首页 | 官方网站   微博 | 高级检索  
     


High-Resolution Transmission Electron Microscopy Study of the Microstructural Development of a Silicon Carbonitride Nanocomposite
Authors:Julin Wan  Matthew J Gasch  Charles E Lesher  Amiya K Mukherjee
Affiliation:Department of Chemical Engineering and Materials Science, University of California, Davis, California 95616;Department of Geology, University of California, Davis, California 95616
Abstract:Nanocrystalline ceramics are expected to possess enhanced superplasticity over their microcrystalline counterparts. In this effort of producing nanocomposites of silicon nitride and silicon carbide, amorphous Si-C-N derived from pyrolysis of a polysilazane precursor was sintered with yttria as an additive. High-pressure sintering at different temperatures resulted in sintered materials ranging from amorphous to nanocrystalline. High-resolution transmission electron microscopy was conducted to characterize the development and grain-boundary features of the nanocrystalline microstructure. The results provide a preliminary understanding of the process of the formation of the nanocrystalline structure from an amorphous matrix, under the condition of high pressure and relatively low temperature. The wide variation in the thickness of grain-boundary phases observed in this material suggests a nonequilibrium state of the grain boundary, which might be related to the processing conditions.
Keywords:nanocomposites  transmission electron microscopy  silicon carbonitride
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司    京ICP备09084417号-23

京公网安备 11010802026262号