| 加速退化试验与加速寿命试验技术综述 |
| |
| 引用本文： | 王召斌,任万滨,翟国富.加速退化试验与加速寿命试验技术综述[J].低压电器,2010(9):1-6. |
| |
| 作者姓名： | 王召斌 任万滨 翟国富 |
| |
| 作者单位： | 1. 哈尔滨工业大学,军用电器研究所,黑龙江,哈尔滨,150001;江苏科技大学,电子信息学院,江苏,镇江,212003
2. 哈尔滨工业大学,军用电器研究所,黑龙江,哈尔滨,150001 |
| |
| 摘 要： | 加速退化试验与加速寿命试验是解决高可靠性、长寿命产品可靠性评估等问题的两种重要加速试验技术。介绍了加速退化试验与加速寿命试验的基本概念,对两者进行了简单的比较,并进一步对加速退化试验与加速寿命试验技术的国内外相关研究现状进行了概述。最后,对该领域的研究方向进行了展望。
|
| 关 键 词： | 加速退化试验 加速寿命试验 可靠性 |
Review of Accelerated Degradation Testing and Accelerated Life Testing |
| |
| WANG Zhaobin,REN Wanbin,ZHAI Guofu.Review of Accelerated Degradation Testing and Accelerated Life Testing[J].Low Voltage Apparatus,2010(9):1-6. |
| |
| Authors: | WANG Zhaobin REN Wanbin ZHAI Guofu |
| |
| Affiliation: | WANG Zhaobin1,2,REN Wanbin1,ZHAI Guofu1(1.Military Apparatus Research Institute,Harbin Institute of Technology,Harbin 150001,China,2.School of Electronics and Information,Jiangsu University of Science and Technology,Zhenjiang 212003,China) |
| |
| Abstract: | Accelerated degradation testing(ADT) and accelerated life testing(ALT) were two important kinds of reliability accelerated testing technology for reliability assessment of high reliability and long life products.The basic concepts of ADT and ALT were introduced,then the comparison between ADT and ALT technologies were described.The state of arts in this research concerned was then briefly reviewed.Finally,the possible direc-tions and some suggestions were given for further research in ADT and ALT. |
| |
| Keywords: | accelerated degradation testing(ADT) accelerated life testing(ALT) reliability |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
