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Characterization of indium zinc oxide thin films prepared by pulsed laser deposition using a Zn3In2O6 target
Authors:N Naghavi  A Rougier  C Marcel  C Gury  J B Leriche  J M Tarascon
Affiliation:

Laboratoire de Réactivité et Chimie des Solides, Université de Picardie Jules Verne, 33 rue St Leu, 80039 Amiens, Cedex France

Abstract:Using a Zn3In2O6 target, indium-zinc oxide films were prepared by pulsed laser deposition. The influence of the substrate deposition temperature and the oxygen pressure on the structure, optical and electrical properties were studied. Crystalline films are obtained for substrate temperatures above 200°C. At the optimum substrate deposition temperature of 500°C and the optimum oxygen pressure of 10?3 mbar, both conditions that indeed lead to the highest conductivity, Zn3In2O6 films exhibit a transparency of 85% in the visible region and a conductivity of 1000 S/cm. Depositions carried out in oxygen and reducing gas, 93% Ar/7% H2, result in large discrepancies between the target stoichiometry and the film composition. The Zn/In (at.%) ratio of 1.5 is only preserved for oxygen pressures of 10?2–10?3 mbar and a 93% Ar/7% H2 pressure of 10?2 mbar. The optical properties are basically not affected by the type of atmosphere used during the film deposition, unlike the conductivity which significantly increases from 80 to 1400 S/cm for a film deposited in 10?2 mbar of O2 and in 93% Ar/7% H2, respectively.
Keywords:Laser ablation  Indium-zinc oxide  Optical properties  Electrical properties and measurements
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