X射线荧光光谱原位微区分析的地学应用评介

原位微区分析是微观物质研究的重要手段,是现代分析技术的重要发展方向。以扫描核探针(SNM)、同步辐射X射线微探针(SR-XRMP)、二次离子质谱(SIMS)和激光剥蚀-电感耦合等离子体质谱(LA-ICP-MS)为主的微区痕量分析技术是一类新的微区分析手段,它从根本上解决了以电子探针分析技术(EMPA)和各类电镜(扫描电子显微镜(SEM)、透射电子显微镜(TEM)、分析电子显微镜(AEM))为主的电子微束技术(发展较早,已相当成熟)难以分析痕量元素的弱点,使原位微区分析成为一种能测定包括主、次、痕量元素和同位素在内的完整分析体系。文章收集了20世纪80年代以来原位微区X射线荧光分析地质应用探索的文献,首先介绍了相关专著、XRF专著中的相关内容及这方面的重要评述,随后从SR-XRMP、SNM、微束X射线荧光光谱(M-XRF)和多功能X射线荧光光谱仪器等方面评介其地学应用,涉及矿物微区元素分布、地质包裹体、陨石分析、从海洋矿物层状结构和韵律特征进行的成因矿物学研究及海洋环境变化、通过石笋类环带结构和湖泊沉积进行的古环境古气候研究的时间分辨率提高到季节尺度、恐龙蛋化石的铂族元素分布研究生物绝灭事件等。最后从技术特点和应用领域讨论了原位微区XRF分析的分类问题。引文187篇。

Review on the application of in-situ X-ray fluorescence spectrometry analysis in geosciences

The techniques of in-situ-micro area analysis had played an important role for the research of micro material. It could analyze major, minor, trace elements and isotopes. These techniques included scanning nuclear probe (SNM), synchrotron radiation X-ray probe (SR-XRMP), secondary ion probe mass spectrometry (SIMS) and laser ablation ICP-MS (LA-ICP-MS). Papers on the geological exploration of in-situ micro area XRF analysis had been collected since 1980s. Firstly, the related works of XRF had been introduced. Then, the geological applications of XRF had been reviewed, including the element distribution in mineral micro area and the earth analysis of the inclusions and meteorites, genetic mineralogy and changes of the marine environment based on the layered structure and rhythmic characteristics of marine minerals, time resolution of paleoenvironmental and paleoclimate research through stalagmite ring structure and lake deposition to the seasonal scale, platinum group element distribution of dinosaur egg fossils and biological extinction events, etc. Finally, the classification of in-situ XRF analysis was discussed from the technical characteristics and application fields. There were 187 citations in the paper.