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嵌入式开发过程中按键检测算法的改进
引用本文:郑玉章,徐爱钧.嵌入式开发过程中按键检测算法的改进[J].单片机与嵌入式系统应用,2014(8):73-75.
作者姓名:郑玉章  徐爱钧
作者单位:长江大学电子信息学院,荆州434023
摘    要:为了解决嵌入式系统开发过程中,传统按键检测算法将单片机的资源全部用来做按键扫描,从而使CPU的利用率大大降低的问题。在传统按键检测算法的基础上,提出了一种基于有限状态机(FSM)的按键检测程序算法。为了验证基于FSM的按键检测程序算法较传统算法的优势,在Keil uVison3集成开发坏境下,将两种算法做了性能分析。通过性能分析窗口,可以看出新算法在CPU利用率方面得到了大大的提高。

关 键 词:嵌入式开发  按键检测  FSM算法  Keil  uVision

An Improved Key-detection Algorithm During the Embedded Development
Zheng Yuzhang,Xu Aijun.An Improved Key-detection Algorithm During the Embedded Development[J].Microcontrollers & Embedded Systems,2014(8):73-75.
Authors:Zheng Yuzhang  Xu Aijun
Affiliation:(Electronics and Information Engineering,Yangtze University,Jingzhou 434023 ,China)
Abstract:In order to solve the problem that traditional key detection algorithms make all MCU resources for key scan so as to reduce CPU utilization during the embedded development, a key detection program algorithm based on the finite state machine (FSM) is pro- posed on the basis of traditional key detection algorithms. In order to verify the superiority of the button detection program algorithm based on FSM, the performances of two algorithms are analyzed in Keil uVison3. Through the performance analysis window, the new al- gorithm has been greatly improved in CPU utilization.
Keywords:embedded development  key detection  FSM algorithm  Keil uVison3
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