| 基于LASAR的数字电路可测试性设计仿真 |
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| 引用本文： | 毛磊,唐华.基于LASAR的数字电路可测试性设计仿真[J].中国测试技术,2007,33(5):109-113. |
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| 作者姓名： | 毛磊 唐华 |
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| 作者单位： | 中国西南电子设备研究所,四川,成都,610036 |
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| 摘 要： | 随着故障诊断技术的发展,利用专业的仿真工具对实际电路进行可测试性分析仿真用的越来越普遍。LASAR(逻辑自动激励与响应)就是一套优秀的用于数字电路测试开发和逻辑分析的仿真软件系统。介绍了利用LASAR故障仿真进行数字电路可测试性分析的方法。通过对一个实际电路进行仿真,具体说明了该方法在实际工程当中的应用。
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| 关 键 词： | 故障仿真 可测试性设计 测试激励 |
| 文章编号： | 1672-4984（2007）05-0109-05 |
| 修稿时间： | 2007-04-02 |
Design simulation for testability of digital circuit based on LASAR |
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| MAO Lei,TANG Hua.Design simulation for testability of digital circuit based on LASAR[J].China Measurement Technology,2007,33(5):109-113. |
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| Authors: | MAO Lei TANG Hua |
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| Affiliation: | Southwest China Research Institute of Electronic Equipment,Chendu 610036,China |
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| Abstract: | As the development of fault diagnosis technology,specialty tools were used to simulatee the circuit to be tested.The software LASAR was such a simulation system which was used to accomplish the digital circuit testing and logical analyzing.How to analysis the testability of a digital circuit using the LASAR software was introduced.Finally,it explained how to use this method in actual application by simulating a circuit. |
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| Keywords: | LASER |
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