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熔石英亚表面缺陷的研究进展
引用本文:蒋勇,袁晓东,祖小涛,向霞,徐世珍,吕海兵,章春来,尹伟,陈猛,王成程.熔石英亚表面缺陷的研究进展[J].材料导报,2009,23(13).
作者姓名:蒋勇  袁晓东  祖小涛  向霞  徐世珍  吕海兵  章春来  尹伟  陈猛  王成程
作者单位:1. 中国工程物理研究院激光聚变研究中心,绵阳,621900;电子科技大学物理电子学院,成都,610054
2. 中国工程物理研究院激光聚变研究中心,绵阳,621900
3. 电子科技大学物理电子学院,成都,610054
基金项目:国家高技术研究发展计划(863计划),电子科技大学青年基金重点项目 
摘    要:介绍了熔石英亚表面缺陷(SSD)的深度分布与粒径的量化关系及表面粗糙度的量化,以及杂质引起热破坏、裂纹导致电场增强、缺陷导致机械性能弱化3种诱导熔石英损伤的机理.还介绍了氢氟酸(HF)刻蚀和激光预处理2种非常有效的控制熔石英亚表面缺陷的技术,并对熔石英亚表面缺陷研究现状、存在问题和发展趋势进行了简要的总结和展望.

关 键 词:亚表面缺陷  缺陷量化  损伤机理  HF酸刻蚀  激光预处理

Research Progress on Subsurface Defects in Fused Silica
JIANG Yong,YUAN Xiaodong,ZU Xiaotao,XIANG Xia,XU Shizhen,LU Haibing,ZHANG Chunlai,YIN Wei,CHEN Meng,WANG Chengcheng.Research Progress on Subsurface Defects in Fused Silica[J].Materials Review,2009,23(13).
Authors:JIANG Yong  YUAN Xiaodong  ZU Xiaotao  XIANG Xia  XU Shizhen  LU Haibing  ZHANG Chunlai  YIN Wei  CHEN Meng  WANG Chengcheng
Affiliation:JIANG Yong1,2,YUAN Xiaodong1,ZU Xiaotao2,XIANG Xia1,XU Shizhen2,LU Haibing1,ZHANG Chunlai1,YIN Wei1,CHEN Meng1,WANG Chengcheng1(1 Laser Fusion Research Center,China Academy of Engineering Physics,Mianyang 621900,2 School of Physical Electronics,University of Electronic Science , Technology of China,Chengdu 610054)
Abstract:In this paper the quantitative analysis of the relationship between depth distribution and particle size,and surface roughness of subsurface defects(SSD) in fused silica are reviewed.Three kinds of defect-induced damage mechanisms are summarized: Impurity-induced thermal damage,crack-induced electric field enhancement and defect-induced mechanical strength weakening.As two kinds of efficient techniques to control SSD in fused silica,HF et-ching and laser conditioning are also introduced.In addition,the rese...
Keywords:subsurface defects  defect quantifying  damage mechanism  HF etching  laser conditioning  
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