|
|||||
|
|
| Analysis of the blunting line in ductile fracture toughness J（IC） test method | |
| 引用本文： | References：.Analysis of the blunting line in ductile fracture toughness J（IC） test method[J].哈尔滨工业大学学报(英文版),2007,14(4):524-527. |
| 作者姓名： | References： |
| 作者单位： | [1]Faculty of Materials and Metallurgical Engineering, Kunming University of Science and Technology, Kunming 650093, China [2]College of Materials Science and Chemical Engineering, Harbin Engineering University, Harbin 150001, China [3]National Key Laboratory of Nano/Micro Fabrication Technology, Key Laboratory for Thin Film and Microfabrication of Ministry of Education, Institute of Micro/Nano Science and Technology, Shanghai Jiaotong University, Shanghai 200030, China |
| 摘 要： | The blunting line equation is very important in J-integral testing because of its indispensability in the determination of valid data and JIC value. The blunting line equation in current standard has had a larger relative error in depiction of the crack blunting compared to the experimentally measured results. By analyzing the blunting process of the crack tip according to the D-B model, a new form of blunting line was obtained on the base of the path independence of J-integral, i.e., J=1.25（σs＋Sf）/（1＋n）·WSZ. Experimental results show that this equation is more precise to describe the crack blunting than those in current standards. |
| 关 键 词： | J积分 独立通道 方程式 形变断裂韧度 |
| 文章编号： | 1005-9113（2007）04-0524-04 |
| 修稿时间： | 2005-05-09 |
Analysis of the blunting line in ductile fracture toughness JIC test method |
|
| YIN Jian-cheng,LIU Rui-tang,YANG Zhuo-qing.Analysis of the blunting line in ductile fracture toughness JIC test method[J].Journal of Harbin Institute of Technology,2007,14(4):524-527. | |
| Authors: | YIN Jian-cheng LIU Rui-tang YANG Zhuo-qing |
| Affiliation: | 1. Faculty of Materials and Metallurgical Engineering, Kunming University of Science and Technology, Kunming 650093, China 2. College of Materials Science and Chemical Engineering, Harbin Engineering University, Harbin 150001, China 3. National Key Laboratory of Nano/Micro Fabrication Technology,Key Laboratory for Thin Film and Microfabrication of Ministry of Education, Institute of Micro/Nano Science and Technology, Shanghai Jiaotong University, Shanghai 200030, China |
| Abstract: | The blunting line equation is very important in J-integral testing because of its indispensability in the determination of valid data and JIC value. The blunting line equation in current standard has had a larger relative error in depiction of the crack blunting compared to the experimentally measured results. By analyzing the blunting process of the crack tip according to the D - B model, a new form of blunting line was obtained on the base of the path independence of J-integral, i.e. J= 1.25(σs Sf)/1 n ·WSZ.Experimental results show that this equation is more precise to describe the crack blunting than those in current standards. |
| Keywords: | J-integral path independence blunting line |
| 本文献已被 维普 万方数据 等数据库收录！ | |
