Electrical conduction mechanism in plasma polymerized 2‐(diethylamino)ethyl methacrylate thin films

Thin films of different thicknesses were prepared through glow discharge of 2‐(diethylamino)ethyl methacrylate (DEAEMA) using a capacitively coupled reactor. Current density–voltage (J–V) characteristics for plasma polymerized (PP) DEAEMA thin films of thicknesses 100, 200, 250, and 300 nm in aluminum/PPDEAEMA/aluminum sandwich configuration were studied over the temperature range from 298 to 423 K. J–V curves reveal that in the low‐voltage region, the conduction current obeys Ohm's law while in the high‐voltage region the behavior attributed to be space charge‐limited conduction in PPDEAEMA thin films. The carrier mobility was calculated to be about 6.80 × 10^?19 to 2.38 × 10^?18 m^?2 V^?1s^?1 for various thicknesses. The free carrier density was found to be about 1.78 × 10²³ to 2.04 × 10²³ m^?3, and the trap density was found to be about 6.93 × 10²³ to 15.9 × 10²³ m^?3 for different thicknesses. The activation energies were estimated to be about 0.005–0.016 eV for 2 and 30 V of PPDEAEMA thin films of different thicknesses. The low‐activation energies indicate that the thermally activated hopping conduction is operative in PPDEAEMA thin films. POLYM. ENG. SCI., 55:2729–2734, 2015. © 2015 Society of Plastics Engineers