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基于单片机的大电感参数动态测量研究
引用本文:吴文全,余华.基于单片机的大电感参数动态测量研究[J].电子测量技术,2009,32(12):99-101.
作者姓名:吴文全  余华
作者单位:海军工程大学电子工程学院,武汉,430033
基金项目:国家高技术研究发展计划(863计划) 
摘    要:测量如电力变压器、发电机、电抗器等大电感设备的直流电阻和电感参数意义重大,是对这类设备检测和检修不可或缺的工作。提出了一种可以同时测量大电感直流电阻和电感的动态测量方法,这种可方法只需要在测量回路中串联一个已知的电感和电阻,进行两次采样便可快速得到电感直流电阻和电感值,通过单片机进行采样和计算,能方便地同时得出大电感和其电阻值,而且测量的准确性很高,有很高的实用价值。该方法在单片机的仿真软件Proteus中得到了验证。

关 键 词:大电感  参数  动态测量  单片机

Research on dynamic measurement of high inductance's parameters based on MCU
Wu Wenquan,Yu Hua.Research on dynamic measurement of high inductance's parameters based on MCU[J].Electronic Measurement Technology,2009,32(12):99-101.
Authors:Wu Wenquan  Yu Hua
Affiliation:Wu Wenquan Yu Hua (College of Electrical Engineering,Naval Univ. of Engineering,Wuhan 430033)
Abstract:To measure dc resistance and inductance parameters of high inductance devices such as power transformer, generator,reactor, etc is signality and indispensable work in test and maintenance of these kind of devices. A new dynamic measurement method is presented which can measure ad resistance and inductance parameters precisely at the same time by connecting in series a known inductance and a known resistance in measuring circuit and then sampling twice. Dc resistance and inductance parameters can be got high precisely and highly conveniently at the same time by sampling and caculating using MCU. The method is verified in the simulation of the MCU's softwar-Proteus.
Keywords:high inductance  parameters  dynamic measurement  MCU
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