电子元器件加速退化寿命评估方法研究

基于退化轨迹的评估方法是退化型产品进行可靠性评估的主要方法,适合于对具有退化失效机理的高可靠长寿命产品进行可靠性评估;基于退化轨迹的可靠性评估方法首先选取合适的退化轨迹模型,利用退化数据对退化轨迹进行模型拟合得到模型参数,然后根据退化轨迹外推得到伪失效寿命,最后基于伪失效寿命利用最小二乘法进行统计分析确定产品的失效分布,并通过假设检验的方法选择拟合度最优的分布;本文以大功率开关的加速退化试验数据为例进行了分析和说明.

Study on accelerated degradation life assessment method of electronic components

the evaluation method based on degradation trajectory is the main method for reliability evaluation of degraded products. It is suitable for reliability evaluation of highly reliable and long-life products with degradation failure mechanism. The reliability evaluation method based on degradation trajectory first selects the appropriate degradation trajectory model, uses the degradation data to fit the degradation trajectory to obtain the model parameters, then extrapolates the pseudo failure life according to the degradation trajectory, and finally uses the least square method to determine the failure distribution of the product based on the pseudo failure life, The distribution with the best fitting degree is selected by hypothesis test. This paper takes the accelerated degradation test data of high-power switch as an example.