity describes the ability of the micro-CT system to reproduce object composition, which mainly depends on the noise of the image. The method of measuring the contrast sensitivity was introduced. A phantom with 50 mm diameter was measured on the system 225 kV-3D-micro ICT and it is found the contrast sensitivity is about 1% at the range of 0.3 mm×0.3 mm×0.3 mm. In addition, the system stability, beam hardening and the reconstruction parameter which affect the measurement result were studied. |
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| Keywords: | micro-CT contrast sensitivity beam hardening |
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