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| Thermal Conductivity Measurement of Submicron-Thick Films Deposited on Substrates by Modified ac Calorimetry (Laser-Heating Ångstrom Method) | |
| 摘 要： | |
| 收稿时间： | 18 July 2002 |
| 本文献已被 SpringerLink 等数据库收录！ | |
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