| SoC芯片测试设备现状 |
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| 引用本文： | 刘涛,张崇巍.SoC芯片测试设备现状[J].电子工业专用设备,2009,38(9):1-9. |
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| 作者姓名： | 刘涛 张崇巍 |
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| 作者单位： | 1. 中国电子科技集团公司第四十五研究所,北京东燕郊,065201
2. 甘肃林业技术学院,甘肃天水,741020 |
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| 摘 要： | 随着SoC应用的日益普及，对SoC测试技术提出了越来越高的要求，掌握新的测试理念、新的测试流程、方法和技术，是应对SoC应用对测试技术提出的挑战，适应测试发展趋势的必然要求。介绍了应对SoC测试技术挑战的基本方法和设备结构及几家设备公司SoC芯片测试设备概况。
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| 关 键 词： | SoC芯片测试 测试方法 测试系统结构 测试设备 |
The Present Situation of SoC Chip Testing Equipment |
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| Liu Tao,ZHANG Chongwei.The Present Situation of SoC Chip Testing Equipment[J].Equipment for Electronic Products Marufacturing,2009,38(9):1-9. |
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| Authors: | Liu Tao ZHANG Chongwei |
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| Affiliation: | Liu Tao1,ZHANG Chongwei2(1.The 45th Insitute of CETC,Beijing East Yanjiao 065201,China 2.Gansu Forestry Technological College,Tianshui 741020,China) |
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| Abstract: | With the increasing popularity of SoC applications,the higher and higher demands is put forward for SoC test technology.To acquire new test concept,the new testing procedures,methods and techniques for dealing with applications for response SoC test technology challenge.This paper describes the basic methods and equipment for several devices SoC chip testing to respond the challenges of SoC testing technology. |
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| Keywords: | SoC chip testing Test methods Test system construction ATE |
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