| 信号继电器触点接触电阻双锁相放大检测仪设计 |
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| 引用本文： | 刘举平,余为清.信号继电器触点接触电阻双锁相放大检测仪设计[J].低压电器,2013(17):31-33. |
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| 作者姓名： | 刘举平 余为清 |
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| 作者单位： | 华东交通大学载运工具与装备省部共建教育部重点实验室,江西南昌330013 |
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| 摘 要： | 信号继电器在使用或存放一段时间后,需要对触点接触电阻进行检测,以判断信号继电器的接触质量.以交流小电流进行测试,更接近信号继电器的实际工况,且避免了接触电势的影响,检测结果更加可信.以MC9S08DG256单片机作为测量、控制的核心,以AD630构成双锁相放大电路,在提高抗干扰性的同时,克服了信号相位角变化对检测结果的影响,可准确地对继电器接触电阻进行检测.
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| 关 键 词： | 继电器 双锁相放大器 AD630 接触电阻 单片机 |
Design of Signal Relay Contact Resistance Tester with Dual Phase Lock-In Amplifier |
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| LIU Juping,YU Weiqing.Design of Signal Relay Contact Resistance Tester with Dual Phase Lock-In Amplifier[J].Low Voltage Apparatus,2013(17):31-33. |
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| Authors: | LIU Juping YU Weiqing |
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| Affiliation: | (Key Laboratory of Conveyance and Equipment Ministry of Education, East China Jiaotong University, Nanchang 330013, China) |
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| Abstract: | To determine the contact quality of signal relay, the contact resistance needs testing after the signal relay is used or stored for a long time. In order to close the actual condition of the signal relay and avoid the effects of contact potential,the small AC was used as test tool so the test results is more credible. MC9S08DG256 MCU woks as the core for measurement and control, and the AI）630 constitutes the dual phase lock-in amplifier, which can overcome the effect of the phase angle signal change on the test results, and improved the immunity to interference at the same time, the results are satisfactory. |
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| Keywords: | relay dual phase lock-in amplifier AD630 |
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