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D.C. scanning thermal microscopy: Characterisation and interpretation of the measurement
Authors:Sverine Gomes  Nathalie Trannoy  Philippe Grossel  Franoise Depasse  Claudine Bainier  Daniel Charraut
Affiliation:a Unité de Thermique et d'Analyse Physique, Laboratoire d'Energétique et d'Optique, Université de Reims Champagne-Ardenne, BP 1039, 51687 Reims cedex 2, France;b Laboratoire d'optique P.M. Duffieux, UMR 6603, Institut des Microtechniques de Franche-Comté, U.F.R Sciences et Techniques, 16 route de Gray, 25030 Besançon cedex, France
Abstract:The used Scanning Thermal Microscopy (SThM) probe is a thin Pt resistance wire acting as a heat source and as a detector simultaneously. Its energetic balance is investigated by the study of the temperature profile along the probe. A theoretical approach of the measurement, based on this investigation, is then proposed. Simulations with this modelling are shown to predict how the heat, electrically produced in the probe, is dissipated in the probe-sample system. In particular, it is shown that the steady-state of conduction losses to the thermal element support varies versus the thermal conductivity of the sample and can lead to bad interpretations of the measurement.
Keywords:scanning thermal microscopy  thermal probe  tip-sample interaction  thermal conductivity  thermal contact  thermal coupling
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