Crystallographic behavior of FeS2 films formed on different substrates

FeS₂ polycrystalline films were prepared on amorphous glass, monocrystalline Si (1 0 0), polycrystalline Al and microcrystalline TiO₂ film substrates by sulfuration annealing of magnetron sputtered iron films. The crystal microstructure and orientation distribution of the films were investigated. The FeS₂ films formed on Si (1 0 0) and glass substrates have relatively fine and uniform grains and small lattice distortion at the interface between the film and substrate but insignificant preferred orientation. The FeS₂ films formed on Al or TiO₂ substrates have relatively inhomogeneous microstructure, large lattice distortion at the interface and a (2 0 0) or (2 2 0) preferred orientation. High strain energy at the interface should be responsible for the preferred orientation and inhomogeneous microstructure in the films.