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High-resolution and analytical transmission electron microscopy of epitaxial YBa2Cu3O7−x thin films and YBa2Cu3O7/PrBa2Cu3O7 superlattices
Authors:O Eibl
Affiliation:

Siemens Research Laboratories, Otto Hahn Ring 6, W-8000, Munich 83, F.R.G.

Abstract:Transmission electron microscopy (TEM) studies of epitaxial YBa2Cu3O7?x thin films and YBa2Cu3O7/PrBa2Cu3O7 superlattices are summarized. High-resolution imaging of cross-sections and plan views and energy-dispersive X-ray microanalysis and electron energy loss spectroscopy in the transmission electron microscope were the methods applied. In the first section results on YBa2Cu3O7?x thin films With varying oxygen stoichiometry deposited onto SrTiO3 are discussed. Then, YBa2Cu3O7/PrBa2Cu3O7 superlattices deposited onto SrTiO3 and MgO are investigated. Finally, an interface analysis of high-quality YBa2Cu3O7?x thin films deposited onto sapphire with yttrium-stabilized zirconia buffer layers is presented.
Keywords:
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