基于"层次计量架构"的通用计量软件研究

针对日益复杂的程控仪器设备计量的自动化控制问题，提出了一种基于“层次计量架构”思想的软件开发构想，并定义了约束条件。由于程控仪器越来越专业化、集成化，使专业计量工程师要花费很大精力用于程控软件的研发。即使是本专业的人员对自己不熟悉的仪器设备，对此往往有很大隔阂。对“层次计量架构”关于专用程控仪器设备的程控软件的通用性和扩展性问题进行了分析，为快速开发出对特定计量任务的程控软件提出了一种新的构想。采用这种思想设计并实现了通用微波功率计量软件系统，并考虑了系统的扩展性和移植性的问题。

General Metrology Software Based on "Layer Metrology Framework"

To study the problem of automatic control of measuring instruments,a software development method based on "Layer Metrology Framework" is presented,and the restricted conditions are defined.Owing to the program control instruments become more and more specialized and integrated,the metrology engineers waste much more time on develop metrology software,it is always difficult to operate an unfamiliar instrument.The general scope and expansibility of "Layer Metrology Framework"is analyzed,and provides a new method to develop the software for metrology task on metrology instruments control more quickly.A commonly used microwave power metrology software system is designed by this method.