首页 | 官方网站   微博 | 高级检索  
     


Separating sequence overlap for automated test sequence generation
Authors:R M Hierons
Affiliation:(1) School of Information Systems, Computing, and Mathematics, Brunel University, Uxbridge, Middlesex, UB8 3PH, UK
Abstract:Finite state machines have been used to model a number of classes of system and there has thus been much interest in the automatic generation of test sequences from finite state machines. Many finite state machine based test techniques utilize sequences that check the final states of transitions, the most general such sequence being a separating sequence: an input sequence that distinguishes between two states of an FSM. When using such techniques the test sequence length can be reduced by utilizing overlap. This paper investigates overlap for separating sequences and shows how this can be incorporated into test sequence generation.
Keywords:Test sequence generation  Finite state machine  Separating sequence  Characterizing set  Overlap
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号