A complete scheme of built-in self-tests (BIST) structure for faultdiagnosis in analog circuits and systems |
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| Authors: | Hatzopoulos AA Siskos S Kontoleon JM |
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| Affiliation: | Aristotle Univ. of Thessaloniki; |
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| Abstract: | The implementation of BIST in analog circuits is investigated, and a complete BIST scheme is proposed. This scheme can be included in any analog or mixed analog-digital circuit and can check its responses by following selected testing procedures. A CMOS chip supporting the proposed BIST structure is designed to facilitate the application of the scheme in a variety of analog circuits. Results from the application of the BIST scheme on active circuits are given, showing its effectiveness and its convenience |
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