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金属玻璃剪切带中应力诱导的纳米缺陷形成
引用本文:顾晓峰,王 军,秦卫东,寇宏超,李金山,周 廉.金属玻璃剪切带中应力诱导的纳米缺陷形成[J].稀有金属材料与工程,2010,39(6):941-944.
作者姓名:顾晓峰  王 军  秦卫东  寇宏超  李金山  周 廉
作者单位:1. 江南大学,江苏,无锡,214122
2. 西北工业大学,凝固技术国家重点实验室,陕西,西安,710072
基金项目:National Natural Science Foundation of China,National Basic Research Program of China,Program for NCETs inUniversity,NSF of Jiangsu Province,Fundamental Research Funds for the Central Universities 
摘    要:以非晶锆基金属玻璃薄带制备透射电子显微镜样品,并利用透射电镜找到在弯曲样品过程中产生的剪切带.高分辨透射电镜技术揭示在剪切带中存在着纳米级的空洞类和高密度区域缺陷.这些缺陷被认为是在机械负载和外应力移除过程中应力激发的自由体积演化而成的,其演化过程可以通过和在相同的金属玻璃样品上的热退火过程作类比来定性地理解.

关 键 词:金属玻璃  透射电子显微镜  剪切带  退火
收稿时间:2009/6/14 0:00:00

Formation of Stress-Induced Nano Defects in Shear Bands of Metallic Glasses
Gu Xiaofeng,Wang Jun,Qin Weidong,Qin Weidong,Li Jinshan and Zhou Lian.Formation of Stress-Induced Nano Defects in Shear Bands of Metallic Glasses[J].Rare Metal Materials and Engineering,2010,39(6):941-944.
Authors:Gu Xiaofeng  Wang Jun  Qin Weidong  Qin Weidong  Li Jinshan and Zhou Lian
Abstract:Transmission electron microscopy (TEM) specimens of Zr-based metallic glasses were prepared from amorphous ribbons. Shear bands produced by bending these specimens were located by TEM. High resolution transmission electron microscopy analysis indicates the existence of nanoscale void-like defects and high-density areas in shear bands. The formation of these defects is believed resulting from the evolution of stress-activated free volumes during the mechanical loading and the removal of external stress, which can be understood by comparing the stress-induced processes in shear bands in analogy with the thermal annealing effects on similar metallic glasses
Keywords:metallic glass  transmission electron microscopy  shear band  annealing
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